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    • 10. 发明授权
    • Reliability, availability, and serviceability in a memory device
    • 内存设备的可靠性,可用性和可维护性
    • US08806298B2
    • 2014-08-12
    • US12824298
    • 2010-06-28
    • Kuljit S. Bains
    • Kuljit S. Bains
    • H03M13/00
    • G06F11/1008
    • Embodiments of the invention are generally directed to improving the reliability, availability, and serviceability of a memory device. In some embodiments, a memory device includes a memory core having a first portion to store data bits and a second portion to store error correction code (ECC) bits corresponding to the data bits. The memory device may also include error correction logic on the same die as the memory core. In some embodiments, the error correction logic enables the memory device to compute ECC bits and to compare the stored ECC bits with the computed ECC bits.
    • 本发明的实施例一般涉及提高存储器件的可靠性,可用性和可服务性。 在一些实施例中,存储器设备包括具有存储数据位的第一部分的存储器核心和存储对应于数据位的纠错码(ECC)位的第二部分。 存储器件还可以包括与存储器核心相同的管芯上的纠错逻辑。 在一些实施例中,纠错逻辑使得存储器设备能够计算ECC比特并将所存储的ECC比特与所计算的ECC比特进行比较。