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    • 2. 发明授权
    • Preventing dosage drift with duplicate dose integrators
    • 用重复剂量积分器预防剂量漂移
    • US07518129B2
    • 2009-04-14
    • US11416874
    • 2006-05-03
    • Jih-Hwa WangOtto ChenFang-Chi ChienTung-Li LeePu-Fang Chen
    • Jih-Hwa WangOtto ChenFang-Chi ChienTung-Li LeePu-Fang Chen
    • G21K5/00
    • H01J37/3171H01J37/304H01J2237/30433H01J2237/30455H01J2237/31703
    • A method for identifying a drifted dose integrator in an implantation system and an implantation system are provided. The implantation system includes a first dose integrator and a second dose integrator. The first dose integrator includes a first input configured to receive a first current generated from charges carried by implanted ions in a wafer, and a first output configured to output a first accumulated dosage value. The second dose integrator includes a second dose integrator including a second input configured to receive a second current generated from the charges carried by the implanted ions in the wafer, and a second output configured to output a second accumulated dosage value. The implantation system further includes a processing unit comparing the first accumulated dosage value and the second accumulated dosage value to detect a drift in one of the first and the second dose integrators.
    • 提供了一种用于在植入系统和植入系统中识别漂移剂量积分器的方法。 植入系统包括第一剂量积分器和第二剂量积分器。 第一剂量积分器包括被配置为接收由晶片中的注入离子携带的电荷产生的第一电流的第一输入和被配置为输出第一累积剂量值的第一输出。 所述第二剂量积分器包括第二剂量积分器,所述第二剂量积分器包括被配置为接收从由所述晶片中的所述注入离子携带的电荷产生的第二电流的第二输入,以及被配置为输出第二累积剂量值的第二输出。 植入系统还包括处理单元,比较第一累积剂量值和第二累积剂量值,以检测第一和第二剂量积分器之一中的漂移。
    • 3. 发明申请
    • Preventing dosage drift with duplicate dose integrators
    • 用重复剂量积分器预防剂量漂移
    • US20070257210A1
    • 2007-11-08
    • US11416874
    • 2006-05-03
    • Jih-Hwa WangOtto ChenFang-Chi ChienTung-Li LeePu-Fang Chen
    • Jih-Hwa WangOtto ChenFang-Chi ChienTung-Li LeePu-Fang Chen
    • H01J37/317
    • H01J37/3171H01J37/304H01J2237/30433H01J2237/30455H01J2237/31703
    • A method for identifying a drifted dose integrator in an implantation system and an implantation system are provided. The implantation system includes a first dose integrator and a second dose integrator. The first dose integrator includes a first input configured to receive a first current generated from charges carried by implanted ions in a wafer, and a first output configured to output a first accumulated dosage value. The second dose integrator includes a second dose integrator including a second input configured to receive a second current generated from the charges carried by the implanted ions in the wafer, and a second output configured to output a second accumulated dosage value. The implantation system further includes a processing unit comparing the first accumulated dosage value and the second accumulated dosage value to detect a drift in one of the first and the second dose integrators.
    • 提供了一种用于在植入系统和植入系统中识别漂移剂量积分器的方法。 植入系统包括第一剂量积分器和第二剂量积分器。 第一剂量积分器包括被配置为接收由晶片中的注入离子携带的电荷产生的第一电流的第一输入和被配置为输出第一累积剂量值的第一输出。 所述第二剂量积分器包括第二剂量积分器,所述第二剂量积分器包括被配置为接收从由所述晶片中的所述注入离子携带的电荷产生的第二电流的第二输入,以及被配置为输出第二累积剂量值的第二输出。 植入系统还包括处理单元,比较第一累积剂量值和第二累积剂量值,以检测第一和第二剂量积分器之一中的漂移。