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    • 2. 发明授权
    • Transmission apparatus
    • 传输装置
    • US09148241B2
    • 2015-09-29
    • US12855681
    • 2010-08-12
    • Takashi Honda
    • Takashi Honda
    • H04J3/14
    • H04J3/14H04J2203/006
    • A transmission apparatus switches to a line of one standby system upon occurrence of a fault on any one of n lines of a working system. The transmission apparatus includes a switching controller that when switching from a line of the working system to a line of the standby-system upon the occurrence of the fault and executing a given command to put the line causing the fault in a given state of line switching according to the given command, causes the working system to maintain the state of line switching according to the given command even after restoration from the fault.
    • 在工作系统的n行中的任意一行发生故障时,传输装置切换到一个备用系统的一行。 发送装置包括切换控制器,当故障发生时,从工作系统的线路切换到备用系统的线路并且执行给定的命令以将导致故障的线路置于给定的线路切换状态 根据给定的命令,即使在故障恢复后,工作系统也会根据给定的命令维持线路切换的状态。
    • 5. 发明申请
    • HEAD GIMBAL ASSEMBLY WITH TWO WIRING LAYERS COMPRISING THERMALLY-ASSISTED HEAD
    • 头部组合装有包括热辅助头的两个接线层
    • US20120044790A1
    • 2012-02-23
    • US12860349
    • 2010-08-20
    • Koji SHIMAZAWAKosuke TanakaTakashi Honda
    • Koji SHIMAZAWAKosuke TanakaTakashi Honda
    • G11B11/00
    • G11B5/4853G11B5/105G11B5/314G11B5/486G11B5/6088G11B2005/0021
    • Provided is a head gimbal assembly (HGA) in which the electrodes for a thermally-assisted magnetic recording head comprising a light source, a photodetector and a magnetic head element, can be reliably electrically connected to wiring members by solder ball bonding (SBB). The HGA comprises a suspension comprising: a base; a first wiring member for the light source and the photodetector, provided on a side of one surface of the base; and a second wiring member for the magnetic head element, provided on the same surface side. The first and second wiring members protrude from the base toward the head to be fixed. As a result, the end portions (connection pads) of the first and second wiring members can be located close to electrodes for light-source and photodetector and electrodes for magnetic head element, respectively. This arrangement enables the end portions of the first and second wiring members to be reliably electrically connected to the electrodes by SBB.
    • 提供了一种头万向架组件(HGA),其中包括光源,光电检测器和磁头元件的热辅助磁记录头的电极可以通过焊球接合(SBB)可靠地电连接到布线构件。 HGA包括悬浮液,其包含:碱; 用于所述光源和所述光电检测器的第一配线构件,设置在所述基座的一个表面的一侧; 以及设置在同一表面侧的用于磁头元件的第二配线构件。 第一和第二布线构件从基部朝向头部突出以被固定。 结果,第一和第二布线构件的端部(连接焊盘)可以分别位于光源和光电检测器的电极和磁头元件的电极附近。 通过这种布置,可以通过SBB将第一和第二布线构件的端部可靠地电连接到电极。
    • 6. 发明授权
    • Probe assembly for lapping a bar using a patterned probe
    • 用于使用图案化探针研磨棒的探针组件
    • US07768281B2
    • 2010-08-03
    • US12073174
    • 2008-02-29
    • Ryuji FujiiTakashi HondaHiroyasu TsuchiyaKoji Hosaka
    • Ryuji FujiiTakashi HondaHiroyasu TsuchiyaKoji Hosaka
    • G01R31/02
    • G11B5/102B24B37/005B24B37/048B24B49/16G11B5/3166G11B5/3169G11B5/3173
    • A probe assembly used to lap a bar, the bar being provided with elements that are to be formed into sliders, is provided. The probe assembly comprises an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end while preventing a bending deformation at the leading end from becoming smaller than the first bending deflection. The leading end of the probe is adapted to be subjected to second bending deflection that is larger than the first bending deflection in a same direction as a direction of the first bending deflection and thereby to abut against an electrode pad to establish electrical connection between the probe and the electrode pad, the electrode pad being provided on a surface of the bar other than a surface to be lapped.
    • 提供了一种用于搭接杆的探针组件,该杆设置有要形成滑块的元件。 探针组件包括可弹性偏转的探针和用于向探针施加弯曲变形的止动件,以便在探针的前端引起第一弯曲偏转,并且用于保持前端的第一弯曲偏转,同时防止弯曲变形 前端从小于第一弯曲偏转。 探针的前端适于在与第一弯曲偏转的方向相同的方向上经受大于第一弯曲偏转的第二弯曲偏转,从而抵靠电极焊盘以在探针之间建立电连接 和电极焊盘,电极焊盘设置在除了要研磨的表面之外的杆的表面上。
    • 7. 发明申请
    • SEMICONDUCTOR STORAGE DEVICE
    • 半导体存储设备
    • US20100097845A1
    • 2010-04-22
    • US12527993
    • 2008-02-07
    • Noboru SakimuraTakashi HondaTadahiko Sugibayashi
    • Noboru SakimuraTakashi HondaTadahiko Sugibayashi
    • G11C11/00G11C7/02
    • G11C11/16B82Y10/00B82Y25/00G11C11/1655G11C11/1659G11C11/1673G11C11/1675H01L27/228H01L43/08
    • A semiconductor storage device is provided with a memory array including a plurality of memory cells. The plurality of memory cells includes: first and third memory cells arranged along one of an even-numbered row and an odd-numbered row, and a second memory cell arranged along the other. Each of the plurality of memory cells includes: a first transistor comprising first and second diffusion layers; a second transistor comprising third and fourth diffusion layers; and a magnetoresistance element having one of terminals thereof connected to an interconnection layer which provides an electrical connection between the second and third diffusion layers. The fourth diffusion layer of the first memory cell is also used as the first diffusion layer of the second memory cell. In addition, the fourth diffusion layer of the second memory cell is also used as the first diffusion layer of the third memory cell.
    • 半导体存储装置设置有包括多个存储单元的存储器阵列。 多个存储单元包括:沿着偶数行和奇数行中的一个排列的第一和第三存储单元,以及彼此排列的第二存储单元。 多个存储单元中的每一个包括:第一晶体管,包括第一和第二扩散层; 第二晶体管,包括第三和第四扩散层; 以及一个磁阻元件,其一个端子连接到互连层,该互连层提供第二和第三扩散层之间的电连接。 第一存储单元的第四扩散层也用作第二存储单元的第一扩散层。 此外,第二存储单元的第四扩散层也用作第三存储单元的第一扩散层。
    • 10. 发明申请
    • Probe assembly for lapping bar using patterned probe
    • 使用图案探针的研磨棒的探针组件
    • US20080223155A1
    • 2008-09-18
    • US12073174
    • 2008-02-29
    • Ryuji FujiiTakashi HondaHiroyasu TsuchiyaKoji Hosaka
    • Ryuji FujiiTakashi HondaHiroyasu TsuchiyaKoji Hosaka
    • G01D21/00
    • G11B5/102B24B37/005B24B37/048B24B49/16G11B5/3166G11B5/3169G11B5/3173
    • A probe assembly used to lap a bar, the bar being provided with elements that are to be formed into sliders, is provided. The probe assembly comprises an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end while preventing a bending deformation at the leading end from becoming smaller than the first bending deflection. The leading end of the probe is adapted to be subjected to second bending deflection that is larger than the first bending deflection in a same direction as a direction of the first bending deflection and thereby to abut against an electrode pad to establish electrical connection between the probe and the electrode pad, the electrode pad being provided on a surface of the bar other than a surface to be lapped.
    • 提供了一种用于搭接杆的探针组件,该杆设置有要形成滑块的元件。 探针组件包括可弹性偏转的探针和用于向探针施加弯曲变形的止动件,以便在探针的前端引起第一弯曲偏转,并且用于保持前端的第一弯曲偏转,同时防止弯曲变形 前端从小于第一弯曲偏转。 探针的前端适于在与第一弯曲偏转的方向相同的方向上经受大于第一弯曲偏转的第二弯曲偏转,从而抵靠电极焊盘以在探针之间建立电连接 和电极焊盘,电极焊盘设置在除了要研磨的表面之外的杆的表面上。