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    • 6. 发明授权
    • Bi-MOS semiconductor memory having high soft error immunity
    • 具有高软误差抗扰度的Bi-MOS半导体存储器
    • US4942555A
    • 1990-07-17
    • US376865
    • 1989-07-07
    • Hisayuki HiguchiMakoto SuzukiNoriyuki HommaKiyoo Itoh
    • Hisayuki HiguchiMakoto SuzukiNoriyuki HommaKiyoo Itoh
    • G11C11/418G11C11/419
    • G11C11/418G11C11/419
    • A semiconductor memory is provided having high reliability, and which particularly prevents data destruction by rays, and the like. In a semiconductor memory for detecting memory data from the conduction ratio between a transistor of a flip-flop type memory cell connected to selected word line and data line pairs and a load device of the data line, an arrangement is provided for setting the word line voltage to a voltage lower than the sum of the data line voltage and the threshold voltage of a data transfer MOS transistor of the memory cell. The signal read out from the memory cell is then applied through the data line to a differential amplifier using the base or gate of a junction type transistor as its input. Particularly to set the word line voltage to a voltage lower than the sum of the data line voltage and the threshold voltage of the data transfer MOS transistor of the memory cell, a device having high driving capability such as a bipolar transistor is used as the load of the data line. The word line voltage is changed over to two stages so that the data line voltage V.sub.D and the word line voltage V.sub.W satisfy the relation V.sub.W V.sub.D +V.sub.TH in a write cycle (where V.sub.TH is the threshold voltage of NMOS inside the memory cell).
    • 提供了具有高可靠性的半导体存储器,并且特别地防止了由于光线的数据破坏等。 在用于根据连接到所选字线的触发器型存储单元的晶体管与数据线对之间的导通率以及数据线的负载装置的导通比来检测存储器数据的半导体存储器中,提供了用于设置字线 电压低于数据线电压和存储单元的数据传输MOS晶体管的阈值电压之和的电压。 从存储单元读出的信号然后通过数据线施加到使用结型晶体管的基极或栅极作为其输入的差分放大器。 特别是为了将字线电压设定为低于数据线电压和存储单元的数据传输MOS晶体管的阈值电压之和的电压,使用诸如双极型晶体管的具有高驱动能力的器件作为负载 的数据线。 字线电压转换为两级,使得数据线电压VD和字线电压VW在读周期中满足关系VW VD + VTH(其中VTH 是存储单元内的NMOS的阈值电压)。
    • 9. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US06342710B1
    • 2002-01-29
    • US09521957
    • 2000-03-09
    • Hisayuki HiguchiSuguru TachibanaKoichiro IshibashiKeijiro Uehara
    • Hisayuki HiguchiSuguru TachibanaKoichiro IshibashiKeijiro Uehara
    • H01L2976
    • G11C11/5621G11C15/04
    • A semiconductor integrated circuit, particularly a circuit for a high-speed low-power-consumption table look-aside buffer mounted in a microprocessor LSI. The semiconductor integrated circuit is provided with field effect transistors for comparing inputted multibit data signals with stored data and a coincidence-detecting signal line (25) to which current is applied at least while the data signals are compared with stored data. When the data signals coincide with the stored data, the transistors (26) conduct. The number of transistors (26) is equal to that of the inputted data signals. The drains of the transistors (260 are connected in parallel, and the sources are also connected in parallel and supplied with a predetermined voltage. By the integrated circuit, whether or not the inputted data signals coincide with the stored data is detected by detecting the potential of the coincidence-detecting signal line (25) upon a change of the applied current.
    • 一种半导体集成电路,特别是用于安装在微处理器LSI中的用于高速低功耗表格旁路缓冲器的电路。 半导体集成电路设置有用于将输入的多位数据信号与存储的数据进行比较的场效应晶体管和至少在数据信号与存储的数据进行比较时施加电流的符合检测信号线(25)。 当数据信号与存储的数据一致时,晶体管(26)导通。 晶体管(26)的数量等于输入的数据信号的数量。 晶体管的漏极(260)并联连接,源极并联连接并以预定电压供电,通过集成电路,通过检测电位来检测输入的数据信号是否与存储的数据一致 的一致检测信号线(25)。