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1. 发明授权

US06863931B2 Manufacturing method of product having sprayed coating film 有权
标题翻译：具有喷涂膜的产品的制造方法
公开(公告)号：US06863931B2
公开(公告)日：2005-03-08
申请号：US10308191
申请日：2002-12-03
申请人： Shinji Someno , Akira Shimizu , Hidenobu Matsuyama , Nobuyuki Kuroki , Masanao Yomogizawa , Ken Harada , Tadahiro Shimadzu
发明人： Shinji Someno , Akira Shimizu , Hidenobu Matsuyama , Nobuyuki Kuroki , Masanao Yomogizawa , Ken Harada , Tadahiro Shimadzu
IPC分类号： C23C4/16 , C23C4/08 , C23C4/12
CPC分类号： C23C4/16
摘要： A method of manufacturing a product having a sprayed coating film prepares a component having a cylindrical inner surface, prepares a gas spray type spraying gun with a central axis in opposed relationship with the cylindrical inner surface of the component to be aligned with a central axis of the cylindrical inner surface, supplies spraying material to the spraying gun, melts the spraying material with a combustion flame, and travels the spraying gun for translational movement in a traveling direction, corresponding to one of directions of the central axis of the cylindrical inner surface, for forming a sprayed coating film over the cylindrical inner surface while spraying the spraying material, molten with the combustion flame, onto the cylindrical inner surface in a spraying direction oriented in a rearward area of the traveling direction for thereby forming the sprayed coating film over the cylindrical inner surface.
摘要翻译：制造具有喷涂膜的产品的方法制备具有圆柱形内表面的部件，制备具有与组件的圆柱形内表面相对关系的中心轴的气体喷射型喷枪，以与中心轴圆柱形内表面向喷枪提供喷涂材料，用燃烧火焰熔化喷射材料，并且使喷枪相对于圆柱形内表面的中心轴线的一个方向沿行进方向行进，用于在喷射方向上喷涂涂膜，同时喷射喷射材料，在燃烧火焰中熔化，沿着行进方向后方区域的喷射方向在圆筒形内表面上形成喷涂涂膜圆柱形内表面。

2. 发明授权

US09864114B2 Zone plate having annular or spiral shape and Y-shaped branching edge dislocation 有权
公开(公告)号：US09864114B2
公开(公告)日：2018-01-09
申请号：US14240393
申请日：2011-09-28
申请人： Ken Harada , Teruo Kohashi
发明人： Ken Harada , Teruo Kohashi
IPC分类号： G02B5/18 , G21K1/06 , G02B27/44 , G02B27/42
CPC分类号： G02B5/1876 , G02B27/42 , G02B27/4233 , G02B27/4266 , G02B27/44 , G21K1/06
摘要： Although, conventionally, there were two methods, (1) a wave was transmitted through a spiral phase plate and (2) a diffraction grating containing an edge dislocation was used, they incurred complication of a configuration and securement of a larger amount of space and were not efficient because each of the spiral wave generation methods needed an incident wave to be a plane wave and at least one time of imaging is necessary at the time of wave irradiation on an observation object. In order to efficiently generate the spiral wave having a sufficient intensity, a structure of edge dislocation is taken in into a pattern of the zone plate and a spiral pattern containing a discontinuous zone is formed. Moreover, a thickness and a quality of material that change the phase of the wave by an odd multiple of π are selected for a material of the wave-blocking section in the pattern.

3. 发明申请

US20090045339A1 Charged particle beam equipment 有权
标题翻译：带电粒子束设备
公开(公告)号：US20090045339A1
公开(公告)日：2009-02-19
申请号：US11920132
申请日：2006-05-11
申请人： Ken Harada , Tetsuya Akashi , Yoshihiko Togawa , Tsuyoshi Matsuda , Noboru Moriya
发明人： Ken Harada , Tetsuya Akashi , Yoshihiko Togawa , Tsuyoshi Matsuda , Noboru Moriya
IPC分类号： G01N23/00 , G21K5/10
CPC分类号： G01N23/04 , H01J37/023 , H01J37/067 , H01J37/20 , H01J37/26 , H01J2237/024 , H01J2237/1514 , H01J2237/20207 , H01J2237/20214 , H01J2237/262 , H01J2237/317
摘要： Charged particle beam equipment having a rotary mechanism in which shift of the observing/machining position incident to the rotary operation of the equipment having the rotary mechanism can be corrected conveniently with high precision in a plane perpendicular to the optical axis of the optical system of charged particle beam or in a slightly inclining plane. An X-Y shift incident to rotation in a plane is determined from the angular information of a rotary mechanism such as a sample holder, diaphragms or biprisms in the charged particle beam equipment, and then driving or controlling is performed to cancel the X-Y shift.
摘要翻译：具有旋转机构的带电粒子束设备可以在垂直于带电的光学系统的光轴的平面中以高精度方便地校正入射到具有旋转机构的设备的旋转操作的观察/加工位置的偏移粒子束或稍微倾斜的平面。根据带电粒子束设备中的样本保持器，隔膜或双棱镜等旋转机构的角度信息确定入射到平面中的X-Y偏移，然后执行驱动或控制以消除X-Y偏移。

4. 发明授权

US06170257B2 Variable thrust nozzle system 有权
标题翻译：可变推力喷嘴系统
公开(公告)号：US06170257B2
公开(公告)日：2001-01-09
申请号：US09140464
申请日：1998-08-26
申请人： Ken Harada , Yoshihiko Nishida , Kiyoyuki Watanabe
发明人： Ken Harada , Yoshihiko Nishida , Kiyoyuki Watanabe
IPC分类号： F02K118
CPC分类号： F42B10/663
摘要： A variable thrust nozzle system comprises a housing, a pair of nozzle skirts. attached to the outer surface of the housing so as to open in opposite directions, respectively, a pair of nozzle plugs disposed in the pair of nozzle skirts so as to define a nozzle throat between the outer surface of each nozzle plug and the inner surface of the corresponding nozzle skirt, a shaft supported for sliding in the housing and having opposite ends connected to the nozzle plugs, respectively, and an actuator linked to the shaft to drive the shaft for sliding motions to vary the sectional areas of the nozzle throats.
摘要翻译：可变推力喷嘴系统包括壳体，一对喷嘴裙部。分别连接在壳体的外表面上以相反方向打开一对喷嘴塞，其设置在一对喷嘴裙部中，以便在每个喷嘴塞的外表面和在每个喷嘴塞的内表面之间限定喷嘴喉相应的喷嘴裙部，分别被支撑用于在壳体中滑动并且具有分别连接到喷嘴塞的相对端的轴和连接到轴的致动器以驱动轴以进行滑动运动以改变喷嘴喉部的截面积。

5. 发明授权

US08653472B2 Electromagnetic field application system 失效
标题翻译：电磁场应用系统
公开(公告)号：US08653472B2
公开(公告)日：2014-02-18
申请号：US12854262
申请日：2010-08-11
申请人： Ken Harada , Akira Sugawara , Noboru Moriya
发明人： Ken Harada , Akira Sugawara , Noboru Moriya
IPC分类号： G21K5/04
CPC分类号： H01J37/20 , H01J37/09 , H01J37/26 , H01J2237/2002 , H01J2237/206
摘要： The present invention is based on the property that the electric and magnetic fields are independent of each other and normal to each other and the property that the deflection of a charged particle beam by the electromagnetic field follows the rule of linear combination. The present invention employs a system that creates a region in which there exist both electromagnetic field and controls the deflection of a charged particle beam in each of the electric and magnetic fields.
摘要翻译：本发明是基于电场和磁场彼此独立并且彼此正常的特性以及通过电磁场的带电粒子束的偏转遵循线性组合规则的性质。本发明采用一种系统，其产生存在电磁场的区域，并控制每个电场和磁场中的带电粒子束的偏转。

6. 发明申请

US20110031395A1 TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR OBSERVING SPECIMEN IMAGE WITH THE SAME 有权
标题翻译：传输电子显微镜和用于观察样本图像的方法
公开(公告)号：US20110031395A1
公开(公告)日：2011-02-10
申请号：US12850961
申请日：2010-08-05
申请人： Ken Harada , Akira Sugawara
发明人： Ken Harada , Akira Sugawara
IPC分类号： H01J37/26
CPC分类号： H01J37/28 , H01J37/295 , H01J2237/1514 , H01J2237/2611 , H01J2237/2614
摘要： A first electron biprism is disposed in a condenser optical system and an observation region of a specimen is irradiated simultaneously with two electron beams of different angles. The two electron beams that have simultaneously transmitted the specimen are spatially separated and focused with a second electron biprism disposed in an imaging optical system and two electron microscopic images of different irradiation angles are obtained. The two picture images are obtained by a detecting unit. Based on the two picture images, a stereoscopic image or two images having different kinds of information of the specimen is/are produced and displayed on a display device.
摘要翻译：第一电子双棱镜设置在聚光镜系统中，并且与两个不同角度的电子束同时照射样本的观察区域。同时透射样品的两个电子束在空间上分离并且与设置在成像光学系统中的第二电子双棱镜聚焦，并且获得两个不同照射角度的电子显微镜图像。两个图像由检测单元获得。基于两个图像，产生并显示具有样本的不同种类的信息的立体图像或两个图像并显示在显示装置上。

7. 发明授权

US07808814B2 Magnetization state control device and magnetic information recording device 失效
标题翻译：磁化状态控制装置和磁信息记录装置
公开(公告)号：US07808814B2
公开(公告)日：2010-10-05
申请号：US12219238
申请日：2008-07-17
申请人： Yoshihiko Togawa , Ken Harada , Tsuyoshi Matsuda , Yoshichika Otani , Takashi Kimura
发明人： Yoshihiko Togawa , Ken Harada , Tsuyoshi Matsuda , Yoshichika Otani , Takashi Kimura
IPC分类号： G11C11/02
CPC分类号： H01F10/06 , G11C11/14 , G11C11/161 , G11C11/1675 , G11C19/0808 , H01L43/08
摘要： The magnetization state of a ferromagnetic material is controlled by applying a current pulse to it while externally applying a weak magnetic field to it. The magnetic state of a ferromagnetic material can be switched between a uniformly magnetized state and a multiple magnetic domain structure by controlling the direction and intensity of the magnetic field applied to it and the intensity and pulse width of the current pulse. When an external magnetic field is applied, the possibility of occurrence of the reversal of the magnetic state upon application of the current pulse shows a hysteresis, and the reversal of the magnetic state can be controlled reliably. The intensity of the magnetic field to be applied may be as weak as a few gauss. Furthermore, by using such magnetic information recording elements, a magnetic information recording device (memory) that can achieve a high degree of integration can be produced.
摘要翻译：铁磁材料的磁化状态通过向外部施加弱磁场而施加电流脉冲来控制。通过控制施加到其的磁场的方向和强度以及电流脉冲的强度和脉冲宽度，铁磁材料的磁状态可以在均匀磁化状态和多磁畴结构之间切换。当施加外部磁场时，在施加电流脉冲时发生磁状态反转的可能性显示滞后，并且可以可靠地控制磁状态的反转。要施加的磁场的强度可能与几个高斯一样弱。此外，通过使用这种磁信息记录元件，可以产生可以实现高集成度的磁信息记录装置（存储器）。

8. 发明申请

US20090206258A1 ELECTRON BEAM OBSERVATION DEVICE USING PRE-SPECIMEN MAGNETIC FIELD AS IMAGE-FORMING LENS AND SPECIMEN OBSERVATION METHOD 有权
标题翻译：使用预制磁场作为图像形成透镜和样本观察方法的电子束观测装置
公开(公告)号：US20090206258A1
公开(公告)日：2009-08-20
申请号：US12270422
申请日：2008-11-13
申请人： Hiroto KASAI , Ken Harada
发明人： Hiroto KASAI , Ken Harada
IPC分类号： G01N23/04
CPC分类号： H01J37/26 , H01J37/141 , H01J37/20 , H01J2237/14 , H01J2237/20 , H01J2237/201 , H01J2237/2802
摘要： An electron beam observation device includes a mechanism which disposes a specimen at an upstream side in an electron beam traveling direction outside an objective lens, from which an image is transferred under a magnification of ⅕ to 1/30, in addition to an inside of the objective lens in which a specimen is disposed at a time of ordinary observation.
摘要翻译：一种电子束观察装置，其特征在于，具有将除了内部之外的1/5〜1/30的倍率下的图像转印到物镜外部的电子束行进方向的上游侧的样本配置的机构在普通观察时放置样品的物镜。

9. 发明授权

US07538323B2 Interferometer 有权
标题翻译：干涉仪
公开(公告)号：US07538323B2
公开(公告)日：2009-05-26
申请号：US10585359
申请日：2005-01-07
申请人： Ken Harada , Tetsuya Akashi , Yoshihiko Togawa , Tsuyoshi Matsuda , Noboru Moriya
发明人： Ken Harada , Tetsuya Akashi , Yoshihiko Togawa , Tsuyoshi Matsuda , Noboru Moriya
IPC分类号： G01B15/00
CPC分类号： H01J37/295 , H01J2237/1514 , H01J2237/2614
摘要： The present invention provides a technique enabling to control fringe spacing s and an interference width W independently of each other, which are important parameters for an interferometer using an electron biprism.In the present invention, two electron biprisms 9u, 9b are used in two stages along the optical axis, and fringe spacing s and an interference width W are controlled independently of each other by controlling a voltage applied to an electrode of each of the electron biprisms. Also Fresnel diffraction can be suppressed.
摘要翻译：本发明提供一种能够彼此独立地控制边缘间隔s和干涉宽度W的技术，这是使用电子双棱镜的干涉仪的重要参数。在本发明中，沿着光轴两级分别使用两个电子双极子9u，9b，通过控制施加到每个电子双极性电极的电压，彼此独立地控制边缘间隔s和干涉宽度W 。也可以抑制菲涅尔衍射。

10. 发明授权

US06838675B2 Specimen observation system for applying external magnetic field 失效
标题翻译：应用外部磁场的试样观测系统
公开(公告)号：US06838675B2
公开(公告)日：2005-01-04
申请号：US10450614
申请日：2002-01-18
申请人： Ken Harada , Junji Endo , Nobuyuki Osakabe
发明人： Ken Harada , Junji Endo , Nobuyuki Osakabe
IPC分类号： G01N23/04 , G01N27/83 , G01Q20/02 , G01Q30/20 , G01R33/12 , H01J37/147 , H01J37/20 , H01J37/26 , H01J3/14
CPC分类号： H01J37/26 , H01J37/147
摘要： To prevent the displacement from an optical axis of a charged particle beam from being made independent of the direction (parallel to or perpendicular to the optical axis) of a magnetic field applied to a specimen, a system including an electron microscope and using a charged particle beam optical system is provided with a source of a charged particle beam, a condenser optical system, a specimen to be observed, a system for applying a magnetic field to the specimen, an imaging optical system and an image observation/recording apparatus, is provided with first and second charged particle beam deflection systems in order along a direction in which the charged particle beam travels between the condenser optical system and the specimen, is provided with third and fourth charged particle beam deflection systems in order between the specimen and the imaging lens system, and the quantity and the direction of the deflection of the charged particle beam by each deflection system and the intensity and the bearing of a magnetic field applied to the specimen are related according to predetermined relation.
摘要翻译：为了防止来自带电粒子束的光轴的位移不依赖于施加到样本的磁场的方向（平行于或垂直于光轴），包括电子显微镜并使用带电粒子的系统光束光学系统设置有带电粒子束的源，聚光镜系统，待观察的样本，向样本施加磁场的系统，成像光学系统和图像观察/记录装置第一和第二带电粒子束偏转系统沿着带电粒子束在聚光器光学系统和样本之间行进的方向依次排列，在样本和成像透镜之间依次设置有第三和第四带电粒子束偏转系统系统，以及每个偏转系统和强度的带电粒子束的偏转的数量和方向并且根据预定关系，施加到样本的磁场的轴承相关。

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