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    • 8. 发明授权
    • System and method for measuring hole orientation for SPECT collimators
    • 用于测量SPECT准直仪孔取向的系统和方法
    • US08340386B2
    • 2012-12-25
    • US12987376
    • 2011-01-10
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G06K9/00A61B6/00
    • G06T11/005A61B6/037
    • A method for measuring a SPECT collimator's hole orientation angles includes (a) providing a plurality of parallel spaced apart line radiation sources at a distance from a detector; (b) positioning a first collimator between the plurality of spaced apart line radiation sources and the detector; (c) obtaining a set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a first direction; (d) obtaining a second set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a second direction thai is perpendicular to the first direction; (c) repeating the steps (c) and (d) for a second collimator, wherein one of the two collimators is a reference collimator and the other of the two collimators is a collimator being measured.
    • 用于测量SPECT准直器的孔取向角的方法包括(a)在与检测器相距一定距离处提供多个平行间隔开的​​线辐射源; (b)将第一准直器定位在所述多个间隔开的线辐射源和所述检测器之间; (c)通过在第一方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的一组线图像; (d)通过在垂直于第一方向的第二方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的第二组线图像; (c)对于第二准直仪重复步骤(c)和(d),其中两个准直器中的一个是参考准直器,并且两个准直器中的另一个是被测量的准直器。
    • 9. 发明申请
    • System and Method for Measuring Hole Orientation for SPECT Collimators
    • 用于测量SPECT准直器孔定位的系统和方法
    • US20120177268A1
    • 2012-07-12
    • US12987376
    • 2011-01-10
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G06K9/00
    • G06T11/005A61B6/037
    • A method for measuring a SPECT collimator's hole orientation angles includes (a) providing a plurality of parallel spaced apart line radiation sources at a distance from a detector; (b) positioning a first collimator between the plurality of spaced apart line radiation sources and the detector; (c) obtaining a set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a first direction; (d) obtaining a second set of line images of the plurality of line radiation sources by scanning/stepping the plurality of line radiation sources across the first collimator in a second direction that is perpendicular to the first direction; (e) repeating the steps (c) and (d) for a second collimator, wherein one of the two collimators is a reference collimator and the other of the two collimators is a collimator being measured, whereby the line images obtained using the reference collimator are reference collimator line images and the line images obtained using the collimator being measured are measured collimator line images; (f) analyzing the reference collimator line images and the measured collimator line images and determining the offset distance dx between the reference collimator line images and the measured collimator line images in the first direction and the offset distance dy between the reference collimator line images and the measured collimator line images in the second direction, wherein dx is the offset distance in the first direction and dy is the offset distance in the second direction; and (g) calculating hole orientation angles θx, θy for each collimator hole in the collimator being measured.
    • 用于测量SPECT准直器的孔取向角的方法包括(a)在与检测器相距一定距离处提供多个平行间隔开的​​线辐射源; (b)将第一准直器定位在所述多个间隔开的线辐射源和所述检测器之间; (c)通过在第一方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的一组线图像; (d)通过在垂直于第一方向的第二方向跨越第一准直仪扫描/步进多条线辐射源来获得多条线辐射源的第二组线图像; (e)对于第二准直仪重复步骤(c)和(d),其中两个准直仪中的一个是参考准直仪,并且两个准直仪中的另一个是被测量的准直仪,由此使用参考准直仪 是参考准直器线图像和使用被测量的准直器获得的线图像是测量准直器线图像; (f)分析参考准直器线图像和所测量的准直仪线图像,并且确定参考准直器线图像与第一方向上的测量准直仪线图像之间的偏移距离dx以及参考准直器线图像与参考准直器行图像之间的偏移距离dy 在第二方向上测量准直仪线图像,其中dx是第一方向上的偏移距离,dy是第二方向上的偏移距离; 和(g)计算待测量的准直器中的每个准直器孔的孔取向角度和角度; x,& t; y。
    • 10. 发明授权
    • Position-weighted location of scintillation events
    • 闪烁事件的位置加权位置
    • US08115172B2
    • 2012-02-14
    • US12568432
    • 2009-09-28
    • Ronald E. Malmin
    • Ronald E. Malmin
    • G01T1/20
    • G01T1/1644
    • Determining a scintillation event location bevent along an axis B of an array of photomultiplier tubes, each photomultiplier tube having a location bPMT and an output ZPMT. Determining a preliminary event location bprelim along the B axis as a centroid of the photomultiplier tube outputs. Determining a position-weighted characteristic (ZPMT·(bPMT−bprelim)2) of each of the photomultiplier tubes. Determining event location bevent along the B axis as a centroid of the outputs of those photomultiplier tubes characterized by a position-weighted characteristic less than or equal to a predetermined cutoff.
    • 确定沿着光电倍增管阵列的轴线B的闪烁事件位置,每个光电倍增管具有位置bPMT和输出ZPMT。 确定沿B轴的初步事件位置bprelim作为光电倍增管输出的质心。 确定每个光电倍增管的位置加权特性(ZPMT·(bPMT-bprelim)2)。 确定沿着B轴的事件位置作为这些光电倍增管的输出的质心,其特征在于小于或等于预定截止点的位置加权特性。