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热词
    • 2. 发明公开
    • Method and apparatus for processing sets of copies corresponding to a set of originals
    • Vorrichtung und Verfahren zum Herstellen vonKopiensätzenübereinstimmendmitOriginalsätzen。
    • EP0638437A1
    • 1995-02-15
    • EP94201855.7
    • 1994-06-28
    • Océ-Nederland B.V.
    • Deen, Pieter Berend JohannesLinssen, Nicolaas Gerardus HermanMennen, Godefridus Johannes
    • B42B4/00
    • B42B4/00B65H2511/152B65H2801/27B65H2220/03
    • A method and apparatus for discharging sets of copies or parts of such sets in stapled or unstapled condition.
      Those sets of copies or parts of such sets which are made from one and the same set of originals and which are required to be stapled are stapled only if the measured thickness of the first collected set of copies or part of such set is thinner than a predetermined thickness measurement X₁ and if the measured thickness of subsequent collected sets of copies or parts of such sets is thinner than a predetermined thickness measurement X v which is greater than the first thickness measurement X₁.
      Parts of sets of copies made from one and the same original set and required to be unstapled are discharged when the measured thickness of collected parts of the first collected set of copies is equal to a predetermined thickness measurement Y₁ and when the measured thickness of collected corresponding parts of subsequent sets of copies is thinner than a predetermined thickness measurement Y v which is greater than the first thickness measurement Y₁.
    • 一种在装订或未装订状态下排放这些套件的复印件或部件的方法和装置。 由同一套原件制成并且需要装订的这些套件或这些套件的组件只有当第一个收集的一组复印件或该部件的一部分的测量厚度比 预定厚度测量X1,并且如果随后收集的这些复印件组或这些组的部分的测量厚度比大于第一厚度测量X1的预定厚度测量Xv薄。 当第一次收集的一组拷贝的收集部分的测量厚度等于预定的厚度测量值Y1时,并且当所测量的相应的厚度 随后的一组复印件的部分比预定的厚度测量值Yv薄,其厚度大于第一厚度测量值Y1。