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    • 5. 发明授权
    • Coating and developing apparatus, substrate processing method, and storage medium
    • 涂布显影装置,基板处理方法和存储介质
    • US07955011B2
    • 2011-06-07
    • US11733441
    • 2007-04-10
    • Nobuaki MatsuokaYasushi HayashidaShinichi Hayashi
    • Nobuaki MatsuokaYasushi HayashidaShinichi Hayashi
    • G03D5/04
    • H01L21/67745H01L21/67178
    • A coating and developing apparatus is provided which requires a smaller occupation space even when it incorporates a substrate inspection unit, while eliminating a disadvantageous layout. A coating film forming part B3 including a plurality of process units and transfer mechanisms A3 and A4, and a developing part B1 including a plurality of process units 31 and a transfer mechanism A1 are vertically arranged in a process block S2. There are disposed in the process block S2 on a side of a carrier block S1, a plurality of vertically arranged transfer units TRS for transferring a substrate W between the same and transfer mechanisms for the respective parts, and a vertically movable transfer mechanism D1 for the transfer unit for transferring a substrate between these transfer units. At least one of the coating film forming part and the developing part includes a substrate inspection unit 43 for inspecting a substrate transferred by the transfer mechanism for the corresponding part.
    • 提供了一种涂覆和显影装置,即使当其包含基板检查单元时也需要较小的占用空间,同时消除不利的布局。 包括多个处理单元和转印机构A3和A4的涂膜形成部分B3和包括多个处理单元31和转印机构A1的显影部分B1垂直地布置在处理块S2中。 在载体块S1的一侧设置有处理块S2,多个垂直设置的传送单元TRS,用于将基板W传送到相应部件的传送机构和用于各部件的传送机构之间, 转印单元,用于在这些转印单元之间转印衬底。 涂膜形成部和显影部中的至少一个包括用于检查由相应部分的转印机构转印的基板的基板检查单元43。
    • 7. 发明申请
    • Coating and developing apparatus
    • 涂装显影装置
    • US20070056514A1
    • 2007-03-15
    • US11342616
    • 2006-01-31
    • Masami AkimotoShinichi HayashiYasushi HayashidaNobuaki MatsuokaYoshio KimuraIssei UedaHikaru Ito
    • Masami AkimotoShinichi HayashiYasushi HayashidaNobuaki MatsuokaYoshio KimuraIssei UedaHikaru Ito
    • C23C16/00
    • H01L21/67184H01L21/67173H01L21/67178H01L21/67207H01L21/67745
    • Provided is a coating and developing apparatus composed of an assembly of plural unit blocks. A first unit-block stack and a second unit-block stack are arranged at different positions with respect to front-and-rear direction. Unit blocks for development, each of which comprises plural processing units including a developing unit that performs developing process after exposure and a transfer device that transfers a substrate among the processing units, are arranged at the lowermost level. Unit blocks for application, or coating, each of which comprises plural processing units including a coating unit that performs application process before exposure and a transfer device that transfers a substrate among the processing units, are arranged above the unit blocks for development. Unit blocks for application are arranged in both the first and second unit-block stacks. Unit blocks for application which a wafer goes through are determined depending on the layering positional relationship between an antireflective film and a resist film. An exposed wafer goes only through the unit block for development without going through any one of the unit blocks for application.
    • 提供一种由多个单元块组成的涂层显影装置。 第一单位块堆叠和第二单位块堆叠被布置在相对于前后方向的不同位置。 用于显影的单元块,每个包括多个处理单元,包括执行曝光之后的显影处理的显影单元和在处理单元之间传送基板的转印装置布置在最下层。 用于应用或涂布的单元块包括多个处理单元,包括在曝光之前进行施加处理的涂布单元和在处理单元之间传送基板的转印装置,布置在用于显影的单位块上方。 用于应用的单元块被布置在第一和第二单元块堆叠中。 根据防反射膜和抗蚀剂膜之间的层叠位置关系确定晶片通过的应用单元块。 暴露的晶片仅通过单元块进行开发,而不经过用于应用的单元块中的任何一个。
    • 8. 发明申请
    • Coating and developing system
    • 涂装和开发系统
    • US20060201615A1
    • 2006-09-14
    • US11156571
    • 2005-06-21
    • Nobuaki MatsuokaShinichi HayashiYasushi Hayashida
    • Nobuaki MatsuokaShinichi HayashiYasushi Hayashida
    • B32B37/00
    • H01L21/67178H01L21/67745
    • A coating and developing system is constructed so as to enable the maintenance of an exposure system combined therewith at desired time. The coating and developing system carries a substrate delivered to a carrier handling block to a processing block to form a film on the substrate by a coating block included in the processing block, carries the substrate through an interface block to the exposure system, processes the substrate having the exposed film by a developing process by a developing block included in the processing block and returns the thus processed substrate to the carrier handling block. A direct carrying means is superposed on the coating block and the developing block to carry a substrate having a surface coated with a film from the carrier handling block directly to the interface block. A test substrate can be carried to the exposure system to inspect the condition of the exposure system even in a state where the coating block and the developing block are under maintenance work.
    • 构造涂层和显影系统,以便能够在期望的时间维持与其组合的曝光系统。 涂覆和显影系统将传送到载体处理块的基底运送到处理块,以通过包含在处理块中的涂层在基板上形成膜,将基板通过界面块运送到曝光系统,处理基板 通过由处理块中包含的显影块通过显影处理使曝光的胶片具有曝光的胶片,并将这样处理的基材返回到载体处理块。 直接承载装置重叠在涂层块和显影块上,以将载体处理块上具有涂覆有表面的表面的基底直接运送至界面块。 即使在涂布块和显影块处于维护工作的状态下,也可以将测试基板运送到曝光系统以检查曝光系统的状况。