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    • 2. 发明授权
    • Diode junction poly fuse
    • 二极管结聚熔丝
    • US07892895B2
    • 2011-02-22
    • US11207634
    • 2005-08-19
    • Shien-Yang WuShi-Bai Chen
    • Shien-Yang WuShi-Bai Chen
    • H01L21/82
    • H01L23/5256H01L2924/0002H01L2924/00
    • System and method for providing an electrical fuse having a p-n junction diode. A preferred embodiment comprises a cathode, an anode, and one or more links formed between the cathode and the anode. The cathode and the portion of the cathode adjoining the link are doped with a first impurity, preferably a p-type impurity. The anode and the portion of the link adjoining the anode are doped with a second impurity, preferably an n-type impurity. The junction of the first impurity and the second impurity in the link forms a p-n junction diode. A conductive layer, such as a silicide layer, is formed over the p-n junction diodes. In an alternative embodiment, a plurality of p-n junction diodes may be formed in each link. One or more contacts may be formed to provide electrical contact to the cathode and the anode.
    • 用于提供具有p-n结二极管的电熔丝的系统和方法。 优选实施例包括阴极,阳极和形成在阴极和阳极之间的一个或多个连接。 邻接连接的阴极和阴极部分掺杂有第一杂质,优选p型杂质。 阳极和邻接阳极的连接部分掺杂有第二杂质,优选为n型杂质。 连接中的第一杂质和第二杂质的结形成p-n结二极管。 在p-n结二极管上形成诸如硅化物层的导电层。 在替代实施例中,可以在每个链路中形成多个p-n结二极管。 可以形成一个或多个触点以提供与阴极和阳极的电接触。
    • 5. 发明授权
    • Low power fuse structure and method of making the same
    • 低功率熔断器结构及制作方法
    • US07109564B2
    • 2006-09-19
    • US10805747
    • 2004-03-22
    • Shien-Yang WuShi-Bai Chen
    • Shien-Yang WuShi-Bai Chen
    • H01L29/00
    • H01L23/5256H01L2924/0002H01L2924/3011H01L2924/00
    • A fuse comprises a silicide element disposed above a substrate, a first terminal contact coupled to a first end of the silicide element, and a first metal line disposed above the silicide element and coupled to the first terminal contact. The fuse further comprises a plurality of second terminal contacts coupled to a second end of the silicide element, and a second metal line disposed above the silicide element and coupled to the plurality of second terminal contacts. The silicide element has a sufficient width that a programming potential applied across the first and second metal lines causes a discontinuity in the first terminal contact.
    • 熔丝包括设置在衬底上的硅化物元件,耦合到硅化物元件的第一端的第一端子触点和设置在硅化物元件上方并耦合到第一端子触点的第一金属线。 熔丝还包括耦合到硅化物元件的第二端的多个第二端子触点,以及设置在硅化物元件上方并耦合到多个第二端子触点的第二金属线。 硅化物元件具有足够的宽度,使得施加在第一和第二金属线上的编程电位导致第一端子触点中的不连续性。
    • 8. 发明授权
    • Diode junction poly fuse
    • 二极管结聚熔丝
    • US06956277B1
    • 2005-10-18
    • US10806955
    • 2004-03-23
    • Shien-Yang WuShi-Bai Chen
    • Shien-Yang WuShi-Bai Chen
    • H01L21/768H01L21/82H01L23/525H01L29/00H01L29/36H01L29/74H01L29/861
    • H01L23/5256H01L2924/0002H01L2924/00
    • System and method for providing an electrical fuse having a p-n junction diode. A preferred embodiment comprises a cathode, an anode, and one or more links formed between the cathode and the anode. The cathode and the portion of the cathode adjoining the link are doped with a first impurity, preferably a p-type impurity. The anode and the portion of the link adjoining the anode are doped with a second impurity, preferably an n-type impurity. The junction of the first impurity and the second impurity in the link forms a p-n junction diode. A conductive layer, such as a silicide layer, is formed over the p-n junction diodes. In an alternative embodiment, a plurality of p-n junction diodes may be formed in each link. One or more contacts may be formed to provide electrical contact to the cathode and the anode.
    • 用于提供具有p-n结二极管的电熔丝的系统和方法。 优选实施例包括阴极,阳极和形成在阴极和阳极之间的一个或多个连接。 邻接连接的阴极和阴极部分掺杂有第一杂质,优选p型杂质。 阳极和邻接阳极的连接部分掺杂有第二杂质,优选为n型杂质。 连接中的第一杂质和第二杂质的结形成p-n结二极管。 在p-n结二极管上形成诸如硅化物层的导电层。 在替代实施例中,可以在每个链路中形成多个p-n结二极管。 可以形成一个或多个触点以提供与阴极和阳极的电接触。