专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US06281692B1 Interposer for maintaining temporary contact between a substrate and a test bed 失效
标题翻译：用于保持基板和试验台之间的临时接触的插入件
公开(公告)号：US06281692B1
公开(公告)日：2001-08-28
申请号：US09166468
申请日：1998-10-05
申请人： Paul F. Bodenweber , Ralph R. Comulada , Mukta S. Farooq , Charles J. Hendricks , Philo B. Hodge , Vincent P. Peterson , Terence W. Spoor , Kathleen M. Wiley , Yuet-Ying Yu
发明人： Paul F. Bodenweber , Ralph R. Comulada , Mukta S. Farooq , Charles J. Hendricks , Philo B. Hodge , Vincent P. Peterson , Terence W. Spoor , Kathleen M. Wiley , Yuet-Ying Yu
IPC分类号： G01R3102
CPC分类号： G01R1/07378
摘要： Disclosed is an interposer and test structure for making contact between a substrate and a test bed. One embodiment of the interposer has a floating, rigid conductive element in a nonconductive body which makes temporary contact between the test bed and the substrate. In another embodiment of the invention, the interposer includes two layers of material, in which one layer includes pogo pins for contacting the substrate and the other layer includes pads for contacting the test bed. The pogo pins are on a grid spacing corresponding to that of the substrate input/output pads while the interposer pads are on a grid spacing corresponding to that of the pogo pin contactors of the test bed.
摘要翻译：公开了一种用于在基板和试验台之间进行接触的插入件和测试结构。插入器的一个实施例在非导体中具有浮动的刚性导电元件，其使得测试台与基板之间暂时接触。在本发明的另一个实施例中，插入件包括两层材料，其中一层包括用于接触衬底的弹簧针，另一层包括用于接触测试台的衬垫。弹簧针位于与衬底输入/输出焊盘相对应的栅格间隔上，而插入垫位于对应于测试台的弹簧针接触器的栅格间隔上。

2. 发明授权

US5600883A Method of tip formation for spring probe with piloted and headed contact 失效
标题翻译：具有导向和头部接触的弹簧探头的尖端形成方法
公开(公告)号：US5600883A
公开(公告)日：1997-02-11
申请号：US461899
申请日：1995-06-05
申请人： Louis H. Faure , Terence W. Spoor
发明人： Louis H. Faure , Terence W. Spoor
IPC分类号： G01R1/067 , G01R1/073 , H01R43/00
CPC分类号： G01R1/06711 , G01R1/07314 , G01R1/06722 , Y10T29/49117 , Y10T29/49155
摘要： Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like. A method of forming a probe tip on an array of test probes in a support member of a test apparatus includes inserting a plurality of probes into an array of probe cylinders in the member with the ends of the probes extending below the ends of the cylinders, the probes being retained by fixturing means at a predetermined position in the cylinders, the ends of the probes are planarized to provide a smooth surface of the member with the probes flush therewith, apply a layer of resist to the lower surface of the member covering the guide plate and the newly planarized lower ends of the probes, after the resist has been exposed to a pattern through a high precision mask, a set of rings at the base of the planarized probes is formed in the resist by etching the tips through the resist, and then remove the fixturing means.
摘要翻译：在测试设备中测试探头以单一结构支撑，以提供测试中探针支撑的刚性。弹簧探针在远端处具有与探针末端相接触的头部，并具有一组防旋转突片，锁定在探针引导件中的协作防旋转槽中。接触头在其尖端处具有锥形导向件，其与镀金接触弹簧接合。通过焊接或激光焊接等机械接合或接合，内径与飞行员一体地接触。在测试装置的支撑构件中在测试探针阵列上形成探针尖端的方法包括将多个探针插入到构件中的探针圆柱体的阵列中，其中探针的端部延伸到气缸的端部下方，探针被固定装置保持在气缸中的预定位置处，探针的端部被平坦化以提供构件的光滑表面，探针与其齐平，向覆盖构件的构件的下表面施加一层抗蚀剂引导板和探针的新平面化下端，在抗蚀剂通过高精度掩模暴露于图案之后，通过蚀刻尖端通过抗蚀剂在抗蚀剂中形成在平面化探针的基部的一组环，然后取下固定装置。

3. 发明授权

US5521519A Spring probe with piloted and headed contact and method of tip formation 失效
标题翻译：弹簧探头具有先导和头部接触以及尖端形成方法
公开(公告)号：US5521519A
公开(公告)日：1996-05-28
申请号：US175336
申请日：1993-12-29
申请人： Louis H. Faure , Terence W. Spoor
发明人： Louis H. Faure , Terence W. Spoor
IPC分类号： G01R1/067 , G01R1/073 , G01R1/02
CPC分类号： G01R1/06711 , G01R1/07314 , G01R1/06722 , Y10T29/49117 , Y10T29/49155
摘要： Testing probes in a testing apparatus are supported in a unitary structure to provide rigidity of the supports for the probes in testing. The spring probes have a contact head at the distal end from the probe tip with a set of antirotation tabs which lock in a cooperating antirotation slot in the probe guide. The contact head has a cone-shaped pilot at its tip which is engaged with a gold-plated contact spring. The inner diameter is integrally in contact with the pilot by mechanical engagement or bonding by soldering or laser welding or the like. A method of forming a probe tip on an array of test probes in a support member of a test apparatus includes inserting a plurality of probes into an array of probe cylinders in the member with the ends of the probes extending below the ends of the cylinders, the probes being retained by fixturing means at a predetermined position in the cylinders, the ends of the probes are planarized to provide a smooth surface of the member with the probes flush therewith, apply a layer of resist to the lower surface of the member covering the guide plate and the newly planarized lower ends of the probes, after the resist has been exposed to a pattern through a high precision mask, a set of rings at the base of the planarized probes is formed in the resist by etching the tips through the resist, and then remove the fixturing means.
摘要翻译：在测试设备中测试探头以单一结构支撑，以提供测试中探针支撑的刚性。弹簧探针在远端处具有与探针末端相接触的头部，并具有一组防旋转突片，锁定在探针引导件中的协作防旋转槽中。接触头在其尖端处具有锥形导向件，其与镀金接触弹簧接合。通过焊接或激光焊接等机械接合或接合，内径与飞行员一体地接触。在测试装置的支撑构件中在测试探针阵列上形成探针尖端的方法包括将多个探针插入到构件中的探针圆柱体的阵列中，其中探针的端部延伸到气缸的端部下方，探针被固定装置保持在气缸中的预定位置处，探针的端部被平坦化以提供构件的光滑表面，探针与其齐平，向覆盖构件的构件的下表面施加一层抗蚀剂引导板和探针的新平面化下端，在抗蚀剂通过高精度掩模暴露于图案之后，通过蚀刻尖端通过抗蚀剂在抗蚀剂中形成在平面化探针的基部的一组环，然后取下固定装置。

4. 发明授权

US5493864A Apparatus for cooling or heating liquids and method of using same 失效
标题翻译：用于冷却或加热液体的设备及其使用方法
公开(公告)号：US5493864A
公开(公告)日：1996-02-27
申请号：US259783
申请日：1994-06-14
申请人： Andrew T. S. Pomerene , Terence W. Spoor , Robert R. DeVenuto , Anthony V. DiStefano
发明人： Andrew T. S. Pomerene , Terence W. Spoor , Robert R. DeVenuto , Anthony V. DiStefano
IPC分类号： B67D3/00 , F25B21/04 , H01L35/30 , F25B21/02 , B67D5/62 , F28F13/00
CPC分类号： F25B21/04 , B67D3/0009 , B67D3/0022 , H01L35/30
摘要： A manifold design which provides for highly efficient cooling or heating of flowing liquids using a small number of thermoelectric elements is constructed of a thermally insulting material. On exterior surface of at least two sides of the manifold, open channel are formed for use in defining a liquid flow path. On the interior of the manifold there are a plurality of internal chambers, one internal chamber for each side having an exterior channel. These internal chambers are essentially equal in size and are preferably symmetrically disposed within the manifold in alignment with the sides. The channels on the outside of the manifold and the chambers on the inside of the manifold are connected in such a way that liquid would flow in an alternating series of channel and chamber in a single liquid flow path through the manifold. The channels on the exterior of the manifold are sealed by placing a thermally conductive cover plate over each side of the manifold. A thermoelectric device is then placed on the outside of each cover plate. Finally, means for transferring heat to or from the exterior surfaces of the thermoelectric devices provided.
摘要翻译：使用热绝缘材料构成了使用少量热电元件提供流动液体的高效冷却或加热的歧管设计。在歧管的至少两侧的外表面上，形成开口通道以用于限定液体流路。在歧管的内部有多个内部腔室，每个侧面的一个内部腔室具有外部通道。这些内部室的尺寸基本上相等，并且优选地对称地设置在歧管内与侧面对齐。歧管外侧的通道和歧管内部的腔室以这样的方式连接，使得液体将在通过歧管的单个液体流动路径中的交替的通道和腔室中流动。通过在歧管的每一侧上放置导热盖板来密封歧管外部的通道。然后将热电装置放置在每个盖板的外侧。最后，提供用于将热量传递到所提供的热电装置的外表面的装置。

5. 发明授权

US5367254A Test probe assembly using buckling wire probes within tubes having opposed overlapping slots 失效
标题翻译：在具有相对重叠槽的管内使用弯曲线探针测试探头组件
公开(公告)号：US5367254A
公开(公告)日：1994-11-22
申请号：US11556
申请日：1993-02-01
申请人： Louis H. Faure , Terence W. Spoor
发明人： Louis H. Faure , Terence W. Spoor
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07357
摘要： A test probe assembly is disclosed having bucking beam displacement test probe units which are easily replaceable. Each test probe unit includes a wire and a slotted tube containing the wire,one end of the wire being attached to one end of the tube and the other end of the wire protruding from the other end of the tube. The wire slidably engages an inner diameter of the tube. Each tube is slotted at a plurality of locations along the longitudinal axis thereof to provide spaces for the buckling beam displacement of the respective wire when the protruding end of the wire is brought to bear against a device point to be tested. The slots are staggered so that adjacent ones are disposed radially opposite to each other with some overlap along the longitudinal axis of the tube. The test probe units are inserted in predetermined respective holes of an apertured block of insulating material in accordance with a pattern of device points to be tested.
摘要翻译：公开了一种测试探针组件，其具有容易替换的屈曲梁位移测试探针单元。每个测试探针单元包括线和包含线的开槽管，线的一端附接到管的一端，并且线的另一端从管的另一端突出。线可滑动地接合管的内径。每个管沿着其纵向轴线在多个位置开槽，以在电线的突出端抵抗要测试的装置点时提供用于相应电线的屈曲梁位移的空间。狭槽交错，使得相邻的槽沿着管的纵向轴线以一定重叠的方式彼此径向相对设置。根据要测试的装置点的图案，将测试探针单元插入到具有多孔绝缘材料块的预定的相应孔中。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式