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    • 2. 发明授权
    • Reducing reflection at termination of optical fiber in a small volume
    • 减少光纤终端反射,体积小
    • US08842963B2
    • 2014-09-23
    • US13222577
    • 2011-08-31
    • Paul F. WysockiAlan HeaneyStephen KregerMark FroggattKen Walker
    • Paul F. WysockiAlan HeaneyStephen KregerMark FroggattKen Walker
    • G02B6/00
    • G02B6/243
    • A method and structure for terminating an optical fiber are disclosed that provide an optical fiber termination structure with a small volume and very low return loss, even when the termination is in close proximity to reflective surfaces. In one example embodiment, the optical fiber termination reduces reflections into the one or more cores to a return loss of −70 dB or less regardless of the presence of surfaces proximate the optical fiber termination. At the same time, a length of the optical fiber termination is less than 5 mm and a largest transverse dimension of the optical fiber termination is less than 325 um. The optical fiber termination is useful in fiber sensing applications in general and is particularly effective for terminating a multi-core fiber used in a distributed shape sensing application.
    • 公开了用于端接光纤的方法和结构,其提供具有小体积和非常低的回波损耗的光纤终端结构,即使当终端紧靠反射表面时。 在一个示例实施例中,光纤终端将反射到一个或多个核心中,使得接近光纤终端的表面的存在而减小到-70dB或更小的回波损耗。 同时,光纤终端的长度小于5mm,光纤终端的最大横向尺寸小于325μm。 光纤终端通常在光纤传感应用中是有用的,并且对于终止分布形状感测应用中使用的多芯光纤是特别有效的。
    • 5. 发明授权
    • Method and apparatus for calibrating measurement equipment
    • 用于校准测量设备的方法和设备
    • US07633607B2
    • 2009-12-15
    • US10570257
    • 2004-09-01
    • Mark Froggatt
    • Mark Froggatt
    • G01N21/00
    • G01N21/274G01N21/21
    • Measurement equipment may be calibrated using two different calibration paths. An initial calibration is performed using a calibration path in which an optical element may be coupled for testing after the initial calibration. Once the initial calibration has been performed and the optical element operatively-connected in the main path for testing, one or more re-calibrations occur using another calibration path. The optical element being tested need not be de-coupled during the re-calibration. Each calibration operation produces error correction matrices which are used to correct the measurement matrix generated by the test equipment for the optical element being tested.
    • 可以使用两个不同的校准路径校准测量设备。 使用其中可以耦合光学元件以在初始校准之后进行测试的校准路径来执行初始校准。 一旦执行了初始校准,并且光学元件在主路径中可操作地连接用于测试,则使用另一个校准路径进行一次或多次重新校准。 被测试的光学元件在重新校准期间不需要去耦合。 每个校准操作产生误差校正矩阵,其用于校正由被测试的光学元件的测试设备产生的测量矩阵。
    • 6. 发明申请
    • Method and apparatus for calibrating measurement equipment
    • 用于校准测量设备的方法和设备
    • US20070171399A1
    • 2007-07-26
    • US10570257
    • 2004-09-01
    • Mark Froggatt
    • Mark Froggatt
    • G01N21/00
    • G01N21/274G01N21/21
    • Measurement equipment may be calibrated using two different calibration paths. An initial calibration is performed using a calibration path in which an optical element may be coupled for testing after the initial calibration. Once the initial calibration has been performed and the optical element operatively-connected in the main path for testing, one or more re-calibrations occur using another calibration path. The optical element being tested need not be de-coupled during the re-calibration. Each calibration operation produces error correction matrices which are used to correct the measurement matrix generated by the test equipment for the optical element being tested.
    • 可以使用两个不同的校准路径校准测量设备。 使用其中可以耦合光学元件以在初始校准之后进行测试的校准路径来执行初始校准。 一旦执行了初始校准,并且光学元件在主路径中可操作地连接用于测试,则使用另一个校准路径进行一次或多次重新校准。 被测试的光学元件在重新校准期间不需要去耦合。 每个校准操作产生误差校正矩阵,其用于校正由被测试的光学元件的测试设备产生的测量矩阵。
    • 10. 发明授权
    • Compensating for time varying phase changes in interferometric measurements
    • 补偿干涉测量中的时变相位变化
    • US07948633B2
    • 2011-05-24
    • US12805879
    • 2010-08-23
    • Mark FroggattDawn K. Gifford
    • Mark FroggattDawn K. Gifford
    • G01B9/02
    • G01M11/3172G01M11/083
    • An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data.
    • 对被测光学器件(DUT)进行干涉测量。 DUT可以包括光纤,光学部件或光学系统中的一个或多个。 对于DUT的第一路径获得DUT的第一干涉图案数据,并且获得用于DUT的第二干涉图案数据用于到DUT的第二更长的路径。 由于该长度较长,所以第二干涉图案数据在时间上与第一干涉图案数据相比延迟。 然后从第一和第二干涉图案数据识别DUT干涉图案数据的时变分量。 所识别的时变分量用于修改第一或第二干涉图案数据以补偿由振动等引起的时变相位。然后可以基于经修改的干涉图案数据来确定DUT的一个或多个光学特性 。