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1. 发明申请

US20100086104A1 X-ray analysis instrument with adjustable aperture window 有权
标题翻译：具有可调孔径窗口的X射线分析仪
公开(公告)号：US20100086104A1
公开(公告)日：2010-04-08
申请号：US12461830
申请日：2009-08-26
申请人： Carsten Michaelsen , Stefanie Belgard , Juergen Graf
发明人： Carsten Michaelsen , Stefanie Belgard , Juergen Graf
IPC分类号： G01N23/20
CPC分类号： G21K1/04
摘要： An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherein the collimator mechanism (BM) forms an aperture window (2, 2′) with an aperture opening (3, 3′) through which at least part (26) of the X-ray beam (23) passes. The collimator mechanism (BM) comprises means for gradual movement of the aperture window (2, 2′) in at least one direction (A/B, x,y) transversely to the X-ray beam (23), the aperture opening (3, 3′) is at least as large as the cross-section (32) of the X-ray beam (23) at the location of the aperture window (2, 2′), and the path of movement (VWx, VWy) of the aperture window (2, 2′), which is accessible by the collimator mechanism (BM), in the at least one direction (A/B, x, y) is at least twice as large as the extension (RSx, RSy) of the X-ray beam (23) at the location of the aperture window (2, 2′) in this direction (A/B, x, y). The X-ray analysis instrument offers a wider scope of beam conditioning possibilities.
摘要翻译： X射线分析仪器，特别是X射线衍射仪（21）具有发射X射线束（23）的X射线源（22; SC），X射线光学器件（24），特别是多层X射线镜和准直机构（BM），其中准直器机构（BM）形成具有孔径开口（3,3'）的孔眼窗口（2,2'），至少 X射线束（23）的部分（26）通过。准直器机构（BM）包括用于沿至少一个方向（A / B，x，y）横向于X射线束（23），孔径开口（A，B， 3'，3'）至少与孔径窗（2,2'）位置处的X射线束（23）的横截面（32）一样大，并且移动路径（VWx，VWy ）在至少一个方向（A / B，x，y）上由准直器机构（BM）可访问的孔径窗口（2,2'）的至少两倍于延伸部（RSx，（A / B，x，y）的孔径窗（2,2'）的位置处的X射线束（23）的距离（RSy）。 X射线分析仪器提供更广泛的光束调节可能性。

2. 发明授权

US07983388B2 X-ray analysis instrument with adjustable aperture window 有权
标题翻译：具有可调孔径窗口的X射线分析仪
公开(公告)号：US07983388B2
公开(公告)日：2011-07-19
申请号：US12461830
申请日：2009-08-26
申请人： Carsten Michaelsen , Stefanie Belgard , Juergen Graf
发明人： Carsten Michaelsen , Stefanie Belgard , Juergen Graf
IPC分类号： G01N23/20 , G21K1/04
CPC分类号： G21K1/04
摘要： An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray mirror, and a collimator mechanism (BM), wherein the collimator mechanism (BM) forms an aperture window (2, 2′) with an aperture opening (3, 3′) through which at least part (26) of the X-ray beam (23) passes. The collimator mechanism (BM) comprises means for gradual movement of the aperture window (2, 2′) in at least one direction (A/B, x, y) transversely to the X-ray beam (23), the aperture opening (3, 3′) is at least as large as the cross-section (32) of the X-ray beam (23) at the location of the aperture window (2, 2′), and the path of movement (VWx, VWy) of the aperture window (2, 2′), which is accessible by the collimator mechanism (BM), in the at least one direction (A/B, x, y) is at least twice as large as the extension (RSx, RSy) of the X-ray beam (23) at the location of the aperture window (2, 2′) in this direction (A/B, x, y). The X-ray analysis instrument offers a wider scope of beam conditioning possibilities.
摘要翻译： X射线分析仪器，特别是X射线衍射仪（21）具有发射X射线束（23）的X射线源（22; SC），X射线光学器件（24），特别是多层X射线镜和准直机构（BM），其中准直器机构（BM）形成具有孔径开口（3,3'）的孔眼窗口（2,2'），至少 X射线束（23）的部分（26）通过。准直器机构（BM）包括用于沿至少一个方向（A / B，x，y）横向于X射线束（23），孔径开口（A，B， 3'，3'）至少与孔径窗（2,2'）位置处的X射线束（23）的横截面（32）一样大，并且移动路径（VWx，VWy ）在至少一个方向（A / B，x，y）上由准直器机构（BM）可访问的孔径窗口（2,2'）的至少两倍于延伸部（RSx，（A / B，x，y）的孔径窗（2,2'）的位置处的X射线束（23）的距离（RSy）。 X射线分析仪器提供更广泛的光束调节可能性。

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