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1. 发明授权

US5349734A Tool for use in the separation of elements in a building set 失效
标题翻译：用于建筑物中元素分离的工具
公开(公告)号：US5349734A
公开(公告)日：1994-09-27
申请号：US768577
申请日：1991-11-20
申请人： Ole V. Poulsen , Carsten Michaelsen , Kurt Jensen
发明人： Ole V. Poulsen , Carsten Michaelsen , Kurt Jensen
IPC分类号： A63H33/08 , A63H33/04 , A63H33/42 , B23P19/04
CPC分类号： A63H33/04 , Y10T29/53683 , Y10T29/53896
摘要： A tool (20) for use in the separation of elements in a building set, said elements having a face provided with coupling means which have a wall part extending transversely to the face, and which are preferably disposed in parallel with a side edge, comprises a lever (25) and a gripper means. The gripper means is disposed at one end of the lever and comprises a first jaw area (21,23) intended to tightly engage the side edge of the element, and a second jaw area (22,24) intended to tightly engage the portion of the wall part of said coupling means which faces away from said side edge. The gripper means may moreover comprise complementary coupling means for at least some of said coupling means.
摘要翻译： PCT No.PCT / DK90 / 00076 Sec。 371日期1991年11月20日 102（e）1991年11月20日日期PCT 1990年3月19日PCT PCT。公开号WO90 / 11112 PCT 1990年10月4日，1990年。一种用于建筑物组件中的元件分离的工具（20），所述元件具有设有连接装置的面，该连接装置具有横向于该表面延伸的壁部分，并且优选地设置在与侧边缘平行，包括杆（25）和夹持器装置。夹持装置设置在杠杆的一端，并且包括旨在紧密地接合元件的侧边缘的第一钳口区域（21,23）和用于紧密接合元件的部分的第二钳口区域（22,24）所述联接装置的面向所述侧边缘的壁部分。夹持装置还可以包括用于至少一些所述联接装置的互补联接装置。

2. 外观设计

USD317482S Separating tool for toy building elements 失效
公开(公告)号：USD317482S
公开(公告)日：1991-06-11
申请号：US443274
申请日：1989-11-29
申请人： Carsten Michaelsen , Ole V. Poulsen
设计人： Carsten Michaelsen , Ole V. Poulsen

3. 发明授权

US08848870B2 Point-line converter 有权
标题翻译：点线转换器
公开(公告)号：US08848870B2
公开(公告)日：2014-09-30
申请号：US13373644
申请日：2011-11-23
申请人： Lutz Bruegemann , Carsten Michaelsen , Keisuke Saito
发明人： Lutz Bruegemann , Carsten Michaelsen , Keisuke Saito
IPC分类号： G21K1/06
CPC分类号： G21K1/06 , G21K2201/064
摘要： An X-ray optical configuration for irradiation of a sample (1) with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source (2) and a beam-conditioning X-ray optics, is characterized in that the X-ray source (2) comprises a brilliant point source (4) and the X-ray optics comprises an X-ray optical element (3) which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.
摘要翻译：一种用于用具有线状横截面的X射线束照射样品（1）的X射线光学构造，其中所述构造包含X射线源（2）和束调节X射线光学器件的特征在于，所述X射线源（2）包括辉光点源（4），所述X射线光学元件包括X射线光学元件（3），所述X射线光学元件（3）对所述X射线光学元件使得X射线束在垂直于光束传播方向的一个方向上平行，并且在与其垂直的方向以及波束传播方向上保持发散。这种类型的X射线光学元件使得能够使用点状和线形的几何形状，而不需要复杂和耗时的转换工作。

4. 发明授权

US07242746B2 Method for manufacturing a reflector for X-ray radiation 有权
标题翻译：用于制造用于X射线辐射的反射器的方法
公开(公告)号：US07242746B2
公开(公告)日：2007-07-10
申请号：US11290545
申请日：2005-12-01
申请人： Carsten Michaelsen , Michael Dahms
发明人： Carsten Michaelsen , Michael Dahms
IPC分类号： G21K1/06
CPC分类号： G21K1/06
摘要： A method for manufacturing a reflector (5) for X-ray radiation (2, 3, 10, 11) which is curved in a non-circular arc shape, along a first cross-section (13) in a plane (XZ) which contains a x-direction, wherein the reflector (5) is also curved along a second cross-section (14) in a plane (YZ) which is perpendicular to the x-direction, is characterized in that the reflector (5) has a curvature along the second cross-section (14) which also differs from the shape of a circular arc. This makes the design of X-ray mirrors and the beam profile of reflected X-ray radiation more flexible, facilitates production of X-ray mirrors and at the same time provides high reflection capacity and good focusing properties for X-ray mirrors.
摘要翻译：一种制造用于在平面（XZ）中沿着第一横截面（13）在非圆弧形弯曲的X射线辐射的反射器（5）的方法，所述反射器（5）包括x方向，其中所述反射器（5）也沿着与x方向垂直的平面（YZ）中的第二横截面（14）弯曲，其特征在于，所述反射器（5）具有沿着第二横截面（14）的曲率也与圆弧的形状不同。这使得X射线反射镜的设计和反射的X射线辐射的光束轮廓更加灵活，便于生产X射线镜，同时提供高反射能力和良好的X射线镜的聚焦性能。

5. 发明授权

US07983388B2 X-ray analysis instrument with adjustable aperture window 有权
标题翻译：具有可调孔径窗口的X射线分析仪
公开(公告)号：US07983388B2
公开(公告)日：2011-07-19
申请号：US12461830
申请日：2009-08-26
申请人： Carsten Michaelsen , Stefanie Belgard , Juergen Graf
发明人： Carsten Michaelsen , Stefanie Belgard , Juergen Graf
IPC分类号： G01N23/20 , G21K1/04
CPC分类号： G21K1/04
摘要： An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherein the collimator mechanism (BM) forms an aperture window (2, 2′) with an aperture opening (3, 3′) through which at least part (26) of the X-ray beam (23) passes. The collimator mechanism (BM) comprises means for gradual movement of the aperture window (2, 2′) in at least one direction (A/B, x, y) transversely to the X-ray beam (23), the aperture opening (3, 3′) is at least as large as the cross-section (32) of the X-ray beam (23) at the location of the aperture window (2, 2′), and the path of movement (VWx, VWy) of the aperture window (2, 2′), which is accessible by the collimator mechanism (BM), in the at least one direction (A/B, x, y) is at least twice as large as the extension (RSx, RSy) of the X-ray beam (23) at the location of the aperture window (2, 2′) in this direction (A/B, x, y). The X-ray analysis instrument offers a wider scope of beam conditioning possibilities.
摘要翻译： X射线分析仪器，特别是X射线衍射仪（21）具有发射X射线束（23）的X射线源（22; SC），X射线光学器件（24），特别是多层X射线镜和准直机构（BM），其中准直器机构（BM）形成具有孔径开口（3,3'）的孔眼窗口（2,2'），至少 X射线束（23）的部分（26）通过。准直器机构（BM）包括用于沿至少一个方向（A / B，x，y）横向于X射线束（23），孔径开口（A，B， 3'，3'）至少与孔径窗（2,2'）位置处的X射线束（23）的横截面（32）一样大，并且移动路径（VWx，VWy ）在至少一个方向（A / B，x，y）上由准直器机构（BM）可访问的孔径窗口（2,2'）的至少两倍于延伸部（RSx，（A / B，x，y）的孔径窗（2,2'）的位置处的X射线束（23）的距离（RSy）。 X射线分析仪器提供更广泛的光束调节可能性。

6. 发明申请

US20120140897A1 Point-line converter 有权
标题翻译：点线转换器
公开(公告)号：US20120140897A1
公开(公告)日：2012-06-07
申请号：US13373644
申请日：2011-11-23
申请人： Lutz Bruegemann , Carsten Michaelsen , Keisuke Saito
发明人： Lutz Bruegemann , Carsten Michaelsen , Keisuke Saito
IPC分类号： G21K1/02 , G21K1/00
CPC分类号： G21K1/06 , G21K2201/064
摘要： An X-ray optical configuration for irradiation of a sample (1) with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source (2) and a beam-conditioning X-ray optics, is characterized in that the X-ray source (2) comprises a brilliant point source (4) and the X-ray optics comprises an X-ray optical element (3) which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.
摘要翻译：一种用于用具有线状横截面的X射线束照射样品（1）的X射线光学构造，其中所述构造包含X射线源（2）和束调节X射线光学器件的特征在于，所述X射线源（2）包括辉光点源（4），所述X射线光学元件包括X射线光学元件（3），所述X射线光学元件（3）对所述X射线光学元件使得X射线束在垂直于光束传播方向的一个方向上平行，并且在与其垂直的方向以及波束传播方向上保持发散。这种类型的X射线光学元件使得能够使用点状和线形的几何形状，而不需要复杂和耗时的转换工作。

7. 发明授权

US07511902B2 Method and device for aligning an optical element 失效
标题翻译：用于对准光学元件的方法和装置
公开(公告)号：US07511902B2
公开(公告)日：2009-03-31
申请号：US11723554
申请日：2007-03-21
申请人： Gerd Wings , Christian Hoffmann , Klaus Wulf , Carsten Michaelsen
发明人： Gerd Wings , Christian Hoffmann , Klaus Wulf , Carsten Michaelsen
IPC分类号： G02B7/02
CPC分类号： G02B7/1824 , G21K2201/06
摘要： A device for adjusting optical elements, in particular, for X-ray analysis, comprising a holding device (2) for receiving the optical element and at least two adjusting units at least one of the two longitudinal ends of the holding device (2), wherein the adjusting units each comprise one plunger (6, 6a, 6b, 6c, 6d), characterized in that each adjusting unit comprises a rotatably disposed adjusting ring (4, 4a, 4b, 4c, 4d) with an eccentric recess, and the optical element is mechanically coupled to the inner surfaces (7) of the adjusting rings (4, 4a, 4b, 4c, 4d) via the plungers (6, 6a, 6b, 6c, 6d). The adjusting device is compact, can be flexibly used and provides simple adjustment of the optical element.
摘要翻译：一种用于调整光学元件的装置，特别是用于X射线分析的装置，包括用于容纳光学元件的保持装置（2）和保持装置（2）的两个纵向端部中的至少一个的至少两个调节单元，其中所述调节单元各自包括一个柱塞（6,6a，6b，6c，6d），其特征在于，每个调节单元包括具有偏心凹槽的可旋转地布置的调节环（4,4a，4b，4c，4d），并且光学元件经由柱塞（6,6a，6b，6c，6d）机械耦合到调节环（4,4a，4b，4c，4d）的内表面（7）。调节装置紧凑，可灵活使用，并提供光学元件的简单调整。

8. 发明授权

US07113567B2 Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive x-ray spectrometric devices 有权
标题翻译：用于通过波长色散X射线光谱仪分析原子和分子元素的装置和方法
公开(公告)号：US07113567B2
公开(公告)日：2006-09-26
申请号：US10196805
申请日：2002-07-17
申请人： Carsten Michaelsen , Rüdiger Bormann , Jörg Wiesmann
发明人： Carsten Michaelsen , Rüdiger Bormann , Jörg Wiesmann
IPC分类号： G21K1/06 , G01N23/223 , G01T1/36
CPC分类号： G02B5/0891 , B82Y10/00 , G21K1/062 , G21K2201/061 , G21K2201/064
摘要： In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair comprises carbon or scandium and the other comprises a metal oxide or a metal nitride and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.
摘要翻译：在通过波长色散X射线光谱法分析样品中原子或分子元素的装置和方法中，其中初级x射线或电子辐射被引导到样品上，从而从样品发射荧光辐射，荧光辐射被引导到由多层结构构成的反射镜或聚焦装置，该多层结构包括一对层，其中一层包括碳或钪，另一层包含金属氧化物或金属氮化物，并且荧光辐射从反射镜反射或聚焦装置到分析检测器上，以分析样品中包含的原子或分子元素。

9. 发明申请

US20060133569A1 Method for manufacturing a reflector for X-ray radiation 有权
标题翻译：用于制造用于X射线辐射的反射器的方法
公开(公告)号：US20060133569A1
公开(公告)日：2006-06-22
申请号：US11290545
申请日：2005-12-01
申请人： Carsten Michaelsen , Michael Dahms
发明人： Carsten Michaelsen , Michael Dahms
IPC分类号： G01N23/20
CPC分类号： G21K1/06
摘要： A method for manufacturing a reflector (5) for X-ray radiation (2, 3, 10, 11) which is curved in a non-circular arc shape, along a first cross-section (13) in a plane (XZ) which contains a x-direction, wherein the reflector (5) is also curved along a second cross-section (14) in a plane (YZ) which is perpendicular to the x-direction, is characterized in that the reflector (5) has a curvature along the second cross-section (14) which also differs from the shape of a circular arc. This makes the design of X-ray mirrors and the beam profile of reflected X-ray radiation more flexible, facilitates production of X-ray mirrors and at the same time provides high reflection capacity and good focusing properties for X-ray mirrors.
摘要翻译：一种制造用于在平面（XZ）中沿着第一横截面（13）在非圆弧形弯曲的X射线辐射的反射器（5）的方法，所述反射器（5）包括x方向，其中所述反射器（5）也沿着与x方向垂直的平面（YZ）中的第二横截面（14）弯曲，其特征在于，所述反射器（5）具有沿着第二横截面（14）的曲率也与圆弧的形状不同。这使得X射线反射镜的设计和反射的X射线辐射的光束轮廓更加灵活，便于生产X射线镜，同时提供高反射能力和良好的X射线镜的聚焦性能。

10. 发明授权

US06650728B2 Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive X-ray spectrometric devices 失效
标题翻译：通过波长色散X射线光谱仪分析原子和分子元素的装置和方法
公开(公告)号：US06650728B2
公开(公告)日：2003-11-18
申请号：US10196806
申请日：2002-07-17
申请人： Carsten Michaelsen , Rudiger Bormann , Jörg Wiesmann
发明人： Carsten Michaelsen , Rudiger Bormann , Jörg Wiesmann
IPC分类号： G01N23223
CPC分类号： B82Y10/00 , G21K1/062 , G21K2201/061 , G21K2201/064
摘要： In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair consists of lanthanum and the other consists of carbon and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.
摘要翻译：在通过波长色散X射线光谱法分析样品中原子或分子元素的装置和方法中，其中初级x射线或电子辐射被引导到样品上，从而从样品发射荧光辐射，荧光辐射被引导到由多层结构组成的反射镜或聚焦装置，该多层结构包括一对层，其中一层由镧构成，另一层由碳组成，另一层由碳组成，并且荧光辐射从反射镜或聚焦装置反射到分析用于分析样品中包含的原子或分子元素的检测器。

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