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    • 3. 发明申请
    • SYSTEM FOR EMITTING ELECTROMAGNETIC BEAMS, COMPRISING A NETWORK OF ANTENNAE
    • 用于发射电磁波的系统,包含天线网络
    • US20110279320A1
    • 2011-11-17
    • US13145400
    • 2010-01-19
    • Patrick DumonPhilippe GarreauMarc Le GoffLuc Duchesne
    • Patrick DumonPhilippe GarreauMarc Le GoffLuc Duchesne
    • H01Q3/26
    • H01Q3/267H01Q1/288
    • This invention relates to a system for emitting electromagnetic beams, comprising a network of elements for the far-field emission of electromagnetic beams, the signals coming from and/or arriving towards each element weighted by excitation coefficients digitally determined by calculation means. According to the invention, the system comprises: a second separate network of sensors arranged close to the network of radiating elements in order to measure the near field radiated by the elements, means for calculating the far field radiated by the network from the near field actually measured by the sensors, and means for calculating the correction of the excitation coefficients of the elements from the difference between the far field calculated from the measurement of the near field and a pre-determined nominal far field.
    • 本发明涉及一种用于发射电磁波束的系统,包括用于远场发射电磁波束的元件网络,来自和/或到达由由计算装置数字确定的激励系数加权的每个元件的信号。 根据本发明,该系统包括:靠近辐射元件网络布置的传感器的第二分离网络,以便测量由元件辐射的近场,用于计算网络从近场辐射的远场实际上 由传感器测量,以及用于根据从近场的测量计算的远场与预定义的标称远场之间的差计算元件的激励系数的校正的装置。
    • 5. 发明授权
    • System for emitting electromagnetic beams, comprising a network of antennae
    • 用于发射电磁束的系统,包括天线网络
    • US08681046B2
    • 2014-03-25
    • US13145400
    • 2010-01-19
    • Patrick DumonPhilippe GarreauMarc Le GoffLuc Duchesne
    • Patrick DumonPhilippe GarreauMarc Le GoffLuc Duchesne
    • H01Q3/00
    • H01Q3/267H01Q1/288
    • This invention relates to a system for emitting electromagnetic beams, comprising a network of elements for the far-field emission of electromagnetic beams, the signals coming from and/or arriving towards each element weighted by excitation coefficients digitally determined by calculation means. According to the invention, the system comprises: a second separate network of sensors arranged close to the network of radiating elements in order to measure the near field radiated by the elements, means for calculating the far field radiated by the network from the near field actually measured by the sensors, and means for calculating the correction of the excitation coefficients of the elements from the difference between the far field calculated from the measurement of the near field and a pre-determined nominal far field.
    • 本发明涉及一种用于发射电磁波束的系统,包括用于远场发射电磁波束的元件网络,来自和/或到达由由计算装置数字确定的激励系数加权的每个元件的信号。 根据本发明,该系统包括:靠近辐射元件网络布置的传感器的第二分离网络,以便测量由元件辐射的近场,用于计算网络从近场辐射的远场实际上 由传感器测量,以及用于根据从近场的测量计算的远场与预定义的标称远场之间的差计算元件的激励系数的校正的装置。
    • 6. 发明申请
    • DEVICE AND METHOD FOR DETERMINING AT LEAST ONE VALUE ASSOCIATED WITH THE ELECTROMAGNETIC RADIATION OF AN OBJECT BEING TESTED
    • 用于确定与被测对象的电磁辐射相关的至少一个值的装置和方法
    • US20100320996A1
    • 2010-12-23
    • US12735876
    • 2009-02-17
    • Philippe GarreauPer IversenArnaud GandoisLuc Duchesne
    • Philippe GarreauPer IversenArnaud GandoisLuc Duchesne
    • G01R31/02G01R1/06
    • G01R31/001G01R29/0864
    • The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterised in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
    • 本发明涉及一种用于确定被测试对象的电磁辐射的至少一个特性的装置(10)和探测网络(100),其特征在于,其包括用于滑动所述探测网络的装置(200) 100)自身具有探针网络(100)和被测试物体之间的相对偏移,其高于探针网络(100)的间距,以便沿着探针网络的多个相对位置执行测量 (100)和被测对象,并访问被测对象的特定区域; 提供了用于相对于被测试物体定位,调整和对准探针网络(100)以便朝向/接近/贴合到被测试物体上的装置,并且提供了用于机械扫描探针网络周围的装置 或者在被测物体的前面,以便沿球形,圆柱形或平面形状进行测量。
    • 10. 发明授权
    • Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested
    • 用于确定与被测试物体的电磁辐射相关联的至少一个值的装置和方法
    • US09201109B2
    • 2015-12-01
    • US12735876
    • 2009-02-17
    • Philippe GarreauPer IversenArnaud GandoisLuc Duchesne
    • Philippe GarreauPer IversenArnaud GandoisLuc Duchesne
    • G01R31/02G01R31/00G01R29/08
    • G01R31/001G01R29/0864
    • The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
    • 本发明涉及一种用于确定被测试对象的电磁辐射的至少一个特性的装置(10)和探测网络(100),其特征在于,其包括用于滑动所述探测网络的装置(200) 100)自身具有探针网络(100)和被测试物体之间的相对偏移,其高于探针网络(100)的间距,以便沿着探针网络的多个相对位置执行测量 (100)和被测对象,并访问被测对象的特定区域; 提供了用于相对于被测试物体定位,调整和对准探针网络(100)以便朝向/接近/贴合到被测试物体上的装置,并且提供了用于机械扫描探针网络周围的装置 或者在被测物体的前面,以便沿球形,圆柱形或平面形状进行测量。