专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20100320996A1 DEVICE AND METHOD FOR DETERMINING AT LEAST ONE VALUE ASSOCIATED WITH THE ELECTROMAGNETIC RADIATION OF AN OBJECT BEING TESTED 有权
标题翻译：用于确定与被测对象的电磁辐射相关的至少一个值的装置和方法
公开(公告)号：US20100320996A1
公开(公告)日：2010-12-23
申请号：US12735876
申请日：2009-02-17
申请人： Philippe Garreau , Per Iversen , Arnaud Gandois , Luc Duchesne
发明人： Philippe Garreau , Per Iversen , Arnaud Gandois , Luc Duchesne
IPC分类号： G01R31/02 , G01R1/06
CPC分类号： G01R31/001 , G01R29/0864
摘要： The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterised in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
摘要翻译：本发明涉及一种用于确定被测试对象的电磁辐射的至少一个特性的装置（10）和探测网络（100），其特征在于，其包括用于滑动所述探测网络的装置（200） 100）自身具有探针网络（100）和被测试物体之间的相对偏移，其高于探针网络（100）的间距，以便沿着探针网络的多个相对位置执行测量（100）和被测对象，并访问被测对象的特定区域; 提供了用于相对于被测试物体定位，调整和对准探针网络（100）以便朝向/接近/贴合到被测试物体上的装置，并且提供了用于机械扫描探针网络周围的装置或者在被测物体的前面，以便沿球形，圆柱形或平面形状进行测量。

2. 发明申请

US20070018654A1 Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested 有权
标题翻译：用于确定与被测试物体的电磁辐射相关联的至少一个变量的装置和方法
公开(公告)号：US20070018654A1
公开(公告)日：2007-01-25
申请号：US10568378
申请日：2004-08-13
申请人： Philippe Garreau , Luc Duchesne , Per Iversen , Arnaud Gandois
发明人： Philippe Garreau , Luc Duchesne , Per Iversen , Arnaud Gandois
IPC分类号： G01R31/00
CPC分类号： G01R29/0821
摘要： The invention relates to an arrangement for measuring the radiation of an electromagnetic device, said arrangement essentially comprising a support (20) for positioning said device, an arc (10), a network of measuring probes that are distributed over the arc (10), essentially describing a circle which is centred on the support, and means for driving the device in rotation between the support (20) and the arc (10), about a geometrical axis merged into the plane of the arc (10). The inventive arrangement is characterised in that the device support (20) and the arc (10) can also be pivoted about a geometrical axis that is transversal to the plane of the arc (10), the device including means for holding the support (20) and the arc (10) in the selected position after rotation about the second geometrical axis.
摘要翻译：本发明涉及一种用于测量电磁装置的辐射的装置，所述装置基本上包括用于定位所述装置的支撑件（20），电弧（10），分布在电弧（10）上的测量探针网络，基本上描述以支撑为中心的圆，以及用于围绕合并到电弧（10）的平面中的几何轴线在支撑件（20）和电弧（10）之间旋转驱动装置的装置。本发明的装置的特征在于，装置支撑件（20）和电弧（10）也可以围绕横向于电弧（10）的平面的几何轴线枢转，该装置包括用于保持支撑件（20）的装置）和弧（10）在围绕第二几何轴线旋转之后处于选定位置。

3. 发明授权

US09201109B2 Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested 有权
标题翻译：用于确定与被测试物体的电磁辐射相关联的至少一个值的装置和方法
公开(公告)号：US09201109B2
公开(公告)日：2015-12-01
申请号：US12735876
申请日：2009-02-17
申请人： Philippe Garreau , Per Iversen , Arnaud Gandois , Luc Duchesne
发明人： Philippe Garreau , Per Iversen , Arnaud Gandois , Luc Duchesne
IPC分类号： G01R31/02 , G01R31/00 , G01R29/08
CPC分类号： G01R31/001 , G01R29/0864
摘要： The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.
摘要翻译：本发明涉及一种用于确定被测试对象的电磁辐射的至少一个特性的装置（10）和探测网络（100），其特征在于，其包括用于滑动所述探测网络的装置（200） 100）自身具有探针网络（100）和被测试物体之间的相对偏移，其高于探针网络（100）的间距，以便沿着探针网络的多个相对位置执行测量（100）和被测对象，并访问被测对象的特定区域; 提供了用于相对于被测试物体定位，调整和对准探针网络（100）以便朝向/接近/贴合到被测试物体上的装置，并且提供了用于机械扫描探针网络周围的装置或者在被测物体的前面，以便沿球形，圆柱形或平面形状进行测量。

4. 发明授权

US08482294B2 Determination of at least one value associated with the electromagnetic radiation of an object under test 有权
标题翻译：确定与被测物体的电磁辐射有关的至少一个值
公开(公告)号：US08482294B2
公开(公告)日：2013-07-09
申请号：US13001004
申请日：2009-06-23
申请人： Philippe Garreau , Per Iversen , Luc Duchesne , Arnaud Gandois
发明人： Philippe Garreau , Per Iversen , Luc Duchesne , Arnaud Gandois
IPC分类号： H01F27/36
CPC分类号： G01R29/0821
摘要： A device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200). The device includes at least a sliding element (301) to provide for the relative sliding of the object being tested (200) or of the electromagnetic probe network (100), to move the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which is provided a rotation device (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.
摘要翻译：一种用于电磁探针网络（100）和待测物体（200）的相对定位的装置（300）。该装置至少包括滑动元件（301），用于提供被测试物体（200）或电磁探针网络（100）的相对滑动，以移动待测物体（200）或探针网络（100）沿着包括在探针网络（100）的平面中的至少一个滑动方向，并且设置有用于被测试物体（200）和探针网络（100）的相对旋转的旋转装置（320）围绕垂直于滑动方向的主旋转轴。

5. 发明授权

US08093912B2 Microwave device for controlling material 有权
标题翻译：用于控制材料的微波装置
公开(公告)号：US08093912B2
公开(公告)日：2012-01-10
申请号：US12442909
申请日：2007-09-25
申请人： Philippe Garreau , Jérôme Drean , Luc Duchesne , Arnaud Gandois , Ludovic Durand , Virginie Tessier , Per Iversen , Nicolas Robic
发明人： Philippe Garreau , Jérôme Drean , Luc Duchesne , Arnaud Gandois , Ludovic Durand , Virginie Tessier , Per Iversen , Nicolas Robic
IPC分类号： G01R27/04 , A61B5/05 , G06K9/00
CPC分类号： G01N22/02 , G01N9/002
摘要： The invention relates to a device for controlling a material, the device including at least one transmitter for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and one receiver for receiving the electromagnetic signal, wherein the device further includes a first modulator for modulating the electromagnetic signal at a frequency Fm1, the first modulator being arranged, on the signal path, between the transmitter and the material in order to spatially sample the emitted electromagnetic signal; second modulator for modulating the electromagnetic signal at a frequency Fm2, the second modulator being arranged, on the signal path, between the material and the electromagnetic signal receiver in order to spatially sample the electromagnetic signal passed through the material.
摘要翻译：本发明涉及一种用于控制材料的装置，该装置包括至少一个发射器，用于以载波频率Fp发送电磁信号以照射材料和一个用于接收电磁信号的接收器，其中该装置还包括第一调制器以频率Fm1调制电磁信号，第一调制器在信号路径上布置在发射机和材料之间，以便对发射的电磁信号进行空间采样; 用于以频率Fm2调制电磁信号的第二调制器，第二调制器在信号路径上布置在材料和电磁信号接收器之间，以便对通过该材料的电磁信号进行空间采样。

6. 发明申请

US20110121839A1 IMPROVEMENTS IN THE DETERMINATION OF AT LEAST ONE VALUE ASSOCIATED WITH THE ELECTROMAGNETIC RADIATION OF AN OBJECT UNDER TEST 有权
标题翻译：与测试对象的电磁辐射相关的至少一个值的确定的改进
公开(公告)号：US20110121839A1
公开(公告)日：2011-05-26
申请号：US13001004
申请日：2009-06-23
申请人： Arnaud Gandois , Luc Duchesne , Per Iversen , Philippe Garreau
发明人： Arnaud Gandois , Luc Duchesne , Per Iversen , Philippe Garreau
IPC分类号： G01R27/04
CPC分类号： G01R29/0821
摘要： The invention relates to a device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200), wherein said device includes at least a means (301) or the relative sliding of the object being tested (200) and of the electromagnetic probe network (100), capable of moving the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which are provided a means (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.
摘要翻译：本发明涉及一种用于电磁探针网络（100）和被测试物体（200）的相对定位的装置（300），其中所述装置至少包括装置（301）或物体的相对滑动沿着包括在探测网络（100）的平面中的至少一个滑动方向，能够移动被测试对象（200）或探测网络（100）的测试（200）和电磁探测网络（100），以及在其上设置有用于被测物体（200）和探针网（100）围绕垂直于滑动方向的主旋转轴相对旋转的装置（320）。

7. 发明申请

US20100005891A1 MICROWAVE DEVICE FOR CONTROLLING MATERIAL 有权
标题翻译：用于控制材料的微波器件
公开(公告)号：US20100005891A1
公开(公告)日：2010-01-14
申请号：US12442909
申请日：2007-09-25
申请人： Philippe Garreau , Jérôme Drean , Luc Duchesne , Arnaud Gandois , Ludovic Durand , Virginie Tessier , Per Iversen , Nicolas Robic
发明人： Philippe Garreau , Jérôme Drean , Luc Duchesne , Arnaud Gandois , Ludovic Durand , Virginie Tessier , Per Iversen , Nicolas Robic
IPC分类号： G01N22/00
CPC分类号： G01N22/02 , G01N9/002
摘要： The invention relates to a device for controlling a material, said device comprising at least means for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and means for receiving the electromagnetic signal, characterized in that said device further comprises first means for modulating the electromagnetic signal at a frequency Fm1, said modulation means being arranged, on the signal path, between the transmission means and the material in order to spatially sample the emitted electromagnetic signal; second means for modulating the electromagnetic signal at a frequency Fm2, said modulation means being arranged, on the signal path, between the material and the electromagnetic signal reception means in order to spatially sample the electromagnetic signal passed through the material.
摘要翻译：本发明涉及一种用于控制材料的装置，所述装置至少包括用于以载波频率Fp发送电磁信号以照射材料和用于接收电磁信号的装置的装置，其特征在于，所述装置还包括第一装置，用于调制在频率Fm1处的电磁信号，所述调制装置在信号路径上布置在传输装置和材料之间，以便对发射的电磁信号进行空间采样; 用于以频率Fm2调制电磁信号的第二装置，所述调制装置在信号路径上布置在材料和电磁信号接收装置之间，以便对通过该材料的电磁信号进行空间采样。

8. 发明授权

US07466142B2 Anechoic chamber for direct observation of the electromagnetic behavior of a tool 有权
标题翻译：消声室用于直接观察工具的电磁行为
公开(公告)号：US07466142B2
公开(公告)日：2008-12-16
申请号：US10568667
申请日：2004-08-18
申请人： Philippe Garreau , Luc Duchesne , Per Olav Iversen , Arnaud Gandois
发明人： Philippe Garreau , Luc Duchesne , Per Olav Iversen , Arnaud Gandois
IPC分类号： G01R27/28 , H01Q17/00
CPC分类号： G01R29/0821
摘要： An apparatus for studying the electromagnetic behavior of an electromagnetic wave-emitting or electromagnetic wave-receiving tool is provided. An anechoic chamber is configured to receive the tool as well as a person handling the tool. At least one analysis antenna is configured to pick-up the electromagnetic waves emitted from or received by the tool. Signals outputted by the analysis antenna are processed, and a radiation diagram associated with the electromagnetic tool is displayed. The radiation diagram is displayed inside the anechoic chamber so that the person handling the electromagnetic tool observes how the handling of the tool affects its electromagnetic behavior.
摘要翻译：提供一种用于研究电磁波发射或电磁波接收工具的电磁行为的装置。消声室配置为接收工具以及处理该工具的人员。至少一个分析天线被配置为拾取从工具发射或接收的电磁波。处理由分析天线输出的信号，并显示与电磁工具相关联的辐射图。辐射图显示在消声室内，使得处理电磁工具的人员观察到工具的处理如何影响其电磁行为。

9. 发明授权

US07443170B2 Device and method for determining at least one variable associated with the electromagnetic radiation of an object being tested 有权
标题翻译：用于确定与被测试物体的电磁辐射相关联的至少一个变量的装置和方法
公开(公告)号：US07443170B2
公开(公告)日：2008-10-28
申请号：US10568378
申请日：2004-08-13
申请人： Philippe Garreau , Luc Duchesne , Per Olav Iversen , Arnaud Gandois
发明人： Philippe Garreau , Luc Duchesne , Per Olav Iversen , Arnaud Gandois
IPC分类号： G01R31/00
CPC分类号： G01R29/0821
摘要： A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes. The network of probes or the support is pivoted in the plane formed by the network of probes or in the plane parallel to the plane formed by the network of probes about a point located in that plane to vary an angle formed between a given one of the network of probes and the support, and thereby allow measurements to be taken at plural angular positions of the network of probes relative to the test object.
摘要翻译：设备确定从测试对象发射的电磁辐射的至少一个特征。支持接收对象。探针网络沿着大致圆弧分布，并且支撑体设置在由探针网络形成的平面中，或平行于由探针网形成的平面的平面内。探针或支撑体的网络在由探针网络形成的平面中或平行于由探针网形成的平面围绕位于该平面中的点形成的平面中枢转，以改变在给定的一个探头和支架的网络，从而允许在探针网络的相对于被测物体的多个角度位置进行测量。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式