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    • 2. 发明申请
    • SEMICONDUCTOR DEVICE AND WRITING METHOD
    • 半导体器件和写入方法
    • WO2006011222A8
    • 2006-03-16
    • PCT/JP2004010914
    • 2004-07-30
    • SPANSION LLCSPANSION JAPAN LTDYAMADA SHIGEKAZU
    • YAMADA SHIGEKAZU
    • G11C16/10
    • G11C11/5628G11C16/10G11C2216/14
    • A semiconductor device comprising a memory cell array including multi-valued memory cells each having a plurality of different threshold values; a first latch circuit for latching information in input information of multi-words; a second latch circuit for latching write information obtained by converting the information in the input information of the multi-words to information that are in accordance with the levels of the multi-valued memory cells; a write circuit for writing the information into the multi-valued memory cells for each group corresponding to the number of memory cells into which the information can be simultaneously written;and a control circuit for controlling the writing into the memory cell array. Thus, information are simultaneously written for each of the groups into which the input information of the multi-words are divided, so that the write time per unit word can be substantially shortened. In this way, during the writing into the multi-valued memory cells, even if programs and verifications must be repeated many times, the write time does not increase.
    • 一种半导体器件,包括具有多值存储单元的存储单元阵列,每个多值存储单元具有多个不同的阈值; 用于在多字输入信息中锁存信息的第一锁存电路; 第二锁存电路,用于锁存通过将多字的输入信息中的信息转换为与多值存储器单元的电平相对应的信息而获得的写入信息; 写入电路,用于将信息写入与可以同时写入信息的存储单元的数量相对应的每个组的多值存储单元;以及控制电路,用于控制对存储单元阵列的写入。 因此,对于分割多字的输入信息的每个组同时写入信息,从而可以显着缩短每单位字的写入时间。 以这种方式,在写入多值存储器单元期间,即使程序和验证必须重复多次,写入时间也不会增加。
    • 5. 发明专利
    • Semiconductor device and writing method
    • GB2431026A
    • 2007-04-11
    • GB0701433
    • 2004-07-30
    • SPANSION LLCSPANSION JAPAN LTD
    • YAMADA SHIGEKAZU
    • G11C16/10G11C7/10G11C11/56G11C16/04
    • A semiconductor device comprising a memory cell array including multi-valued memory cells each having a plurality of different threshold values; a first latch circuit for latching information in input information of multi-words; a second latch circuit for latching write information obtained by converting the information in the input information of the multi-words to information that are in accordance with the levels of the multi-valued memory cells; a write circuit for writing the information into the multi-valued memory cells for each group corresponding to the number of memory cells into which the information can be simultaneously written; and a control circuit for controlling the writing into the memory cell array. Thus, information are simultaneously written for each of the groups into which the input information of the multi-words are divided, so that the write time per unit word can be substantially shortened. In this way, during the writing into the multi-valued memory cells, even if programs and verifications must be repeated many times, the write time does not increase.
    • 7. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2010267382A
    • 2010-11-25
    • JP2010195775
    • 2010-09-01
    • Spansion Japan株式会社Spansion Japan LtdSpansion Llcスパンション エルエルシー
    • YAMADA SHIGEKAZU
    • G11C16/02G11C16/06
    • PROBLEM TO BE SOLVED: To provide a semiconductor device that prevents erasure in program operation. SOLUTION: The semiconductor device has: a memory part including a memory cell having a plurality of different thresholds; a read circuit reading out existing data from a memory cell in which input write data is to be written by using a sense amplifier for verify; and a detecting circuit comparing the write data with the existing data and detecting a pattern in which erasure occurs in write operation. The pattern that causes erasure in write operation is prohibited. When the prohibition operation is recognized, the operation is forcibly terminated without starting write operation by a write command. COPYRIGHT: (C)2011,JPO&INPIT
    • 要解决的问题:提供一种防止编程操作中的擦除的半导体器件。 解决方案:半导体器件具有:存储器部分,其包括具有多个不同阈值的存储单元; 读取电路通过使用用于验证的读出放大器从要存储输入写数据的存储单元读出现有数据; 以及检测电路,将写入数据与现有数据进行比较,并检测在写入操作中发生擦除的模式。 禁止在写操作中导致擦除的模式。 当禁止操作被识别时,操作被强制终止,而不用写入命令开始写入操作。 版权所有(C)2011,JPO&INPIT