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    • 2. 发明授权
    • Fluorescent lamp brightness control
    • 荧光灯亮度控制
    • US4792729A
    • 1988-12-20
    • US891312
    • 1986-07-31
    • Robert M. Peters
    • Robert M. Peters
    • H05B41/232H05B41/392
    • H05B41/2325Y10S315/04
    • A load side phase control circuit is used in conjunction with a conventional fluorescent light ballast (step-up autotransformer) and an isolation transformer to achieve fluorescent lamp brightness control. A resistor and capacitor connected in series shunt the phase control circuit to maintain low level illumination even when the phase control circuit is nonconducting and also provide a transient suppression when the phase control circuit switches to a conducting state. The circuit is especially suited to printed circuit board preassembly and subsequent connection to the lamp and ballast by a one step crimping operation. The resulting fluorescent lamp system--of the rapid start type--is well suited for use as a task light where the lamp is mounted relatively close to an underlying work area and receives power from a conventional outlet.
    • 负载侧相位控制电路与传统的荧光灯镇流器(升压自耦变压器)和隔离变压器结合使用,以实现荧光灯亮度控制。 串联连接的电阻器和电容器分相相位控制电路,即使在相位控制电路不导通时也保持低电平照明,并且当相位控制电路切换到导通状态时也提供瞬态抑制。 该电路特别适合印刷电路板预组装,并通过一步压接操作随后连接到灯和镇流器。 所得到的快速启动型荧光灯系统非常适合用作灯安装得比较靠近下方工作区域并从常规出口接收电力的任务灯。
    • 4. 发明授权
    • Automatically testing a plurality of memory arrays on selected memory
array testers
    • 自动测试选定的存储器阵列测试仪上的多个存储器阵列
    • US4606025A
    • 1986-08-12
    • US536597
    • 1983-09-28
    • Robert M. PetersHenri D. SchnurmannLouis J. Vidunas
    • Robert M. PetersHenri D. SchnurmannLouis J. Vidunas
    • G11C29/00F02B75/02G01R31/28G01R31/319G06F11/22G11C29/54G11C29/56
    • G11C29/56G11C29/54F02B2075/027G01R31/31908
    • A system for automatically testing a plurality of memory arrays on selected memory array testers includes an interactive data entry device for entering array test specifications including characterizing information, DC testing parameters, AC testing parameters and AC test pattern choices for the array. The test specifications are entered in a format which is independent of a particular tester's characteristics. A universal language generator generates a tester independent universal language instruction sequence for carrying out the prescribed tests based upon the entered test specifications. Associated with each tester is a universal language translator which translates the tester independent universal language instruction sequence into an instruction sequence which is particular to the associated tester. The tester dependent instruction sequence may be loaded into the associated tester to produce the test signals for testing the memory array.
    • 用于自动测试所选择的存储器阵列测试器上的多个存储器阵列的系统包括用于输入阵列测试规范的交互式数据输入设备,包括阵列的特征信息,DC测试参数,AC测试参数和AC测试模式选择。 测试规格以与特定测试仪特性无关的格式输入。 通用语言生成器生成测试仪独立的通用语言指令序列,用于根据输入的测试规范执行规定的测试。 与每个测试器相关联的是通用语言翻译器,其将测试仪独立的通用语言指令序列转换成相关测试仪特有的指令序列。 测试仪相关指令序列可以被加载到相关联的测试器中以产生用于测试存储器阵列的测试信号。