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1. 发明申请

WO2011136864A1 PHOTOCONDUCTIVE PHOTODIODE BUILT-IN TEST (BIT) 审中-公开
标题翻译：光电测量（BIT）
公开(公告)号：WO2011136864A1
公开(公告)日：2011-11-03
申请号：PCT/US2011/025569
申请日：2011-02-19
申请人： RAYTHEON COMPANY , SCHMIDT, Richard, A. , PERLEY, Mitchell, Q. , KUEHN, Robert, A.
发明人： SCHMIDT, Richard, A. , PERLEY, Mitchell, Q. , KUEHN, Robert, A.
IPC分类号： G01R31/26 , H05B33/08
CPC分类号： G01R31/2635
摘要： A Built-in Test (BIT) for a photoconductive photodiode is performed using the health or characteristics of the photodiode' s parasitic capacitance as a "proxy" for the health or characteristics of the photodiode itself. A failure or degradation of the photodiode manifests as a similar failure or degradation of the parasitic capacitance. Under normal operating conditions, the photoconductive photodiode responds to incident photons from a target by generating a photocurrent signal at its cathode. A processor processes the signals from one or more photodiodes to evaluate characteristics of the target. To perform the BIT, a time-varying voltage signal is applied at the photodiode's anode. This signal is coupled through the parasitic capacitance to produce a test current signal at the photodiode's anode. The processor processes the signal to evaluate the health or characteristics of the parasitic capacitance and thus the photodiode.
摘要翻译：使用光电二极管的寄生电容的健康或特性作为光电二极管本身的健康或特性的“代理”来执行光电导光电二极管的内置测试（BIT）。光电二极管的故障或劣化表现为寄生电容的类似故障或劣化。在正常工作条件下，光电导光电二极管通过在其阴极处产生光电流信号来响应来自靶的入射光子。处理器处理来自一个或多个光电二极管的信号以评估目标的特性。为了执行BIT，在光电二极管的阳极处施加时变电压信号。该信号通过寄生电容耦合，以在光电二极管的阳极产生测试电流信号。处理器处理信号以评估寄生电容的健康或特性，从而评估光电二极管。

2. 发明申请

WO2011109089A1 SYSTEM FOR MAINTAINING AN EVEN TEMPERATURE DISTRIBUTION ACROSS A LASER DETECTOR 审中-公开
标题翻译：用于维持激光检测器的温度分布的系统
公开(公告)号：WO2011109089A1
公开(公告)日：2011-09-09
申请号：PCT/US2011/000392
申请日：2011-03-02
申请人： RAYTHEON COMPANY , KRUPPA, Victor, D. , SCHMIDT, Richard, A.
发明人： KRUPPA, Victor, D. , SCHMIDT, Richard, A.
IPC分类号： H01J40/14
CPC分类号： H05K1/0201 , H05K1/0206 , H05K2201/10151 , H05K2203/1115 , H05K2203/165
摘要： Embodiments of a system to maintain an even temperature distribution across a laser detector are generally described herein. In some embodiments, the system includes a multi-layer printed circuit board (PCB) assembly that includes a first layer comprising a thermally-conductive ring provided circumferentially around a thermally-conductive detector region for mounting the laser detector, a second layer comprising a plurality of resistive elements aligned with the thermally-conductive detector region to generate heat, and a fourth layer comprising a thermally-conductive heat-distribution region aligned with the thermally-conductive detector region. A plurality of thermally-conductive vias is provided to couple the thermally-conductive ring of the first layer to the thermally-conductive heat-distribution region of the fourth layer. The thermally-conductive vias transfer heat between the thermally-conductive heat-distribution region and the thermally-conductive ring to provide an even distribution of heat across the laser detector.
摘要翻译：本文一般描述了一种维持激光检测器均匀温度分布的系统的实施例。在一些实施例中，该系统包括多层印刷电路板（PCB）组件，该多层印刷电路板（PCB）组件包括第一层，第一层包括围绕用于安装激光检测器的导热检测器区域周向设置的导热环，第二层包括多个的电阻元件与导热检测器区域对准以产生热量;以及第四层，其包括与导热检测器区域对准的热传导热分布区域。提供多个导热通孔以将第一层的导热环连接到第四层的导热热分布区域。导热通孔在导热热分布区域和导热环之间传递热量，以便在激光检测器上均匀分布热量。

3. 发明公开

EP1011695A1 USE OF NEUROTOXIN THERAPY FOR TREATMENT OF UROLOGIC AND RELATED DISORDERS 失效
标题翻译： NEURO毒素治疗的前列腺疾病治疗中的应用
公开(公告)号：EP1011695A1
公开(公告)日：2000-06-28
申请号：EP98933345.5
申请日：1998-07-15
申请人： University Technology Corporation , Schmidt, Richard A. , Kaula, Norbert F.
发明人： SCHMIDT, Richard, A. , KAULA, Norbert, F.
IPC分类号： A61K35/00
CPC分类号： A61K38/4893 , A61K31/165 , A61K31/529 , A61K38/1703
摘要： The present invention relates to methods for treating neurological-urological conditions. This is accomplished by administration of at least one neurotoxin.

4. 发明授权

EP2564222B1 PHOTOCONDUCTIVE PHOTODIODE BUILT-IN TEST (BIT) 有权
标题翻译：集成测试导光光电二极管
公开(公告)号：EP2564222B1
公开(公告)日：2014-07-16
申请号：EP11709821.0
申请日：2011-02-19
申请人： Raytheon Company
发明人： SCHMIDT, Richard, A. , PERLEY, Mitchell, Q. , KUEHN, Robert, A.
IPC分类号： G01R31/26 , H05B33/08
CPC分类号： G01R31/2635

5. 发明公开

EP2564222A1 PHOTOCONDUCTIVE PHOTODIODE BUILT-IN TEST (BIT) 有权
标题翻译：集成测试导光光电二极管
公开(公告)号：EP2564222A1
公开(公告)日：2013-03-06
申请号：EP11709821.0
申请日：2011-02-19
申请人： Raytheon Company
发明人： SCHMIDT, Richard, A. , PERLEY, Mitchell, Q. , KUEHN, Robert, A.
IPC分类号： G01R31/26 , H05B33/08
CPC分类号： G01R31/2635
摘要： A Built-in Test (BIT) for a photoconductive photodiode is performed using the health or characteristics of the photodiode' s parasitic capacitance as a "proxy" for the health or characteristics of the photodiode itself. A failure or degradation of the photodiode manifests as a similar failure or degradation of the parasitic capacitance. Under normal operating conditions, the photoconductive photodiode responds to incident photons from a target by generating a photocurrent signal at its cathode. A processor processes the signals from one or more photodiodes to evaluate characteristics of the target. To perform the BIT, a time-varying voltage signal is applied at the photodiode's anode. This signal is coupled through the parasitic capacitance to produce a test current signal at the photodiode's anode. The processor processes the signal to evaluate the health or characteristics of the parasitic capacitance and thus the photodiode.

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