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    • 4. 发明申请
    • Blanket implant diode
    • 毯式植入二极管
    • US20070090360A1
    • 2007-04-26
    • US11415522
    • 2006-05-02
    • Sheng-Huei DaiYa-Chin KingChun-Jen HuangL.C. Kao
    • Sheng-Huei DaiYa-Chin KingChun-Jen HuangL.C. Kao
    • H01L29/04H01L21/00H01L29/15H01L29/10H01L31/00H01L31/036
    • H01L29/8611H01L29/66136
    • Blanket implant diode which can be used for transient voltage suppression having a P+ substrate implanted with an N-type dopant blanket implant near a top surface of the substrate, creating a P− region. An oxide mask is layered adjacent to and above the P− region. The oxide mask is partially etched away from a portion of the P− region, creating an etched region. An N-type main function implant is implanted into the etched region, creating an N+ region above the P+ substrate and adjacent the P− region. And, a metal is layered above the oxide mask in the etched region to form an electrode. Terminations may be attached electrically to both sides of the P-N junction. Methods of making and using the present invention and methods for transient voltage suppression are also provided.
    • 可以用于瞬态电压抑制的毯式注入二极管,其具有在衬底的顶表面附近注入N型掺杂剂覆盖层注入的P +衬底,形成P-区。 在P区附近层叠氧化物掩模。 氧化物掩模被部分地蚀刻离开P-区域的一部分,产生蚀刻区域。 将N型主要功能植入物注入到蚀刻区域中,在P +衬底上方形成N +区域并邻近P-区域。 并且,在蚀刻区域中的氧化物掩模上方形成金属以形成电极。 端子可以电连接到P-N结的两侧。 还提供了制造和使用本发明的方法和用于瞬态电压抑制的方法。
    • 5. 发明授权
    • Semiconductor capacitor
    • 半导体电容
    • US08384155B2
    • 2013-02-26
    • US11697070
    • 2007-04-05
    • Chrong-Jung LinHsin-Ming ChenYa-Chin King
    • Chrong-Jung LinHsin-Ming ChenYa-Chin King
    • H01L29/94
    • G11C17/04G11C2216/26H01L27/112H01L27/11206H01L29/94
    • A one time programmable memory cell having a gate, a gate dielectric layer, a source region, a drain region, a capacitor dielectric layer and a conductive plug is provided herein. The gate dielectric layer is disposed on a substrate. The gate is disposed on the gate dielectric layer. The source region and the drain region are disposed in the substrate at the sides of the gate, respectively. The capacitor dielectric layer is disposed on the source region. The capacitor dielectric layer is a resistive protection oxide layer or a self-aligned salicide block layer. The conductive plug is disposed on the capacitor dielectric layer. The conductive plug is served as a first electrode of a capacitor and the source region is served as a second electrode of the capacitor. The one time programmable memory (OTP) cell is programmed by making the capacitor dielectric layer breakdown.
    • 本文提供了具有栅极,栅极介电层,源极区域,漏极区域,电容器电介质层和导电插塞的一次性可编程存储器单元。 栅介质层设置在基板上。 栅极设置在栅极电介质层上。 源极区域和漏极区域分别设置在栅极的侧面的基板中。 电容器介质层设置在源极区域上。 电容器介电层是电阻保护氧化物层或自对准的自对准硅化物阻挡层。 导电插头设置在电容器电介质层上。 导电插头用作电容器的第一电极,源区域用作电容器的第二电极。 一次性可编程存储器(OTP)单元通过使电容器介质层击穿而被编程。
    • 6. 发明申请
    • NON-VOLATILE SEMICONDUCTOR DEVICE, AND METHOD OF OPERATING THE SAME
    • 非挥发性半导体器件及其操作方法
    • US20120257458A1
    • 2012-10-11
    • US13438642
    • 2012-04-03
    • Chrong-Jung LinYa-Chin King
    • Chrong-Jung LinYa-Chin King
    • G11C16/04H01L29/788
    • G11C16/16G11C16/0416H01L27/11521
    • A non-volatile semiconductor device and a method for operating the same are disclosed, where the non-volatile semiconductor device includes a gate dielectric layer, a n-type floating gate, a coupling gate, a first n-type source/drain, a second n-type source/drain, a first contact plug and a second contact plug. The gate dielectric layer is formed on a p-type semiconductor substrate. The n-type floating gate is formed on the gate dielectric layer. The first n-type source/drain and the second n-type source/drain are formed in the p-type semiconductor substrate. The first and second contact plugs are formed on the first and second n-type source/drains respectively. The coupling gate consists essentially of a capacitor dielectric layer and a third contact plug, where the capacitor dielectric layer is formed on the n-type floating gate, and the third contact plug is formed on the capacitor dielectric layer.
    • 公开了一种非易失性半导体器件及其操作方法,其中非易失性半导体器件包括栅极电介质层,n型浮动栅极,耦合栅极,第一n型源极/漏极, 第二n型源极/漏极,第一接触插塞和第二接触插塞。 栅电介质层形成在p型半导体衬底上。 n型浮栅形成在栅介质层上。 第一n型源极/漏极和第二n型源极/漏极形成在p型半导体衬底中。 第一和第二接触塞分别形成在第一和第二n型源极/漏极上。 耦合栅极基本上由电容器介电层和第三接触插塞构成,其中电容器电介质层形成在n型浮置栅极上,第三接触插塞形成在电容器介电层上。
    • 7. 发明申请
    • SEMICONDUCTOR CAPACITOR, ONE TIME PROGRAMMABLE MEMORY CELL AND FABRICATING METHOD AND OPERATING METHOD THEREOF
    • 半导体电容器,一次可编程存储器单元及其制作方法及其工作方法
    • US20120099361A1
    • 2012-04-26
    • US13338632
    • 2011-12-28
    • Chrong-Jung LinHsin-Ming ChenYa-Chin King
    • Chrong-Jung LinHsin-Ming ChenYa-Chin King
    • G11C17/04
    • G11C17/04G11C2216/26H01L27/112H01L27/11206H01L29/94
    • A one time programmable memory cell having a gate, a gate dielectric layer, a source region, a drain region, a capacitor dielectric layer and a conductive plug is provided herein. The gate dielectric layer is disposed on a substrate. The gate is disposed on the gate dielectric layer. The source region and the drain region are disposed in the substrate at the sides of the gate, respectively. The capacitor dielectric layer is disposed on the source region. The capacitor dielectric layer is a resistive protection oxide layer or a self-aligned silicide block layer. The conductive plug is disposed on the capacitor dielectric layer. The conductive plug is served as a first electrode of a capacitor and the source region is served as a second electrode of the capacitor. The one time programmable memory (OTP) cell is programmed by making the capacitor dielectric layer breakdown.
    • 本文提供了具有栅极,栅极介电层,源极区域,漏极区域,电容器电介质层和导电插塞的一次性可编程存储器单元。 栅介质层设置在基板上。 栅极设置在栅极电介质层上。 源极区域和漏极区域分别设置在栅极的侧面的基板中。 电容器介质层设置在源极区域上。 电容器介电层是电阻保护氧化物层或自对准硅化物阻挡层。 导电插头设置在电容器电介质层上。 导电插头用作电容器的第一电极,源区域用作电容器的第二电极。 一次性可编程存储器(OTP)单元通过使电容器介质层击穿而被编程。
    • 8. 发明申请
    • METHOD OF FABRICATING PHOTO SENSOR
    • 制作照片传感器的方法
    • US20110165727A1
    • 2011-07-07
    • US13045512
    • 2011-03-10
    • Chien-Sen WengChih-Wei ChaoChrong-Jung LinYa-Chin King
    • Chien-Sen WengChih-Wei ChaoChrong-Jung LinYa-Chin King
    • H01L31/18
    • H01L31/153G02F2201/58
    • A method of fabricating a photo sensor includes the following steps. First, a substrate is provided, having a conductive layer, a buffer dielectric layer, a patterned semiconductor layer, a dielectric layer, and a planarization layer disposed thereon from bottom to top, wherein the patterned semiconductor layer comprises a first doped region, an intrinsic region, and a second doped region disposed in order. Then, the planarization layer is patterned to form an opening in the planarization layer to expose a portion of the dielectric layer, wherein the opening is positioned on the intrinsic region and portions of the first and the second doped regions. Thereafter, at least a patterned transparent conductive layer is formed in the opening, covering the boundary of the intrinsic region and the first doped region and the boundary of the intrinsic region and the second doped region.
    • 一种制造光传感器的方法包括以下步骤。 首先,提供具有导电层,缓冲电介质层,图案化半导体层,电介质层和从底部到顶部设置在其上的平坦化层的衬底,其中所述图案化半导体层包括第一掺杂区域, 区域,以及依次布置的第二掺杂区域。 然后,对平坦化层进行图案化以在平坦化层中形成开口,以暴露电介质层的一部分,其中开口位于本征区域和第一和第二掺杂区域的部分上。 此后,至少在开口中形成图案化的透明导电层,覆盖本征区域和第一掺杂区域以及本征区域和第二掺杂区域的边界的边界。