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    • 4. 发明申请
    • DEPOSITION APPARATUS AND DEPOSITION METHOD USING THE SAME
    • 沉积装置和使用该沉积方法的沉积方法
    • WO2010027178A2
    • 2010-03-11
    • PCT/KR2009004906
    • 2009-09-01
    • SNU PRECISION CO LTDKANG CHANG HOKWON HYUN GOONAMGOONG SUNG TAESON SUNG KWAN
    • KANG CHANG HOKWON HYUN GOONAMGOONG SUNG TAESON SUNG KWAN
    • H01L21/203
    • C23C14/547C23C14/042C23C14/12C23C14/568
    • A transmission chamber connected to the processing chamber, a substrate seating part located in the processing chamber to seat a substrate, a deposition source facing the substrate seating part and storing a source material, and a thickness measuring part installed in the transmission chamber to directly measure a practical thickness of a deposition layer formed on the substrate. It is possible to directly measure and monitor the practical thickness of the deposition layer using the deposition apparatus employing the thickness measuring part. Thus, a thickness of the deposition layer can be exactly controlled by monitoring the practical thickness of the deposition layer in real time and correcting the deposition control thickness used to control the practical thickness of the deposition layer, so that the reliability and the yield rate of a device fabricated on the substrate can be improved.
    • 连接到处理室的传输室,位于处理室中的基板安置部分,用于安置基板,面向基板安置部分并存储源材料的沉积源,以及安装在传送室中的厚度测量部分,以直接测量 形成在基板上的沉积层的实际厚度。 可以使用采用厚度测量部件的沉积设备直接测量和监测沉积层的实际厚度。 因此,可以通过实时监控沉积层的实际厚度和校正用于控制沉积层的实际厚度的沉积控制厚度来精确地控制沉积层的厚度,从而可靠性和屈服率 可以改善在基板上制造的器件。