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    • 1. 发明授权
    • Voltage regulator or non-volatile memories implemented with low-voltage transistors
    • 用低压晶体管实现的稳压器或非易失性存储器
    • US07777466B2
    • 2010-08-17
    • US11844470
    • 2007-08-24
    • Luca CrippaGiancarlo RagoneMiriam SangalliGiovanni CampardoRino Micheloni
    • Luca CrippaGiancarlo RagoneMiriam SangalliGiovanni CampardoRino Micheloni
    • G05F1/40
    • G11C5/147G05F1/565G11C16/30
    • A voltage regulator integrated in a chip of semiconductor material is provided. The regulator has a first input terminal for receiving a first voltage and an output terminal for providing a regulated voltage being obtained from the first voltage, the regulator including: a differential amplifier for receiving a comparison voltage and a feedback signal being a function of the regulated voltage, and for proving a regulation signal according to a comparison between the comparison voltage and the feedback signal, the differential amplifier having a first supply terminal being coupled with a reference terminal for receiving a reference voltage and a second supply terminal, a regulation transistor having a control terminal for receiving the regulation signal, and a conduction first terminal and a conduction second terminal being coupled through loading means between the reference terminal and the first input terminal of the regulator, the second terminal of the regulation transistor being coupled with the output terminal of the regulator, wherein the second supply terminal of the differential amplifier is coupled with a second input terminal of the regulator for receiving a second voltage being lower than the first voltage in absolute value, and wherein the regulator further includes a set of auxiliary transistors being connected in series between the second terminal of the regulation transistor and the output terminal of the regulator, and control means for controlling the auxiliary transistors according to the regulated voltage.
    • 提供集成在半导体材料芯片中的电压调节器。 所述调节器具有用于接收第一电压的第一输入端子和用于提供从所述第一电压获得的调节电压的输出端子,所述调节器包括:用于接收比较电压的差分放大器和作为所述第一电压的函数的反馈信号 电压,并且为了根据比较电压和反馈信号之间的比较来证明调节信号,差分放大器具有与用于接收参考电压的参考端子耦合的第一电源端子和第二电源端子,调节晶体管具有 用于接收所述调节信号的控制端子,以及通过所述参考端子和所述调节器的所述第一输入端子之间的负载装置耦合的导通第一端子和导通第二端子,所述调节晶体管的所述第二端子与所述输出端子 的调节器,其中第二电源 差分放大器的nal与调节器的第二输入端耦合,用于接收低于绝对值中的第一电压的第二电压,并且其中调节器还包括一组辅助晶体管,串联连接在第二端 调节器的调节晶体管和输出端子,以及用于根据调节电压控制辅助晶体管的控制装置。
    • 2. 发明授权
    • Semiconductor memory with embedded DRAM
    • 具有嵌入式DRAM的半导体存储器
    • US07027317B2
    • 2006-04-11
    • US10720013
    • 2003-11-20
    • Giovanni CampardoRino Micheloni
    • Giovanni CampardoRino Micheloni
    • G11C11/24G11C14/00
    • G11C11/005
    • A semiconductor memory comprises a plurality of memory cells, for example Flash memory cells, arranged in a plurality of lines, and a plurality of memory cell access signal lines, each one associated with at least one respective line of memory cells, for accessing the memory cells of the at least one respective line of memory cells; each signal line has a capacitance intrinsically associated therewith. A plurality of volatile memory cells is provided, each having a capacitive storage element. Each volatile memory cell is associated with a respective signal line, and the respective capacitive storage element formed by the capacitance intrinsically associated with the respective signal lines. In particular, the parasitic capacitances associated with bit lines of a matrix of memory cells can be exploited as capacitive storage elements.
    • 半导体存储器包括多个存储器单元,例如布置在多个行中的闪存单元,以及多个存储单元存取信号线,每个存储单元接入信号线与至少一个相应行的存储单元相关联,用于访问存储器 存储单元的至少一个相应行的单元; 每个信号线具有与其固有相关的电容。 提供了多个易失性存储单元,每个易失性存储单元具有电容存储元件。 每个易失性存储器单元与相应的信号线相关联,并且由与各个信号线固有相关联的电容形成的相应电容存储元件。 特别地,与存储器单元的矩阵的位线相关联的寄生电容可以被用作电容性存储元件。
    • 3. 发明授权
    • Read circuit for a nonvolatile memory
    • 读取非易失性存储器的电路
    • US06327184B1
    • 2001-12-04
    • US09621019
    • 2000-07-21
    • Rino MicheloniGiovanni CampardoLuca Crippa
    • Rino MicheloniGiovanni CampardoLuca Crippa
    • G11C1606
    • G11C16/28
    • The read circuit comprises an array branch having an input array node connected, via an array bit line, to an array cell; a reference branch having an input reference node connected, via a reference bit line, to a reference cell; a current-to-voltage converter connected to an output array node of the array branch and to an output reference node of the reference branch to supply on the output array node and the output reference node the respective electric potentials correlated to the currents flowing in the array memory cell and, respectively, in the reference memory cell; and a comparator connected at input to the output array node and output reference node and supplying as output a signal indicative of the contents stored in the array memory cell; and an array decoupling stage arranged between the input array node and the output array node to decouple the electric potentials of the input and output array nodes from one another.
    • 读取电路包括具有通过阵列位线连接到阵列单元的输入阵列节点的阵列分支; 参考分支,其具有通过参考位线连接到参考单元的输入参考节点; 连接到阵列分支的输出阵列节点和参考分支的输出参考节点的电流 - 电压转换器,以在输出阵列节点和输出参考节点上提供与在 阵列存储单元,分别在参考存储单元中; 以及比较器,其输入端连接到所述输出阵列节点和输出参考节点,并且作为输出提供指示存储在所述阵列存储单元中的内容的信号; 以及布置在输入阵列节点和输出阵列节点之间的阵列解耦级,以将输入和输出阵列节点的电位彼此去耦。
    • 6. 发明授权
    • Method for erasing non-volatile memory cells and corresponding memory device
    • 擦除非易失性存储单元和相应存储器件的方法
    • US07184319B2
    • 2007-02-27
    • US10675221
    • 2003-09-30
    • Rino MicheloniGiovanni Campardo
    • Rino MicheloniGiovanni Campardo
    • G11C16/16G11C16/08G11C29/04G11C29/24
    • G11C29/82G11C16/04G11C16/16G11C29/44G11C2029/1208
    • The invention relates to a method for erasing non-volatile memory cells, and to a corresponding non-volatile memory device of the programmable and electrically erasable type implementing the method, and comprising a memory cell array organized in a row-and-column layout, and divided in array sectors, including at least one row decode circuit portion being supplied positive and negative voltages. The method is applied whenever the issue of the erase algorithm is negative, and comprises the following steps: forcing an incompletely erased sector into a read condition; scanning the rows of said sector to check for the possible presence of a spurious current indicating a fail state; identifying and electrically isolating the failed row; re-addressing from said failed row to a redundant row provided in the same sector; re-starting the erase algorithm.
    • 本发明涉及一种用于擦除非易失性存储单元的方法,以及实现该方法的可编程和电可擦除类型的相应非易失性存储器件,并且包括以行和列布局组织的存储单元阵列, 并且被划分成阵列扇区,包括至少一个行解码电路部分被提供正和负电压。 每当擦除算法的问题为负时,该方法被应用,并且包括以下步骤:强制将未完全擦除的扇区进入读取状态; 扫描所述扇区的行以检查指示故障状态的寄生电流的可能存在; 识别和电隔离失败的行; 从所述故障行重新寻址到在同一扇区中提供的冗余行; 重新启动擦除算法。
    • 10. 发明授权
    • Method and circuit for regulating the length of an ATD pulse signal
    • 用于调节ATD脉冲信号长度的方法和电路
    • US06169423A
    • 2001-01-02
    • US09186496
    • 1998-11-04
    • Giovanni CampardoRino MicheloniMatteo ZammattioDonato Ferrario
    • Giovanni CampardoRino MicheloniMatteo ZammattioDonato Ferrario
    • H03K522
    • G11C8/18
    • The invention relates to a method and a circuit for regulating a pulse synchronization signal (ATD) for the memory cell read phase in semiconductor integrated electronic memory devices. The pulse signal (ATD) is generated upon detection of a change in logic state of at least one of a plurality of address input terminals of the memory cells, so as to also generate an equalization signal (SAEQ) to a sense amplifier. The SAEQ pulse is blocked (STOP) upon the row voltage reaching a predetermined sufficient value to provide reliable reading. Advantageously, the pulse blocking is produced by a logic signal (STOP) activated upon a predetermined voltage value being exceeded during the overboost phase of the addressed memory row.
    • 本发明涉及一种用于调整半导体集成电子存储器件中存储单元读取相位的脉冲同步信号(ATD)的方法和电路。 在检测到存储器单元的多个地址输入端中的至少一个的逻辑状态的变化时产生脉冲信号(ATD),以便还产生到读出放大器的均衡信号(SAEQ)。 当行电压达到预定的足够值时,SAEQ脉冲被阻塞(STOP),以提供可靠的读数。 有利地,通过在寻址的存储器行的过载阶段期间超过预定电压值而激活的逻辑信号(STOP)产生脉冲阻塞。