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    • 1. 发明申请
    • Semiconductor device and program data redundancy method therefor
    • 半导体器件及其程序数据冗余方法
    • US20060291305A1
    • 2006-12-28
    • US11444251
    • 2006-05-30
    • Norikatsu SuzukiMakoto NiimiSatoru Kawmoto
    • Norikatsu SuzukiMakoto NiimiSatoru Kawmoto
    • G11C29/00
    • G11C29/76
    • A semiconductor device (1) is provided which includes a regular cell array unit (30), a redundant cell array unit (31) that is provided in relation to the regular cell array unit (30), and a PGM/ER state machine (20) that controls reprogramming in which, when programming of a sector in the regular cell array unit fails (step S3), data involved in the programming that fails and data already stored in the sector in the regular cell array unit are written (step S8) into the redundant cell array unit (31). Since reprogramming is performed to write the data already written in the sector as well as the data involved in the programming that fails into the redundant cell array unit (31), data loss can be prevented and data can be secured, thereby increasing the reliability of the system.
    • 提供一种半导体器件(1),其包括正常单元阵列单元(30),相对于正常单元阵列单元(30)提供的冗余单元阵列单元(31)和PGM / ER状态机 20),其控制重编程,其中当正规单元阵列单元中的扇区的编程失败时(步骤S 3),写入编程失败的数据和已经存储在正常单元阵列单元中的扇区中的数据被写入(步骤 S 8)插入到冗余单元阵列单元(31)中。 由于执行重编程以将已经写入扇区的数据以及编程中涉及的数据写入冗余单元阵列单元(31),所以可以防止数据丢失并且可以确保数据的可靠性 系统。
    • 2. 发明授权
    • Semiconductor device and program data redundancy method therefor
    • 半导体器件及其程序数据冗余方法
    • US07739559B2
    • 2010-06-15
    • US11444251
    • 2006-05-30
    • Norikatsu SuzukiMakoto NiimiSatoru Kawamoto
    • Norikatsu SuzukiMakoto NiimiSatoru Kawamoto
    • G11C29/00
    • G11C29/76
    • A semiconductor device (1) is provided which includes a regular cell array unit (30), a redundant cell array unit (31) that is provided in relation to the regular cell array unit (30), and a PGM/ER state machine (20) that controls reprogramming in which, when programming of a sector in the regular cell array unit fails (step S3), data involved in the programming that fails and data already stored in the sector in the regular cell array unit are written (step S8) into the redundant cell array unit (31). Since reprogramming is performed to write the data already written in the sector as well as the data involved in the programming that fails into the redundant cell array unit (31), data loss can be prevented and data can be secured, thereby increasing the reliability of the system.
    • 提供一种半导体器件(1),其包括正常单元阵列单元(30),相对于正常单元阵列单元(30)提供的冗余单元阵列单元(31)和PGM / ER状态机 20),其中当编程正常单元阵列单元中的扇区失败时(步骤S3),写入失败的编程中涉及的数据和已经存储在常规单元阵列单元中的扇区中的数据被写入(步骤S8 )到冗余单元阵列单元(31)中。 由于执行重编程以将已经写入扇区的数据以及编程中涉及的数据写入冗余单元阵列单元(31),所以可以防止数据丢失并且可以确保数据的可靠性 系统。
    • 3. 发明授权
    • Time reduction of address setup/hold time for semiconductor memory
    • 减少半导体存储器的地址设置/保持时间
    • US07889573B2
    • 2011-02-15
    • US12341886
    • 2008-12-22
    • Makoto NiimiKenji NagaiTakaaki Furuyama
    • Makoto NiimiKenji NagaiTakaaki Furuyama
    • G11C7/10
    • G11C7/1078G06F1/10G11C7/109
    • In the storage device of the invention, latch control is performed on a series of signals in response to latch control signals. Latch control terminals are provided to which the latch control signals are input respectively and a plurality of signal terminals to which a series of signals are input. Herein, a plurality of latch circuits is provided so as to correspond to the plurality of signal terminals, respectively. The plurality of latch circuits are located within a specified distance from their associated signal terminals respectively and within a specified distance from the latch control terminals. The delays of signal transmission from the signal terminals to their associated latch circuits can be equalized and the delays of signal transmission from the latch control terminals to which the latch control signals for executing latch control are input to the latch circuits can be equalized. This contributes to a reduction in the skew of the latch characteristics of the signals.
    • 在本发明的存储装置中,响应于锁存控制信号对一系列信号进行锁存控制。 设置锁存控制信号的锁存控制端子和分别输入一系列信号的多个信号端子。 这里,分别提供多个锁存电路以对应于多个信号端子。 多个锁存电路分别位于与其相关联的信号端子规定距离内并且距离锁存器控制端子在指定距离内。 从信号端子到其相关联的锁存电路的信号传输的延迟可以被均衡,并且来自锁存控制端子的信号传输的延迟被输入到锁存电路,锁存控制端子用于执行锁存控制的信号被输入到锁存电路。 这有助于减少信号的锁存特性的偏移。
    • 4. 发明授权
    • Semiconductor integrated circuit device capable of reducing power
consumption
    • 半导体集成电路器件能够降低功耗
    • US5731720A
    • 1998-03-24
    • US784539
    • 1997-01-21
    • Takaaki SuzukiMakoto NiimiHideaki KawaiMasato Kaida
    • Takaaki SuzukiMakoto NiimiHideaki KawaiMasato Kaida
    • G11C11/401G11C11/407H01L21/822H01L27/04H01L27/10H03K19/00H03K17/30
    • H03K19/0013
    • A semiconductor integrated circuit device is intended to prevent generation of an unnecessary leak current and hence to reduce power consumption. In the semiconductor integrated circuit device comprising: a current path which is formed between a predetermined power source terminal (or a predetermined power source pad) and a predetermined low potential power source line, a comparison circuit for comparing a node potential in the current path with a predetermined threshold voltage to thereby detect whether the voltage applied to said power source terminal is a voltage which is larger than an upper limit value of the terminal voltage, a signal generation circuit for generating a predetermined logic signal when the states of some designated control terminals satisfy a combination which is determined in advance, if the logic state of an output signal of said signal generation circuit is a predetermined logic state when said comparison circuit has detected that the voltage applied to the power source terminal is a voltage which is larger than an upper limit value of the terminal voltage, a circuit equipped with a predetermined function mounted on the chip is activated, the semiconductor integrated circuit device being characterized by comprising ON/OFF circuit for turning on and off said current path in accordance with the logic state of the output signal of said signal generation circuit.
    • 半导体集成电路器件旨在防止不必要的泄漏电流的产生,从而降低功耗。 在半导体集成电路装置中,包括:形成在预定电源端子(或预定电源焊盘)和预定低电位电源线之间的电流路径,用于将当前路径中的节点电位与 预定的阈值电压,从而检测施加到所述电源端子的电压是否是大于端子电压的上限值的电压;当一些指定的控制端子的状态产生预定逻辑信号的信号产生电路 如果所述信号发生电路的输出信号的逻辑状态是预定的逻辑状态,当所述比较电路检测到施加到电源端子的电压是大于电源端的电压时,满足预先确定的组合 端子电压的上限值,配备有预定功能的电路 n的半导体集成电路装置的特征在于包括根据所述信号发生电路的输出信号的逻辑状态接通和断开所述电流路径的ON / OFF电路。
    • 5. 发明授权
    • Nonvolatile memory device having a plurality of memory blocks
    • 具有多个存储块的非易失性存储器件
    • US07808808B2
    • 2010-10-05
    • US12177039
    • 2008-07-21
    • Takaaki FuruyamaMakoto NiimiMasahiro Niimi
    • Takaaki FuruyamaMakoto NiimiMasahiro Niimi
    • G11C16/04
    • G11C16/12
    • A nonvolatile memory device 1 capable of preventing interference between a read operation and a rewrite operation, and capable of preventing malfunctions that may occur in the event the read operation and the rewrite operation are performed simultaneously between memory blocks is provided. The nonvolatile memory device 1 is provided with a plurality of banks, a rewrite control unit 2 to which a first power source line VCC1 and a first ground line VSS1 are connected and which is adapted to control a rewrite operation with respect to a bank i, and a read control unit 5 to which a second power source line VCC2 and a second ground line VSS2 are connected and which is adapted to control a read operation with respect to a bank j, wherein the rewrite control unit 2 and the read control unit 5 are arranged so as to be spaced from each another.
    • 提供一种能够防止读取操作和重写操作之间的干扰并且能够防止在存储器块之间同时执行读取操作和重写操作的情况下可能发生的故障的非易失性存储器件1。 非易失性存储器件1设有多个存储体,重写控制单元2,第一电源线VCC1和第一接地线VSS1连接到该重写控制单元2,并且其适于控制相对于存储体i的重写操作, 以及连接有第二电源线VCC2和第二接地线VSS2并且适于控制相对于存储体j的读取操作的读取控制单元5,其中重写控制单元2和读取控制单元5 被布置成彼此间隔开。
    • 8. 发明授权
    • Nonvolatile memory device having a plurality of memory blocks
    • 具有多个存储块的非易失性存储器件
    • US08094478B2
    • 2012-01-10
    • US12878656
    • 2010-09-09
    • Takaaki FuruyamaMakoto NiimiMasahiro Niimi
    • Takaaki FuruyamaMakoto NiimiMasahiro Niimi
    • G11C5/06
    • G11C16/12
    • A nonvolatile memory device 1 capable of preventing interference between a read operation and a rewrite operation, and capable of preventing malfunctions that may occur in the event the read operation and the rewrite operation are performed simultaneously between memory blocks is provided. The nonvolatile memory device 1 is provided with a plurality of banks, a rewrite control unit 2 to which a first power source line VCC1 and a first ground line VSS1 are connected and which is adapted to control a rewrite operation with respect to a bank i, and a read control unit 5 to which a second power source line VCC2 and a second ground line VSS2 are connected and which is adapted to control a read operation with respect to a bank j, wherein the rewrite control unit 2 and the read control unit 5 are arranged so as to be spaced from each another.
    • 提供一种能够防止读取操作和重写操作之间的干扰并且能够防止在存储器块之间同时执行读取操作和重写操作的情况下可能发生的故障的非易失性存储器件1。 非易失性存储器件1设有多个存储体,重写控制单元2,第一电源线VCC1和第一接地线VSS1连接到该重写控制单元2,并且其适于控制相对于存储体i的重写操作, 以及连接有第二电源线VCC2和第二接地线VSS2并且适于控制相对于存储体j的读取操作的读取控制单元5,其中重写控制单元2和读取控制单元5 被布置成彼此间隔开。
    • 9. 发明申请
    • TIME REDUCTION OF ADDRESS SETUP/HOLD TIME FOR SEMICONDUCTOR MEMORY
    • 减少半导体存储器的地址设置/保持时间
    • US20090323435A1
    • 2009-12-31
    • US12341886
    • 2008-12-22
    • Makoto NiimiKenji NagaiTakaaki Furuyama
    • Makoto NiimiKenji NagaiTakaaki Furuyama
    • G11C7/10
    • G11C7/1078G06F1/10G11C7/109
    • In the storage device of the invention, latch control is performed on a series of signals in response to latch control signals. Latch control terminals are provided to which the latch control signals are input respectively and a plurality of signal terminals to which a series of signals are input. Herein, a plurality of latch circuits is provided so as to correspond to the plurality of signal terminals, respectively. The plurality of latch circuits are located within a specified distance from their associated signal terminals respectively and within a specified distance from the latch control terminals. The delays of signal transmission from the signal terminals to their associated latch circuits can be equalized and the delays of signal transmission from the latch control terminals to which the latch control signals for executing latch control are input to the latch circuits can be equalized. This contributes to a reduction in the skew of the latch characteristics of the signals.
    • 在本发明的存储装置中,响应于锁存控制信号对一系列信号进行锁存控制。 设置锁存控制信号的锁存控制端子和分别输入一系列信号的多个信号端子。 这里,分别提供多个锁存电路以对应于多个信号端子。 多个锁存电路分别位于与其相关联的信号端子规定距离内并且距离锁存器控制端子在指定距离内。 从信号端子到其相关联的锁存电路的信号传输的延迟可以被均衡,并且来自锁存控制端子的信号传输的延迟被输入到锁存电路,锁存控制端子用于执行锁存控制的信号被输入到锁存电路。 这有助于减少信号的锁存特性的偏移。