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    • 2. 发明申请
    • PLASMA PROCESSING APPARATUS
    • 等离子体加工设备
    • US20130256129A1
    • 2013-10-03
    • US13876133
    • 2010-12-22
    • Peng ChenMengxin ZhaoGang WeiLiang ZhangBai YangGuilong WuPeijun Ding
    • Peng ChenMengxin ZhaoGang WeiLiang ZhangBai YangGuilong WuPeijun Ding
    • C23C14/35
    • A plasma processing apparatus includes a chamber (20) and a target (25) above the chamber (20). The surface of the target (25) contacts the processing area of the chamber (20). The chamber (20) includes an insulating sub-chamber (21) and a first conductive sub-chamber (22), which are superposed. The first conductive sub-chamber (22) is provided under the insulating sub-chamber (21). The insulating sub-chamber (21) is made of insulating material, and the first conductive sub-chamber (22) is made of metal material. A Faraday shield component (10) which is made of metal material or insulating material electroplated with conductive coatings and includes at least one slit is provided in the insulating sub-chamber (21). An inductance coil (13) surrounds the exterior of the insulating sub-chamber (21). The problem about the wafer contamination due to particles formed on the surface of the coil during the sputtering process can be solved by using the plasma processing apparatus.
    • 等离子体处理装置包括在室(20)上方的室(20)和目标(25)。 靶(25)的表面与腔室(20)的处理区域接触。 所述腔室(20)包括叠置的绝缘子室(21)和第一导电子室(22)。 第一导电子室(22)设置在绝缘子室(21)的下方。 绝缘子室(21)由绝缘材料制成,第一导电子室(22)由金属材料制成。 在绝缘子室(21)中设置由金属材料制成的法拉第屏蔽部件(10)或电镀有导电涂层并且包括至少一个狭缝的绝缘材料。 电感线圈(13)围绕绝缘子室(21)的外部。 通过使用等离子体处理装置可以解决由于在溅射过程中在线圈表面上形成的颗粒导致的晶片污染的问题。
    • 6. 发明授权
    • Solar cell
    • 太阳能电池
    • US08952244B2
    • 2015-02-10
    • US13089321
    • 2011-04-19
    • Yen-Cheng HuPeng ChenShuo-Wei LiangZhen-Cheng Wu
    • Yen-Cheng HuPeng ChenShuo-Wei LiangZhen-Cheng Wu
    • H01L31/00H01L31/0216H01L31/0224H01L31/0352H01L31/068
    • H01L31/02168H01L31/022441H01L31/035209H01L31/035227H01L31/0682Y02E10/547
    • A solar cell includes a semiconductor substrate, a doping layer, a quantum well layer, a first passivation layer, a second passivation layer, a first electrode and a second electrode. The semiconductor substrate has a front surface and a back surface, and the front surface of the semiconductor substrate includes nano-rods. The doping layer covers the surface of the nano-rods. The electrode layers cover the doping layer. The quantum well layer having at least one first doping region and at least one second doping region is disposed on the semiconductor substrate. The quantum well layer includes polycrystalline silicon germanium (Si1-xGex). The first passivation layer and the second passivation layer cover the first and the second doping regions of the quantum well layer, respectively. The first electrode and the second electrode are electrically connected to the first doping region and the second doping region of the quantum well layer, respectively.
    • 太阳能电池包括半导体衬底,掺杂层,量子阱层,第一钝化层,第二钝化层,第一电极和第二电极。 半导体衬底具有前表面和后表面,并且半导体衬底的前表面包括纳米棒。 掺杂层覆盖纳米棒的表面。 电极层覆盖掺杂层。 具有至少一个第一掺杂区域和至少一个第二掺杂区域的量子阱层设置在半导体衬底上。 量子阱层包括多晶硅锗(Si1-xGex)。 第一钝化层和第二钝化层分别覆盖量子阱层的第一和第二掺杂区域。 第一电极和第二电极分别电连接到量子阱层的第一掺杂区域和第二掺杂区域。
    • 8. 发明授权
    • Electrical parameter detection device for peripheral component interconnect devices
    • 用于外围组件互连设备的电气参数检测装置
    • US08872521B2
    • 2014-10-28
    • US13424394
    • 2012-03-20
    • Ya-Jun PanQi-Yan LuoPeng ChenSong-Lin Tong
    • Ya-Jun PanQi-Yan LuoPeng ChenSong-Lin Tong
    • G06F11/22
    • G06F11/221
    • An electrical parameter detection device is configured for detecting electrical parameters of a peripheral component interconnect (PCI) connector including a plurality of power pins. The electrical parameter detection device includes a processor module, a first detection module, and a second detection module. The processor module continuously detects voltage values of electric potentials provided by each of the power pins of the PCI connector using the first detection module, and determines time sequences of the electric potentials according to the voltage values of the electric potentials. Furthermore, the processor module detects the amount of power provided by each of the power pins of the PCI connector using the second detection module.
    • 电参数检测装置被配置为检测包括多个电源引脚的外围组件互连(PCI)连接器的电参数。 电参数检测装置包括处理器模块,第一检测模块和第二检测模块。 处理器模块使用第一检测模块连续地检测由PCI连接器的每个电源引脚提供的电位的电压值,并且根据电位的电压值确定电位的时间序列。 此外,处理器模块使用第二检测模块检测由PCI连接器的每个电源引脚提供的电力量。
    • 9. 发明授权
    • Overcurrent protection device
    • 过电流保护装置
    • US08854782B2
    • 2014-10-07
    • US13086405
    • 2011-04-14
    • Qi-Yan LuoSong-Lin TongPeng Chen
    • Qi-Yan LuoSong-Lin TongPeng Chen
    • H02H9/02H02H3/087G06F1/28
    • H02H3/087G06F1/28
    • An overcurrent protection device includes a power input terminal, a power output terminal, a first signal terminal, a second signal terminal, a testing circuit, and a switch element. The power input terminal and the first signal terminal are connected to a power supply. The power output terminal and the second signal terminal are connected to a computer motherboard. If the first and second terminals are disconnected from each other when the computer motherboard works, the power supply stops working. The testing circuit includes a fixed resistor and a control chip parallel connected between the power input and output terminal. The control chip stores a predetermined voltage threshold, and detects voltage between the two terminals of the fixed resistor, and compares the measured voltage with the predetermined voltage threshold. The switch element disconnects the first and second signal terminals when the measured voltage is greater than the predetermined voltage threshold.
    • 过电流保护装置包括电源输入端子,电力输出端子,第一信号端子,第二信号端子,测试电路和开关元件。 电源输入端子和第一信号端子连接到电源。 电源输出端子和第二信号端子连接到计算机主板。 当计算机主板工作时,如果第一和第二端子彼此断开,则电源停止工作。 测试电路包括一个固定电阻和一个并联在电源输入和输出端之间的控制芯片。 控制芯片存储预定电压阈值,并且检测固定电阻器的两个端子之间的电压,并将测量的电压与预定电压阈值进行比较。 当测量的电压大于预定电压阈值时,开关元件断开第一和第二信号端子。
    • 10. 发明授权
    • Detection device
    • 检测装置
    • US08700817B2
    • 2014-04-15
    • US13329224
    • 2011-12-17
    • Peng ChenQi-Yan LuoSong-Lin Tong
    • Peng ChenQi-Yan LuoSong-Lin Tong
    • G06F3/00
    • G06F1/28
    • A detection device to detect a power serving time of a super capacitor for a power-disconnected storage card and an amount of the data packets capable of being stored during the detected serving time is provided. The power-disconnected storage card includes a memory. The detection device includes a power supply unit, the super capacitor, a controller, a storage unit, and a detection unit. The storage unit stores the data packets. The detection unit includes a charge notification module, a data notification module and a time module. The charge notification module generates a first notification signal to the time module. The data notification module generates a second notification signal to the time module when the storage unit transmits the data packet to the memory. The time module records time when the memory completely store the data packet according to the first notification signal and the second notification signal.
    • 提供了检测用于断电存储卡的超级电容器的功率服务时间的检测装置以及在检测到的服务时间期间能够存储的数据分组的量。 电源断开的存储卡包括一个存储器。 检测装置包括电源单元,超级电容器,控制器,存储单元和检测单元。 存储单元存储数据分组。 检测单元包括充电通知模块,数据通知模块和时间模块。 收费通知模块向时间模块生成第一通知信号。 当存储单元将数据包发送到存储器时,数据通知模块生成第二通知信号给时间模块。 时间模块记录存储器根据第一通知信号和第二通知信号完全存储数据包的时间。