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1. 发明授权

US07301165B2 Methods and apparatus for inspecting an object 有权
公开(公告)号：US07301165B2
公开(公告)日：2007-11-27
申请号：US11256904
申请日：2005-10-24
申请人： Qingying Hu , Kevin George Harding , Joseph Benjamin Ross , Xiaoping Qian
发明人： Qingying Hu , Kevin George Harding , Joseph Benjamin Ross , Xiaoping Qian
IPC分类号： G01N21/88 , G01N21/86 , G01V8/00
CPC分类号： G01B11/25 , F01D21/003 , F01D25/00 , G01N21/21 , G01N21/55 , G01N21/8806 , G01N21/9515 , G01N2201/0635
摘要： A method for inspecting an object using a structured light measurement system that includes a light source for projecting light onto a surface of the object and an imaging sensor for receiving light reflected from the object. The method includes determining a position of at least one of the light source and the imaging sensor with respect to the object based on at least one of a three-dimensional model of the object and a three-dimensional model of the structured light measurement system.

2. 发明授权

US07302109B2 Method and system for image processing for structured light profiling of a part 失效
标题翻译：用于部件结构光谱分析的图像处理方法和系统
公开(公告)号：US07302109B2
公开(公告)日：2007-11-27
申请号：US10652366
申请日：2003-08-28
申请人： Qingying Hu , Kevin George Harding , Joseph Benjamin Ross , Peter William Lorraine
发明人： Qingying Hu , Kevin George Harding , Joseph Benjamin Ross , Peter William Lorraine
IPC分类号： G06K9/40
CPC分类号： G01B11/25 , G06T7/521
摘要： An image processing method for structured light profiling includes sampling an image of a structured light pattern to obtain an intensity distribution, selecting a number of sets of sampled points from the intensity distribution. Each of the respective sets includes a number of sampled points. The image processing method further includes fitting each of the sets of sampled points to a respective distribution function and filtering the distribution functions to select a representative distribution function for the intensity distribution.
摘要翻译：用于结构化光谱分析的图像处理方法包括对结构化光图案的图像进行采样以获得强度分布，从强度分布中选择多个采样点集合。各组中的每一个包括多个采样点。图像处理方法还包括将采样点集合中的每一个拟合到相应的分布函数，并对分布函数进行滤波以选择用于强度分布的代表性分布函数。

3. 发明授权

US07365862B2 Methods and apparatus for inspecting an object 有权
标题翻译：用于检查物体的方法和装置
公开(公告)号：US07365862B2
公开(公告)日：2008-04-29
申请号：US11257180
申请日：2005-10-24
申请人： Qingying Hu , Kevin George Harding , Joseph Benjamin Ross , Donald Wagner Hamilton
发明人： Qingying Hu , Kevin George Harding , Joseph Benjamin Ross , Donald Wagner Hamilton
IPC分类号： G01B11/00
CPC分类号： G01B11/2513 , F01D5/005 , G01B5/205 , G06T7/521
摘要： A method for generating a mask for use with a light measurement system that includes a light source for projecting light onto an object, and an imaging sensor for receiving light reflected from the object. The method includes determining a profile of the object to be inspected, and generating an electronic mask based on the determined object profile. The electronic mask has an electronic opening having a profile defined to substantially match the determined object profile as viewed from one of the light source and the imaging sensor.
摘要翻译：一种用于生成与包括用于将光投射到物体上的光源的光测量系统一起使用的掩模的方法和用于接收从物体反射的光的成像传感器。该方法包括确定待检查对象的轮廓，以及基于所确定的对象轮廓来生成电子掩模。电子掩模具有电子开口，该电子开口具有被限定为基本上与从光源和成像传感器之一观察的所确定的对象轮廓相匹配的轮廓。

4. 发明申请

US20100296104A1 INSPECTION SYSTEM AND METHOD WITH MULTI-IMAGE PHASE SHIFT ANALYSIS 有权
标题翻译：检测系统和方法与多图像相位移动分析
公开(公告)号：US20100296104A1
公开(公告)日：2010-11-25
申请号：US12469893
申请日：2009-05-21
申请人： Gil Abramovich , Kevin George Harding , Ralph Gerald Isaacs , Guiju Song , Joseph Benjamin Ross , Jianming Zheng
发明人： Gil Abramovich , Kevin George Harding , Ralph Gerald Isaacs , Guiju Song , Joseph Benjamin Ross , Jianming Zheng
IPC分类号： G01B11/24
CPC分类号： G01B11/2527 , G01N21/8806 , G01N2201/0635 , G02B13/22
摘要： An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.
摘要翻译：提供检查系统。检查系统包括光源，光栅，相移单元，成像器和处理器。光源被配置为产生光。光栅处于所生成的光的路径中，并且被配置为在光通过光栅之后产生光栅图像。相移单元被配置为将光栅图像的多个相移图案形成并反射到物体表面上以形成多个投影相移图案。成像器被配置为获得投影的相移图案的图像数据。处理器被配置为从图像数据重建物体表面。还提出了检测方法和移相投影机。

5. 发明授权

US08045181B2 Inspection system and method with multi-image phase shift analysis 有权
标题翻译：多图像相移分析检测系统及方法
公开(公告)号：US08045181B2
公开(公告)日：2011-10-25
申请号：US12469893
申请日：2009-05-21
申请人： Gil Abramovich , Kevin George Harding , Ralph Gerald Isaacs , Guiju Song , Joseph Benjamin Ross , Jianming Zheng
发明人： Gil Abramovich , Kevin George Harding , Ralph Gerald Isaacs , Guiju Song , Joseph Benjamin Ross , Jianming Zheng
IPC分类号： G01B11/24
CPC分类号： G01B11/2527 , G01N21/8806 , G01N2201/0635 , G02B13/22
摘要： An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.
摘要翻译：提供检查系统。检查系统包括光源，光栅，相移单元，成像器和处理器。光源被配置为产生光。光栅处于所生成的光的路径中，并且被配置为在光通过光栅之后产生光栅图像。相移单元被配置为将光栅图像的多个相移图案形成并反射到物体表面上以形成多个投影相移图案。成像器被配置为获得投影的相移图案的图像数据。处理器被配置为从图像数据重建物体表面。还提出了检测方法和移相投影机。

6. 发明授权

US07925075B2 Inspection system and methods with autocompensation for edge break gauging orientation 失效
标题翻译：用于边缘断裂测量方向的自动补偿检测系统和方法
公开(公告)号：US07925075B2
公开(公告)日：2011-04-12
申请号：US11745010
申请日：2007-05-07
申请人： Ming Jia , Guiju Song , Jianming Zheng , Yu Ning , Kevin George Harding , Gil Abramovich , Joseph Benjamin Ross , Ralph Gerald Isaacs
发明人： Ming Jia , Guiju Song , Jianming Zheng , Yu Ning , Kevin George Harding , Gil Abramovich , Joseph Benjamin Ross , Ralph Gerald Isaacs
IPC分类号： G06K9/00 , G06K9/48 , G06C9/00
CPC分类号： G01B11/25 , G01B21/20
摘要： A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.
摘要翻译：提供了一种用于检查零件特征的方法。该方法包括使用传感器获得与特征对应的轮廓，并将轮廓投影到与该特征垂直的补偿平面上，以生成更新轮廓。该方法还包括使用更新的轮廓来减少由传感器的取向引起的测量误差。还提供检查系统。检查系统包括被配置为捕获部件上的特征的条纹图像的传感器。检查系统还包括处理器，其被配置为处理边缘图像以获得特征的初始轮廓并且将初始轮廓投影到垂直于特征的补偿平面上。

7. 发明授权

US07499830B2 Computer-implemented techniques and system for characterizing geometric parameters of an edge break in a machined part 失效
标题翻译：用于表征加工零件边缘断裂几何参数的计算机实现技术和系统
公开(公告)号：US07499830B2
公开(公告)日：2009-03-03
申请号：US11274579
申请日：2005-11-15
申请人： Kevin George Harding , Jianming Zheng , Yongqing Li , Ming Jia , Guiju Song , Joseph Benjamin Ross , Ralph Gerald Isaacs
发明人： Kevin George Harding , Jianming Zheng , Yongqing Li , Ming Jia , Guiju Song , Joseph Benjamin Ross , Ralph Gerald Isaacs
IPC分类号： G06F19/00
CPC分类号： G01B11/255 , G06T7/64 , G06T2207/10028 , G06T2207/30108
摘要： A computer-implemented method, system, and computer program code are provided for characterizing an edge break, e.g., part features and/or geometric discontinuities that could give rise to edge sharpness, as may be encountered in a chamfer, bevel, fillet and other part features. The methodology enables to accurately and consistently determine in a manufacturing setting, for example, any applicable geometric parameter for characterizing the edge break.
摘要翻译：提供了计算机实现的方法，系统和计算机程序代码，用于表征边缘断裂，例如可能产生边缘锐度的部分特征和/或几何不连续性，如在倒角，斜角，圆角和其他零件特征。该方法使得能够在制造设置中准确和一致地确定，例如用于表征边缘断裂的任何适用的几何参数。

8. 发明申请

US20080281543A1 INSPECTION SYSTEM AND METHODS WITH AUTOCOMPENSATION FOR EDGE BREAK GAUGING ORIENTATION 失效
标题翻译：检查系统和方法与自动化的边缘测量方向
公开(公告)号：US20080281543A1
公开(公告)日：2008-11-13
申请号：US11745010
申请日：2007-05-07
申请人： Ming Jia , Guiju Song , Jianming Zheng , Yu Ning , Kevin George Harding , Gil Abramovich , Joseph Benjamin Ross , Ralph Gerald Isaacs
发明人： Ming Jia , Guiju Song , Jianming Zheng , Yu Ning , Kevin George Harding , Gil Abramovich , Joseph Benjamin Ross , Ralph Gerald Isaacs
IPC分类号： G01C25/00 , G01B21/02 , G01B21/16
CPC分类号： G01B11/25 , G01B21/20
摘要： A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.
摘要翻译：提供了一种用于检查零件特征的方法。该方法包括使用传感器获得与特征对应的轮廓，并将轮廓投影到与该特征垂直的补偿平面上，以生成更新轮廓。该方法还包括使用更新的轮廓来减少由传感器的取向引起的测量误差。还提供检查系统。检查系统包括被配置为捕获部件上的特征的条纹图像的传感器。检查系统还包括处理器，其被配置为处理边缘图像以获得特征的初始轮廓并且将初始轮廓投影到垂直于特征的补偿平面上。

9. 发明授权

US07099017B2 Methods and apparatus for measuring flow opening areas 有权
标题翻译：测量流通面积的方法和装置
公开(公告)号：US07099017B2
公开(公告)日：2006-08-29
申请号：US10446295
申请日：2003-05-28
申请人： Kevin George Harding , Francis Howard Little , Joseph Benjamin Ross , Jeffery John Reverman
发明人： Kevin George Harding , Francis Howard Little , Joseph Benjamin Ross , Jeffery John Reverman
IPC分类号： G01B11/24 , G06K9/36
CPC分类号： G01B11/285 , G01B11/24
摘要： A method and apparatus for measuring an opening defined within object using an optical sensor system is provided. The method includes positioning an illumination source adjacent the opening, illuminating a perimeter circumscribing the opening, receiving an image of the illuminated boundary, and calculating an area within the received boundary. The system includes a light source oriented to project a first sheet of light intersected by a first portion of the opening perimeter, the light source projecting a second sheet of light intersected by a second portion of the opening perimeter, a light detector receiving a portion of the sheet of light intersected by the object opening perimeter and reflected toward the light detector, and an image processor communicatively coupled to the light detector, the image processor programmed to sample an image from the detector and programmed determine the dimensions of the object opening from the sampled image.
摘要翻译：提供一种使用光学传感器系统测量在物体内限定的开口的方法和装置。该方法包括将照明源定位在靠近开口处，照亮围绕开口的周边，接收照明边界的图像，以及计算接收边界内的区域。该系统包括一个光源，该光源被定向成投影由开口周边的第一部分相交的第一片光，该光源投射与该开口周边的第二部分相交的第二片光，一光接收器，所述光束被物体开口周边相交并且朝向光检测器反射;以及图像处理器，其通信地耦合到光检测器，所述图像处理器被编程为从所述检测器采样图像，并且被编程以确定所述物体开口的尺寸采样图像。

10. 发明授权

US07898651B2 Methods and apparatus for inspecting an object 有权
标题翻译：用于检查物体的方法和装置
公开(公告)号：US07898651B2
公开(公告)日：2011-03-01
申请号：US11256866
申请日：2005-10-24
申请人： Oingyang Hu , Donald Wagner Hamilton , Kevin George Harding , Joseph Benjamin Ross
发明人： Oingyang Hu , Donald Wagner Hamilton , Kevin George Harding , Joseph Benjamin Ross
IPC分类号： G01N21/00
CPC分类号： G01B11/2513
摘要： A method for inspecting an object includes emitting light from at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device, phase-shifting light emitted from at least one of the LCD device and the LCOS device, projecting the phase-shifted light onto a surface of an object, receiving light reflected from the object surface with an imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.
摘要翻译：一种用于检查物体的方法包括从液晶显示器（LCD）器件和硅晶体（LCOS）器件中的至少一个发射光，从LCD器件和LCOS器件中的至少一个发射的相移光将相移的光投影到物体的表面上，用成像传感器接收从物体表面反射的光，并且分析由成像传感器接收的光，以便于检查物体的至少一部分。

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