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    • 2. 发明授权
    • Deposition apparatus
    • 沉积装置
    • US06475285B2
    • 2002-11-05
    • US09817196
    • 2001-03-27
    • Hiroshi IkegamiNobuo HayasakaShinichi ItoKatsuya Okumura
    • Hiroshi IkegamiNobuo HayasakaShinichi ItoKatsuya Okumura
    • C23C1600
    • B05C5/005
    • A deposition apparatus includes a chemical discharging nozzle for continuously discharging chemicals to a substrate to be processed, a gas spraying section arranged below the chemical discharging nozzle, for spraying gas on the chemicals discharged from the chemical discharging nozzle and changing an orbit of the chemicals by pressure of the gas, a chemical collecting section for collecting the chemicals the orbit of which is changed by the gas spraying section, the chemical collecting section being arranged so as to interpose the chemicals between the gas spraying section and the chemical collecting section, and a moving section for moving the chemical discharging nozzle and the substrate relatively with each other. The gas spraying section includes a laser oscillator for emitting a laser beam, and a gas generating film that generates the gas when heated and gasified by the laser beam emitted from the laser oscillator.
    • 沉积设备包括用于将化学品连续地排放到待处理基板的化学物质排放喷嘴,设置在化学物质排放喷嘴下方的气体喷射部分,用于将化学物质排出喷嘴上排出的化学物质喷射并改变化学品的轨道 气体的压力,用于收集由气体喷射部分改变其轨道的化学物质的化学收集部分,化学收集部分布置成将气体喷射部分和化学收集部分之间的化学物质介入, 使所述化学物质排出喷嘴和所述基板彼此相对移动的移动部。 气体喷射部分包括用于发射激光束的激光振荡器,以及当由激光振荡器发射的激光束被加热和气化时产生气体的气体发生膜。
    • 4. 发明授权
    • Semiconductor device
    • 半导体器件
    • US06376894B1
    • 2002-04-23
    • US09525107
    • 2000-03-14
    • Hiroshi IkegamiKeiichi SasakiNobuo Hayasaka
    • Hiroshi IkegamiKeiichi SasakiNobuo Hayasaka
    • H01L2900
    • H01L23/5258H01L2924/0002H01L2924/00
    • There is provided a semiconductor device in which redundancy fuses formed in an upper layer wiring region can be cut without damaging an underlying Si substrate or adjacent regions. The semiconductor device comprises a lower layer wiring formed within an interlayer insulating film on the Si substrate, and an upper layer metal wiring made of Al, Cu or the like, formed above the lower layer wiring and connected thereto through a via metal, wherein the redundancy fuses are formed in the same wiring layer as the upper layer metal wiring. For cutting a fuse by irradiating with a laser having a wavelength in a range of 1,000 to 1,100 nm and a beam diameter D (&mgr;m), the fuse may be designed to have a film thickness T (&mgr;m) and a width W (&mgr;m) which satisfy T≦(−0.15 (D+2&sgr;)+0.46) exp (2W), where &sgr; (&mgr;m) is an alignment accuracy of the center of the laser beam to the center of the fuse, with the result that the fuse formed in the same wiring layer as the upper layer metal wiring can be cut without damaging the Si substrate, an adjacent fuse and the upper layer metal wiring.
    • 提供了一种半导体器件,其中可以切割形成在上层布线区域中的冗余熔丝而不损坏下面的Si衬底或相邻区域。 半导体器件包括形成在Si衬底上的层间绝缘膜内的下层布线和由Al,Cu等制成的上层金属布线,其形成在下层布线的上方并通过通孔金属连接, 冗余熔丝形成在与上层金属布线相同的布线层中。 为了通过用波长在1000至1100nm的波长和光束直径D(母体)的激光照射来切割熔丝,可以将熔丝设计成具有膜厚T(mum)和宽度W(mum) 其满足T <=( - 0.15(D + 2sigma)+0.46)exp(2W),其中σ(mum)是激光束的中心对熔丝的中心的对准精度,结果是熔丝 形成在与上层金属布线相同的布线层中,不会损坏Si基板,相邻的熔丝和上层金属布线。