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    • 10. 发明授权
    • Semiconductor memory device which prevents destruction of data
    • 防止数据破坏的半导体存储器件
    • US07394691B2
    • 2008-07-01
    • US11498142
    • 2006-08-03
    • Noboru ShibataHiroshi Sukegawa
    • Noboru ShibataHiroshi Sukegawa
    • G11C11/34G11C7/00G11C29/00
    • G11C11/5642G11C11/5628G11C16/0483
    • A plurality of memory cells each storing n values (n is a natural number which is not smaller than 3) are arranged in a matrix form in a memory cell array, and each memory cell is connected with a word line and a bit line. Each memory cell stores the n-valued data by a first write operation and a second write operation. A read section sets a potential of a word line, and reads data from a memory cell in the memory cell array. If data read by the read section and written in the second write operation includes an uncorrectable error, a control section changes a potential of a word line supplied to the read section when reading data written in the first write operation.
    • 每个存储n个值的多个存储单元(n是不小于3的自然数)以矩阵形式布置在存储单元阵列中,并且每个存储单元与字线和位线连接。 每个存储单元通过第一写操作和第二写操作来存储n值数据。 读取部分设置字线的电位,并从存储器单元阵列中的存储单元读取数据。 如果由读取部分读取并写入第二写入操作的数据包括不可校正的错误,则当读取在第一写入操作中写入的数据时,控制部分改变提供给读取部分的字线的电位。