会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明授权
    • Lottery game reward system and method
    • 彩票游戏奖励制度和方法
    • US08808079B2
    • 2014-08-19
    • US12756409
    • 2010-04-08
    • Ron E. WilliamsRobert H. Arnold
    • Ron E. WilliamsRobert H. Arnold
    • A63F9/24G06F17/00
    • G07F17/329A63F9/24A63F2009/2411G07F17/32G07F17/3204G07F17/3244G07F17/3255
    • Systems and methods for conducting a lottery game that implements a lottery rewards program are disclosed. The system may include a terminal for providing a game ticket to a player for use in a lottery game play. The game ticket has a randomly assigned redemption point value assigned thereto. The redemption point value includes at least one redemption point for use in a lottery rewards program. The system includes a player interface configured to permit a player to enter game ticket data into the lottery gaming system. The system further includes a controller configured to determine whether the game ticket is a winning game ticket eligible for the payout value of the lottery game play and to award the redemption point value of the game ticket to the player when the game ticket is not a winning ticket. In this manner, the rewards program of the present invention permits players to redeem or collect rewards even if the player loses the lottery game.
    • 公开了实施彩票奖励计划的彩票游戏系统和方法。 系统可以包括用于向玩家提供用于彩票游戏中的游戏票的终端。 游戏券具有分配给其的随机分配的兑换点值。 兑换点值包括用于彩票奖励计划中的至少一个兑换点。 该系统包括被配置为允许玩家将游戏票数据输入到彩票游戏系统中的玩家界面。 该系统还包括:控制器,其被配置为确定游戏票是否是符合彩票游戏的支付价值的获胜游戏券,并且当游戏票不是获胜时将游戏票的兑换点值授予玩家 票。 以这种方式,即使玩家失去了彩票游戏,本发明的奖励计划允许玩家兑换或收取奖励。
    • 5. 发明授权
    • Automated method of burn-in and endurance testing for embedded EEPROM
    • 嵌入式EEPROM的自动化老化和耐久性测试方法
    • US6151693A
    • 2000-11-21
    • US99776
    • 1998-06-19
    • Robert H. ArnoldRichard D. BellRoss A. KohlerRichard J. McPartlandPaul K. Wheeler
    • Robert H. ArnoldRichard D. BellRoss A. KohlerRichard J. McPartlandPaul K. Wheeler
    • G11C29/08G11C29/00G11C7/00
    • G11C29/08G11C16/04G11C2029/0401
    • An on-chip processor is used as a controller for burn-in and endurance testing of embedded non-volatile memory. An automated test machine downloads a test program into the non-volatile memory. The downloaded program contains a test program to be run on the non-volatile memory. When the burn-in or endurance test equipment activates the processor, the processor executes the program and performs a test on the non-volatile memory. The same method can be utilized to perform either the burn-in or endurance tests. Only the clock and reset lines are required to operate the test. Since the clock and reset lines are part of the processor's standard inputs, the method performs burn-in and endurance testing of an embedded non-volatile memory without bringing out the memory's address, data and control lines to the package pins of the integrated circuit. Since the clock and reset lines are part of the standard burn-in and endurance test equipment, the method also performs the testing without the use of expensive burn-in or endurance test equipment.
    • 片上处理器用作嵌入式非易失性存储器的老化和耐久性测试的控制器。 自动测试机器将测试程序下载到非易失性存储器中。 下载的程序包含要在非易失性存储器上运行的测试程序。 当老化或耐久性测试设备激活处理器时,处理器执行程序并对非易失性存储器执行测试。 可以使用相同的方法来执行老化或耐久性测试。 只有时钟和复位线才能进行测试。 由于时钟和复位线是处理器标准输入的一部分,因此该方法对嵌入式非易失性存储器进行老化和耐久性测试,而不会将存储器的地址,数据和控制线路输出到集成电路的封装引脚。 由于时钟和复位线是标准老化和耐久性测试设备的一部分,所以该方法还可以在不使用昂贵的老化或耐久性测试设备的情况下进行测试。