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1. 发明授权

US06320148B1 Electrostatic method of separating particulate materials 有权
标题翻译：静电分离颗粒物的方法
公开(公告)号：US06320148B1
公开(公告)日：2001-11-20
申请号：US09368945
申请日：1999-08-05
申请人： Roe-Hoan Yoon , Oh-Hyung Han , Eric S. Yan , Byung-Wook Park
发明人： Roe-Hoan Yoon , Oh-Hyung Han , Eric S. Yan , Byung-Wook Park
IPC分类号： B03C700
CPC分类号： B03C7/006 , B03C7/04 , Y10S209/92
摘要： A method of separating particulate materials of different properties has been developed. It consists of feeding a mixture of dry, powdered materials to one end of the surface of a planar electrode, which is vibrating to move the particles forward. At least one type of the particulate materials acquires a charge via conduction or triboelectrification. Those particles that acquire charges of the same sign as that of the planar electrode are lifted and collected at the V-shaped counter electrodes installed above. The new separation method is particularly useful for removing unburned carbons from fly ash and any other conducting materials from nonconducting ones.
摘要翻译：已经开发了分离不同性质的颗粒材料的方法。它包括将干燥的粉末材料的混合物供给到平面电极的表面的一端，其被振动以将颗粒向前移动。至少一种类型的颗粒材料通过传导或摩擦带电获得电荷。获得与平面电极相同符号的电荷的那些颗粒被提起并收集在安装在上面的V形对置电极上。新的分离方法特别适用于从飞灰和任何其他不导电的导电材料中除去未燃烧的碳。

2. 发明授权

US06522739B1 Apparatus and method for multi-access conference call in exchange system 有权
标题翻译：交换系统中多访问电话会议的设备和方法
公开(公告)号：US06522739B1
公开(公告)日：2003-02-18
申请号：US09474370
申请日：1999-12-29
申请人： Jin-Hyun Kwon , Byung-Wook Park , Tae-Wan Kim , Jae-Sup Kwak , Joon Eom
发明人： Jin-Hyun Kwon , Byung-Wook Park , Tae-Wan Kim , Jae-Sup Kwak , Joon Eom
IPC分类号： H04M342
CPC分类号： H04M3/56 , H04M3/568
摘要： A multi-access conference call apparatus and method in an exchange system. The multi-access conference call apparatus, which permits a number of subscribers to communicate with each other using their own terminal, includes: a digital signal processing unit for converting a signal of a first digital signal type from each of a plurality of subscriber channels to a signal of a second digital signal type, for summing the signals of the second digital signal type of all subscriber channels except for the signal from the subscriber's own channel, and for converting the summed data for each subscriber channel back to the signals of the first digital signal type, to output the resulting signals of the first digital signal type to each subscriber channel; and a control signal generator for generating control signals for transmitting the signals of the first digital signal type input from each fi subscriber channel, to the digital signal processing unit, and transmitting the signals of the first digital signal type output from the digital signal processing unit, to each corresponding subscriber channel.
摘要翻译：一种交换系统中的多接入会议呼叫装置和方法。允许多个用户使用其自己的终端彼此通信的多址会议呼叫装置包括：数字信号处理单元，用于将来自多个用户信道中的每一个的第一数字信号类型的信号转换为第二数字信号类型的信号，用于将除了来自用户自己的信道的信号之外的所有用户信道的第二数字信号类型的信号相加，以及用于将每个用户信道的相加数据转换回第一数字信号类型，以将第一数字信号类型的结果信号输出到每个用户信道; 以及控制信号发生器，用于产生用于将从每个fi用户信道输入的第一数字信号类型的信号发送到数字信号处理单元的控制信号，并且传送从数字信号处理单元输出的第一数字信号类型的信号，到每个对应的用户信道。

3. 发明授权

US06942497B2 Socket assembly for test of integrated circuit, and its integrated circuit and tester 失效
标题翻译：集成电路测试用插座组件及其集成电路和测试仪
公开(公告)号：US06942497B2
公开(公告)日：2005-09-13
申请号：US10748931
申请日：2003-12-30
申请人： Jung-Hoon Oh , Jeong-yang Kim , Young-Soon Lim , Byung-Wook Park , Jung-Mu Lee
发明人： Jung-Hoon Oh , Jeong-yang Kim , Young-Soon Lim , Byung-Wook Park , Jung-Mu Lee
IPC分类号： G01R31/26 , G01R1/073 , H01R13/24 , H01R33/76 , H01R12/00
CPC分类号： G01R1/0466 , H01R12/85 , H01R2201/20
摘要： The socket assembly includes a guide block, a guide part and a pressurizing plate. The guide block is in a terminal region of a test board, the guide block defining an area into which an integrated circuit can be inserted opposite terminals formed on the test board in the terminal region. The guide part is provided on an inner side wall of the guide block, to guide an insertion position of the integrated circuit so that respective leads of the integrated circuit are aligned with the corresponding terminals of the test board. The pressurizing plate is adapted to interface with the guide block, the pressurizing plate including a pressurizing protrusion on a surface thereof, such that when the pressurizing plate is applied to the guide block, the respective leads of the integrated circuit are urged to connect with the corresponding terminals of the test board.
摘要翻译：插座组件包括引导块，引导部和加压板。引导块位于测试板的端子区域中，引导块限定了可以在终端区域中形成在测试板上的相对端子上插入集成电路的区域。引导部设置在引导块的内侧壁上，以引导集成电路的插入位置，使得集成电路的各个引线与测试板的相应端子对准。所述加压板适于与所述引导块相接合，所述加压板在其表面上包括加压突起，使得当所述加压板被施加到所述引导块时，所述集成电路的各个引线被迫与所述加压板连接，相应的测试板端子。

4. 发明授权

US07479793B2 Apparatus for testing semiconductor test system and method thereof 有权
标题翻译：半导体测试系统测试装置及其方法
公开(公告)号：US07479793B2
公开(公告)日：2009-01-20
申请号：US11635745
申请日：2006-12-07
申请人： Byung-Wook Park , Byeong-Hwan Cho , Young-Dong Nam , Bo-Yeon Kim
发明人： Byung-Wook Park , Byeong-Hwan Cho , Young-Dong Nam , Bo-Yeon Kim
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/2886
摘要： A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current path when the interface unit is determined to be defective.
摘要翻译：测试系统包括被配置为对半导体晶片执行测试操作的测试器; 接口单元，被配置为在所述测试器和所述半导体晶片之间进行接口; 以及导电板，其被配置为当所述接口单元被确定为有缺陷时，为所述接口单元提供电流路径。

5. 发明申请

US20070170939A1 Apparatus for testing semiconductor test system and method thereof 有权
标题翻译：半导体测试系统测试装置及其方法
公开(公告)号：US20070170939A1
公开(公告)日：2007-07-26
申请号：US11635745
申请日：2006-12-07
申请人： Byung-Wook Park , Byeong-Hwan Cho , Young-Dong Nam , Bo-Yeon Kim
发明人： Byung-Wook Park , Byeong-Hwan Cho , Young-Dong Nam , Bo-Yeon Kim
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/2886
摘要： A test system includes a tester configured to perform a test operation on a semiconductor wafer; an interface unit configured to interface between the tester and the semiconductor wafer; and a conductive plate configured to provide the interface unit with a current path when the interface unit is determined to be defective.
摘要翻译：测试系统包括被配置为对半导体晶片执行测试操作的测试器; 接口单元，被配置为在所述测试器和所述半导体晶片之间进行接口; 以及导电板，其被配置为当所述接口单元被确定为有缺陷时，为所述接口单元提供电流路径。

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