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    • 3. 发明授权
    • Compensating for time varying phase changes in interferometric measurements
    • 补偿干涉测量中的时变相位变化
    • US07948633B2
    • 2011-05-24
    • US12805879
    • 2010-08-23
    • Mark FroggattDawn K. Gifford
    • Mark FroggattDawn K. Gifford
    • G01B9/02
    • G01M11/3172G01M11/083
    • An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data.
    • 对被测光学器件(DUT)进行干涉测量。 DUT可以包括光纤,光学部件或光学系统中的一个或多个。 对于DUT的第一路径获得DUT的第一干涉图案数据,并且获得用于DUT的第二干涉图案数据用于到DUT的第二更长的路径。 由于该长度较长,所以第二干涉图案数据在时间上与第一干涉图案数据相比延迟。 然后从第一和第二干涉图案数据识别DUT干涉图案数据的时变分量。 所识别的时变分量用于修改第一或第二干涉图案数据以补偿由振动等引起的时变相位。然后可以基于经修改的干涉图案数据来确定DUT的一个或多个光学特性 。
    • 4. 发明申请
    • Compensating for time varying phase changes in interferometric measurements
    • 补偿干涉测量中的时变相位变化
    • US20100321702A1
    • 2010-12-23
    • US12805879
    • 2010-08-23
    • Mark FroggattDawn K. Gifford
    • Mark FroggattDawn K. Gifford
    • G01B9/02
    • G01M11/3172G01M11/083
    • An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data.
    • 对被测光学器件(DUT)进行干涉测量。 DUT可以包括光纤,光学部件或光学系统中的一个或多个。 对于DUT的第一路径获得DUT的第一干涉图案数据,并且获得用于DUT的第二干涉图案数据用于到DUT的第二更长的路径。 由于该长度较长,所以第二干涉图案数据在时间上与第一干涉图案数据相比延迟。 然后从第一和第二干涉图案数据识别DUT干涉图案数据的时变分量。 所识别的时变分量用于修改第一或第二干涉图案数据以补偿由振动等引起的时变相位。然后可以基于经修改的干涉图案数据来确定DUT的一个或多个光学特性 。
    • 5. 发明申请
    • Compensating for Time Varying Phase Changes in Interferometric Measurements
    • 补偿干涉测量中的时间变化相位变化
    • US20090103100A1
    • 2009-04-23
    • US11792082
    • 2005-12-13
    • Mark FroggattDawn K. Gifford
    • Mark FroggattDawn K. Gifford
    • G01B9/02
    • G01M11/3172G01M11/083
    • An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data.
    • 对被测光学器件(DUT)进行干涉测量。 DUT可以包括光纤,光学部件或光学系统中的一个或多个。 对于DUT的第一路径获得DUT的第一干涉图案数据,并且获得用于DUT的第二干涉图案数据用于到DUT的第二更长的路径。 由于该长度较长,所以第二干涉图案数据在时间上与第一干涉图案数据相比延迟。 然后从第一和第二干涉图案数据识别DUT干涉图案数据的时变分量。 所识别的时变分量用于修改第一或第二干涉图案数据以补偿由振动等引起的时变相位。然后可以基于经修改的干涉图案数据来确定DUT的一个或多个光学特性 。
    • 7. 发明授权
    • Compensating for non-ideal multi-core optical fiber structure
    • 补偿非理想多芯光纤结构
    • US08531655B2
    • 2013-09-10
    • US13233577
    • 2011-09-15
    • Justin W. KleinMark E. FroggattStephen T. KregerDawn K. GiffordSandra M. Klute
    • Justin W. KleinMark E. FroggattStephen T. KregerDawn K. GiffordSandra M. Klute
    • G01N21/00G01B9/02
    • G01B11/161G01B9/02023G01B11/18G01B21/042G01B21/045G02B6/02042
    • An interferometric measurement system includes a spun optical fiber including multiple optical waveguides configured in the fiber. Interferometric detection circuitry detects measurement interferometric pattern data associated with each of the multiple optical waveguides when the optical fiber is placed into a bend. Data processing circuitry determines compensation parameters that compensate for variations between an optimal configuration of the multiple optical waveguides in the fiber and an actual configuration of multiple optical waveguides in the fiber. The compensation parameters are stored in memory for compensating subsequently-obtained measurement interferometric pattern data for the fiber. The compensation parameters are applied to the subsequently-obtained measurement interferometric pattern data in order to distinguish between axial strain, bend strain, and twist strain on the fiber and to accurately determine one or more strain values for the fiber corresponding to one or more of the axial strain, bend strain, or twist strain on the fiber.
    • 干涉测量系统包括在光纤中配置的包括多个光波导的纺丝光纤。 当光纤放入弯曲部时,干涉测量电路检测与多个光波导中的每一个相关联的测量干涉图案数据。 数据处理电路确定补偿参数,其补偿光纤中多个光波导的最佳配置与光纤中多个光波导的实际配置之间的变化。 补偿参数存储在存储器中,用于补偿随后获得的用于光纤的测量干涉图案数据。 将补偿参数应用于随后获得的测量干涉图案数据,以便区分光纤上的轴向应变,弯曲应变和扭曲应变,并且准确地确定对应于一个或多个的纤维的纤维的一个或多个应变值 轴向应变,弯曲应变或纤维上的扭曲应变。
    • 8. 发明申请
    • STRAIN SENSING WITH OPTICAL FIBER ROSETTES
    • 光纤光缆的应变感应
    • US20110247427A1
    • 2011-10-13
    • US13081056
    • 2011-04-06
    • Mark E. FROGGATTDawn K. Gifford
    • Mark E. FROGGATTDawn K. Gifford
    • G01L1/24
    • G01L1/246G01D5/35306G01K11/3206
    • One or more mechanical parameters of a structure subjected to a force or condition are measured using distributed, optical fiber sensing technology. At least a curved portion an optical fiber having is attached to an object. A distributed, optically-based, strain sensing technique is used to determine strain information associated with multiple points along the curved portion of the fiber. The determined strain information is processed to generate one or more representations of one or more of the following: an expansion of the object, a thermal gradient associated with the object, or a stress-induced strain at multiple locations on the object corresponding to ones of the multiple points. An output is generated corresponding to the representation.
    • 使用分布式光纤传感技术测量受到力或条件的结构的一个或多个机械参数。 至少具有附接到物体的光纤的弯曲部分。 使用分布式,基于光学的应变感测技术来确定与沿着光纤的弯曲部分的多个点相关联的应变信息。 所确定的应变信息被处理以产生以下中的一个或多个的一个或多个表示:对象的扩展,与对象相关联的热梯度,或对象上的多个位置处的应力诱发应变 多点。 生成对应于表示的输出。
    • 9. 发明授权
    • Strain sensing with optical fiber rosettes
    • 带光纤花环的应变传感
    • US08714026B2
    • 2014-05-06
    • US13081056
    • 2011-04-06
    • Mark E. FroggattDawn K. Gifford
    • Mark E. FroggattDawn K. Gifford
    • G01L1/24
    • G01L1/246G01D5/35306G01K11/3206
    • One or more mechanical parameters of a structure subjected to a force or condition are measured using distributed, optical fiber sensing technology. At least a curved portion an optical fiber having is attached to an object. A distributed, optically-based, strain sensing technique is used to determine strain information associated with multiple points along the curved portion of the fiber. The determined strain information is processed to generate one or more representations of one or more of the following: an expansion of the object, a thermal gradient associated with the object, or a stress-induced strain at multiple locations on the object corresponding to ones of the multiple points. An output is generated corresponding to the representation.
    • 使用分布式光纤传感技术测量受到力或条件的结构的一个或多个机械参数。 至少具有附接到物体的光纤的弯曲部分。 使用分布式,基于光学的应变感测技术来确定与沿着光纤的弯曲部分的多个点相关联的应变信息。 所确定的应变信息被处理以产生以下中的一个或多个的一个或多个表示:对象的扩展,与对象相关联的热梯度,或对象上的多个位置处的应力诱发应变 多点。 生成对应于表示的输出。