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    • 5. 再颁专利
    • Preventing drain to body forward bias in a MOS transistor
    • 防止在MOS晶体管中排出体内正向偏置
    • USRE42494E1
    • 2011-06-28
    • US11800071
    • 2007-05-03
    • Ross E. Teggatz
    • Ross E. Teggatz
    • H03K5/003
    • H03K5/003
    • A voltage level shifting circuit (FIG. 4) has a plurality of PMOS transistors M1, M2, M3 connected in parallel for respectively driving a capacitive load CL with a selected different voltage level V1, V2 or V3. Transistors M1, M2, M3 are controlled so that one of them is placed in the ON condition, with the others in the OFF condition, to connect one of the voltages V1, V2 or V3 to charge the load CL. The largest voltage transistor M3 has its body connected to its source. The lower voltage transistors M1, M2 have their bodies respectively connected to switches S1, S2, which connect the bodies to the sources when the transistors are placed in the ON condition and connect the bodies to the highest voltage V3 when the transistors are placed in the OFF condition.
    • 电压电平移动电路(图4)具有并联连接的多个PMOS晶体管M1,M2,M3,分别驱动具有所选择的不同电压电平V1,V2或V3的电容性负载CL。 控制晶体管M1,M2,M3,使其中的一个被置于ON状态,其他的处于OFF状态,以连接电压V1,V2或V3中的一个来对负载CL充电。 最大的电压晶体管M3的主体连接到其源极。 低电压晶体管M1,M2的主体分别连接到开关S1,S2,开关S1,S2将晶体管置于ON状态时将主体连接到源极,并将晶体管放置在 OFF状态。
    • 7. 发明授权
    • Oscillator and method
    • 振荡器和方法
    • US06373343B1
    • 2002-04-16
    • US09649367
    • 2000-08-28
    • David J. BaldwinChristopher M. CooperJoseph A. DevoreRoss E. Teggatz
    • David J. BaldwinChristopher M. CooperJoseph A. DevoreRoss E. Teggatz
    • H03B524
    • H03K3/0231
    • An integrated circuit (10) is disclosed comprising a fundamental frequency oscillator comprising a reference node (32) whose voltage varies between a high threshold and a low threshold. The fundamental frequency oscillator is operable to generate a first output at the fundamental frequency on a first output node (36). The integrated circuit (10) also comprises a circuit (C2) coupled to the reference node. The circuit (C2) is operable to sense the voltage at the reference node (32), to determine when the voltage exceeds an intermediate threshold between the high threshold and the low threshold, and to generate a second output in response to the determination. The integrated circuit (10) also comprises logic (40) coupled to the circuit (C2) and load circuitry (50) coupled to the logic (40). The logic (40) is operable to generate an output signal at an output frequency greater than the fundamental frequency in response to the second output and the first output.
    • 公开了一种集成电路(10),其包括基频振荡器,其包括其电压在高阈值和低阈值之间变化的参考节点(32)。 基频振荡器可操作以在第一输出节点(36)上产生基频处的第一输出。 集成电路(10)还包括耦合到参考节点的电路(C2)。 电路(C2)可操作以感测参考节点(32)处的电压,以确定电压何时超过高阈值和低阈值之间的中间阈值,并响应于该确定产生第二输出。 集成电路(10)还包括耦合到电路(C2)的逻辑(40)和耦合到逻辑(40)的负载电路(50)。 逻辑(40)可操作以响应于第二输出和第一输出而以大于基频的输出频率产生输出信号。
    • 9. 发明授权
    • Zener diode structure with high reverse breakdown voltage
    • 具有高反向击穿电压的齐纳二极管结构
    • US5869882A
    • 1999-02-09
    • US724575
    • 1996-09-30
    • Wayne T. ChenRoss E. TeggatzTaylor R. Efland
    • Wayne T. ChenRoss E. TeggatzTaylor R. Efland
    • H01L29/866H01L29/861H01L31/107
    • H01L29/866H01L29/0692H01L29/402H01L29/66106
    • A zener diode capable of breakdown at much higher voltages than in the prior art is fabricated by providing a semiconductor substrate of a first conductivity type having an opposite conductivity type first tank disposed therein. The first tank includes relatively lower and relatively higher resistivity portions, the relatively lower doped portion isolating the relatively higher doped portion from the substrate. A first region of first conductivity type is disposed in the higher doped portion and a second region of opposite conductivity type and more highly doped than the first tank is spaced from the first region. Structure is provided between the first and second regions for repelling majority charge carriers associated with the opposite conductivity type which can be a field plate spaced from the first tank; a portion at the surface of the first tank having the first conductivity type; or a tank, of first conductivity type disposed in the first tank, abutting the first region, extending more deeply into the first tank than does the first region and more lightly doped than the first region. In accordance with a further embodiment, the diode includes a semiconductor substrate, a first tank portion disposed in the substrate and a second tank portion disposed in the first tank portion as in the prior embodiments. A first region of first conductivity type is disposed in the second tank portion and extends into the first tank portion. A second region of opposite conductivity type more highly doped than the first tank portion is disposed in the first tank portion and spaced from the first region.
    • 能够以比现有技术高得多的电压击穿的齐纳二极管通过提供具有设置在其中的具有相反导电类型的第一容器的第一导电类型的半导体衬底来制造。 第一罐包括相对较低和相对较高的电阻率部分,相对较低的掺杂部分将相对较高的掺杂部分与衬底隔离。 第一导电类型的第一区域设置在较高掺杂部分中,并且具有相反导电类型的第二区域和比第一容器更高掺杂的第二区域与第一区域间隔开。 在第一和第二区域之间提供结构,用于排斥与相反导电类型相关联的多数电荷载体,其可以是与第一罐间隔开的场板; 第一罐的表面上具有第一导电类型的部分; 或第一导电类型的罐,邻接第一区域,比第一区域更深地延伸到第一槽中,并且比第一区域更轻地掺杂。 根据另一实施例,二极管包括半导体衬底,设置在衬底中的第一容器部分和如先前实施例中那样设置在第一容器部分中的第二容器部分。 第一导电类型的第一区域设置在第二罐部分中并延伸到第一罐部分中。 与第一容器部分相比更高掺杂的相反导电类型的第二区域设置在第一罐部分中并与第一区域间隔开。
    • 10. 发明授权
    • Reducing the natural current limit in a power MOS device by reducing the
gate-source voltage
    • 通过降低栅源电压降低功率MOS器件的自然电流限制
    • US5579193A
    • 1996-11-26
    • US486926
    • 1995-06-07
    • Thomas A. SchmidtRoss E. TeggatzJoseph A. Devore
    • Thomas A. SchmidtRoss E. TeggatzJoseph A. Devore
    • H03K17/082H02H7/10
    • H03K17/0822
    • In accordance with the present invention, an output current limit circuit for protecting a power MOS output device of an integrated circuit from an excessive drain current comprises a power MOS device 110, sensing circuitry 30 to sense a predetermined trigger current, and limitation circuitry 20 to reduce a gate-source voltage on MOS output device 110 to a predetermined approximately fixed value. A drain current I.sub.D flows through power MOS device 110 from output terminal 102 in response to the gate-source voltage. A short circuit condition may allow an excessive amount of drain current I.sub.D to flow through output terminal 102. The gate-source voltage is reduced in response to sensing the trigger current. Reducing the gate-source voltage raises a drain-source resistance of MOS device 110 and reduces drain current I.sub.D so that MOS device 110 is not damaged by the short circuit condition.
    • 根据本发明,用于保护集成电路的功率MOS输出装置与过剩漏极电流的输出限流电路包括功率MOS器件110,检测电路30以感测预定的触发电流,以及限制电路20至 将MOS输出装置110上的栅极 - 源极电压降低到预定的大致固定值。 漏极电流ID响应于栅极 - 源极电压从输出端子102流过功率MOS器件110。 短路状态可允许过量的漏极电流ID流过输出端子102.响应于感测触发电流,栅极 - 源极电压被降低。 降低栅极 - 源极电压会提高MOS器件110的漏极 - 源极电阻并且减少漏极电流ID,使得MOS器件110不会被短路状态损坏。