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    • 2. 发明申请
    • REDUNDANCY FOR WIDE HIERARCHICAL I/O ORGANIZATIONS
    • 冗长的分层I / O组织
    • WO1998028746A1
    • 1998-07-02
    • PCT/US1997024095
    • 1997-12-22
    • RAMBUS, INC.
    • RAMBUS, INC.STARK, Donald, C.TSERN, Ely, K.
    • G11C07/00
    • G11C29/848
    • In a memory core (Figure 3) a method and apparatus for replacing global I/O lines (56, 58, Figure 3) associated with a defective column in a memory sub-array with global I/O lines not associated with such a defect. To improve yield of a memory device such as a DRAM, the device typically employs spare elements which can replace defective elements. In this invention, to reduce the die area consumed for spare elements, the global I/O line (56, 58, Figure 3) is chosen as the replaceable element. The bit position of a defective global I/O line within a bus of global I/O lines is determined. According to whether a particular column has a defect and for each normal global I/O line with a defective column, the global I/O line is replaced with an adjacent non-defective global I/O line (Figure 5). At the bit position a spare on-defective global I/O line is introduced to complete the bus. The number of defective global I/O lines that may be removed from the bus is the same as the number of spare non-defective I/O lines (40, Figure 3) available to fill in the missing bit positions at the end of the bus.
    • 在存储器核心(图3)中,用于替换与存储器子阵列中与缺陷列相关联的全局I / O线(56,58,图3)的方法和装置,其中全局I / O线与这种缺陷无关 。 为了提高诸如DRAM的存储器件的产量,该器件通常采用可替代有缺陷元件的备用元件。 在本发明中,为了减少备用元件消耗的管芯面积,选择全局I / O管线(56,58,图3)作为可更换元件。 确定全局I / O线总线内缺陷全局I / O线的位位置。 根据特定列是否有缺陷,并且对于具有缺陷列的每个正常全局I / O线,全局I / O线将被替换为相邻的无缺陷全局I / O线(图5)。 在位位置,引入备用缺陷全局I / O线来完成总线。 可以从总线中删除的缺陷全局I / O线的数量与可用于填充末尾的丢失位位置的备用无缺陷I / O线(40,图3)的数量相同 总线。