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    • 5. 发明授权
    • Semiconductor photodetector and optical transmitting device
    • 半导体光电检测器和光发射装置
    • US06822271B2
    • 2004-11-23
    • US09485852
    • 2000-02-17
    • Toshiyuki MogiKazumi KawamotoShinji TsujiHitoshi NakamuraMasato ShishikuraSatoru Kikuchi
    • Toshiyuki MogiKazumi KawamotoShinji TsujiHitoshi NakamuraMasato ShishikuraSatoru Kikuchi
    • H01L2980
    • G02B6/4224
    • In aiming at cost lowering of an optical module and an optical transmission apparatus and with the objective of providing a semiconductor light receiving element that has a good coherence with the other edge emitting/incidence type optical devices and is capable of performing the positioning easily and with a high accuracy, in the edge emitting/incidence type light receiving element in which the light absorbing layer 19 has been formed, the space region is formed so as to provide at least 100 &mgr;m2 of the marker detecting region 24, thereby facilitating detection of marker 23 on the optical device 26 and executing the positioning of the light receiving element with a high accuracy, the space region resulting from eliminating a part of the light absorbing layer 19 that absorbs the detection light of the light receiving element, the transmission amount of the detection light toward the marker detecting region that is parallel to a primary plane being equal to 30% or higher, the detection light having penetrated and transmitted the primary plane of the light receiving element.
    • 为了降低光学模块和光学传输装置的成本,并且为了提供与其它边缘发射/入射型光学装置具有良好相干性的半导体光接收元件,并且能够容易地执行定位 在其中形成有光吸收层19的边缘发射/入射型光接收元件中形成高精度,形成空间区域,以便提供标记检测区域24的至少100微米2,从而便于 检测光学装置26上的标记23,并且以高精度执行光接收元件的定位,由消除吸收光接收元件的检测光的光吸收层19的一部分而产生的空间区域,透射 检测光朝着与主平面平行的标记检测区域的检测光量等于30%以上 n光穿过并透射光接收元件的主平面。