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    • 6. 发明授权
    • Controller for optical device, exposure method and apparatus, and method for manufacturing device
    • 用于光学装置的控制器,曝光方法和装置以及制造装置的方法
    • US09551942B2
    • 2017-01-24
    • US14991667
    • 2016-01-08
    • NIKON CORPORATION
    • Soichi Owa
    • G03F7/20
    • G03F7/70191G03F7/20G03F7/70091G03F7/70108G03F7/70116G03F7/70141G03F7/702G03F7/70291
    • An exposure method for exposing a mask pattern, which includes plural types of patterns, with a high throughput and optimal illumination conditions for each type of pattern. The method includes guiding light from a first spatial light modulator illuminated with pulse lights of illumination light to a second spatial light modulator and exposing a wafer with light from the second spatial light modulator, accompanied by: controlling a conversion state of the second spatial light modulator including a plurality of second mirror elements; and controlling a conversion state of the first spatial light modulator including a plurality of first mirror elements to control intensity distribution of the illumination light on a predetermined plane between the first spatial light modulator and the second spatial light modulator.
    • 一种曝光方法,用于以每种类型图案的高通量和最佳照明条件曝光包括多种图案的掩模图案。 该方法包括将来自照明光的脉冲光照射的第一空间光调制器的光引导到第二空间光调制器,并且用来自第二空间光调制器的光曝光晶片,伴随着:控制第二空间光调制器 包括多个第二镜元件; 以及控制包括多个第一反射镜元件的第一空间光调制器的转换状态,以控制照明光在第一空间光调制器和第二空间光调制器之间的预定平面上的强度分布。
    • 8. 发明授权
    • Controller for optical device, exposure method and apparatus, and method for manufacturing device
    • 用于光学装置的控制器,曝光方法和装置以及制造装置的方法
    • US09268235B2
    • 2016-02-23
    • US14320075
    • 2014-06-30
    • NIKON CORPORATION
    • Soichi Owa
    • G03C5/04G03F7/20
    • G03F7/70191G03F7/20G03F7/70091G03F7/70108G03F7/70116G03F7/70141G03F7/702G03F7/70291
    • An exposure method for exposing a mask pattern, which includes plural types of patterns, with a high throughput and optimal illumination conditions for each type of pattern. The method includes guiding light from a first spatial light modulator illuminated with pulse lights of illumination light to a second spatial light modulator and exposing a wafer with light from the second spatial light modulator, accompanied by: controlling a conversion state of the second spatial light modulator including a plurality of second mirror elements; and controlling a conversion state of the first spatial light modulator including a plurality of first mirror elements to control intensity distribution of the illumination light on a predetermined plane between the first spatial light modulator and the second spatial light modulator.
    • 一种曝光方法,用于以每种类型图案的高通量和最佳照明条件曝光包括多种图案的掩模图案。 该方法包括将来自照明光的脉冲光照射的第一空间光调制器的光引导到第二空间光调制器,并且用来自第二空间光调制器的光曝光晶片,伴随着:控制第二空间光调制器 包括多个第二镜元件; 以及控制包括多个第一反射镜元件的第一空间光调制器的转换状态,以控制照明光在第一空间光调制器和第二空间光调制器之间的预定平面上的强度分布。