会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Photoactive adhesion promoter in a slam
    • 光敏助粘剂
    • US07723008B2
    • 2010-05-25
    • US11087181
    • 2005-03-22
    • Robert P. MeagleyHeidi B. CaoKevin P. O'Brien
    • Robert P. MeagleyHeidi B. CaoKevin P. O'Brien
    • G03C1/00
    • G03F7/091G03F7/0045
    • A semiconductor process technique to help reduce semiconductor process effects, such as undesired line edge roughness, insufficient lithographical resolution, and limited depth of focus problems associated with the removal of a photoresist layer. More particularly, embodiments of the invention use a photoacid generator (PAG) material in conjunction with a sacrificial light absorbing material (SLAM) to help reduce these and other undesired effects associated with the removal of photoresist in a semiconductor manufacturing process. Furthermore, embodiments of the invention allow a PAG to be applied in a semiconductor manufacturing process in an efficient manner, requiring fewer processing operations than typical prior art techniques.
    • 有助于减少半导体工艺效应的半导体工艺技术,例如不期望的线边缘粗糙度,光刻分辨率不足以及与去除光致抗蚀剂层相关的有限的焦深问题。 更具体地,本发明的实施例使用光致酸产生剂(PAG)材料结合牺牲光吸收材料(SLAM)来帮助减少在半导体制造过程中与去除光致抗蚀剂有关的这些和其它不期望的影响。 此外,本发明的实施例允许PAG以有效的方式应用于半导体制造过程中,与典型的现有技术相比需要较少的处理操作。
    • 2. 发明授权
    • Photoactive adhesion promoter in a SLAM
    • SLAM中的光敏粘合促进剂
    • US07718528B2
    • 2010-05-18
    • US11620516
    • 2007-01-05
    • Robert P. MeagleyHeidi B. CaoKevin P. O'Brien
    • Robert P. MeagleyHeidi B. CaoKevin P. O'Brien
    • H01L21/302
    • G03F7/091G03F7/0045
    • A semiconductor process technique to help reduce semiconductor process effects, such as undesired line edge roughness, insufficient lithographical resolution, and limited depth of focus problems associated with the removal of a photoresist layer. More particularly, embodiments of the invention use a photoacid generator (PAG) material in conjunction with a sacrificial light absorbing material (SLAM) to help reduce these and other undesired effects associated with the removal of photoresist in a semiconductor manufacturing process. Furthermore, embodiments of the invention allow a PAG to be applied in a semiconductor manufacturing process in an efficient manner, requiring fewer processing operations than typical prior art techniques.
    • 有助于减少半导体工艺效应的半导体工艺技术,例如不期望的线边缘粗糙度,光刻分辨率不足以及与去除光致抗蚀剂层相关的有限的焦深问题。 更具体地,本发明的实施例使用光致酸产生剂(PAG)材料结合牺牲光吸收材料(SLAM)来帮助减少在半导体制造过程中与去除光致抗蚀剂有关的这些和其它不期望的影响。 此外,本发明的实施例允许PAG以有效的方式应用于半导体制造过程中,与典型的现有技术相比需要较少的处理操作。