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    • 2. 发明申请
    • LIQUID JET AND RECOVERY SYSTEM FOR IMMERSION LITHOGRAPHY
    • 液体喷射和恢复系统
    • WO2004092830A3
    • 2005-06-16
    • PCT/US2004010071
    • 2004-04-01
    • NIPPON KOGAKU KKNOVAK W THOMASHAZELTON ANDREW JWATSON DOUGLAS C
    • NOVAK W THOMASHAZELTON ANDREW JWATSON DOUGLAS C
    • G03F7/20G03B27/42G03B27/52
    • G03F7/70341
    • A liquid jet and recovery system for an immersion lithography apparatus (100) has arrays of nozzles arranged to have their openings located proximal to an exposure region through which an image pattern is projected on a workpiece (W) such as a wafer. These nozzles are each adapted to serve selectively either as a source nozzle (21) for supplying a fluid (7) into the exposure region or as a recovery nozzle (23) for recovering the fluid from the exposure region. A fluid controlling device (14) functions to cause nozzles on selected one or more sides of the exposure region to serve as source nozzles and those on selected one or more of the remaining sides to serve as recovery nozzles such that a desired flow pattern can be established for the convenience of immersion lithography.
    • 用于浸没式光刻设备(100)的液体喷射和回收系统具有布置成使其开口位于曝光区域附近的喷嘴阵列,图像图案通过该曝光区域投射在诸如晶片的工件(W)上。 这些喷嘴各自适于选择性地用作用于将流体(7)供应到曝光区域中的源喷嘴(21),或用作从曝光区域回收流体的回收喷嘴(23)。 流体控制装置(14)用于使曝光区域的所选一个或多个侧面上的喷嘴用作源喷嘴,并且在所选择的一个或多个剩余侧面上的喷嘴用作回收喷嘴,使得期望的流动模式可以 建立了为了方便浸没光刻。
    • 4. 发明申请
    • CLEANUP METHOD FOR OPTICS IN IMMERSION LITHOGRAPHY
    • CLEANUP方法在透视图中的光学
    • WO2004093130A3
    • 2005-11-03
    • PCT/US2004010309
    • 2004-04-02
    • NIPPON KOGAKU KKHAZELTON ANDREW JKAWAI HIDEMIWATSON DOUGLAS CNOVAK W THOMAS
    • HAZELTON ANDREW JKAWAI HIDEMIWATSON DOUGLAS CNOVAK W THOMAS
    • B08B3/04B08B3/12G03F7/20G03B27/42
    • G03F7/70341B08B3/04B08B3/12G03F7/70891G03F7/70916G03F7/70925
    • An immersion lithography apparatus has a reticle stage (RST) arranged to retain a reticle (R), a working stage (9) arranged to retain a workpiece (W), and an optical system including an illumination source (1) and an optical element (PL) opposite the workpiece for having an image pattern of the reticle projected by radiation from the illumination source. A gap is defined between the optical element (4) and the workpiece (W), and a fluid supplying device serves to supply an immersion liquid (7) into this gap such that the supplied immersion liquid contacts both the optical element (4) and the workpiece (W) during an immersion lithography process. A cleaning device (30) is incorporated for removing absorbed liquid from the optical element (4) during a cleanup process. The cleaning device may make use of a cleaning liquid having affinity to the absorbed liquid, heat, a vacuum condition, ultrasonic vibrations or cavitating bubbles for the removal of the absorbed liquid.
    • 浸没式光刻设备具有布置成保持标线片(R)的掩模版台(RST),布置成保持工件(W)的工作台(9)和包括照明源(1)和光学元件 (PL),用于具有由来自照明源的辐射投影的标线片的图像图案。 在光学元件(4)和工件(W)之间限定间隙,并且流体供应装置用于将浸液(7)供应到该间隙中,使得所提供的浸没液体接触光学元件(4)和 在浸没光刻过程中的工件(W)。 一种清洁装置(30),用于在净化过程中从光学元件(4)中去除吸收的液体。 清洁装置可以利用对吸收的液体具有亲和性的清洁液体,热,真空条件,超声波振动或气泡以去除吸收的液体。
    • 5. 发明申请
    • KINEMATIC CHUCKS FOR RETICLES AND OTHER PLANAR BODIES
    • 用于反应和其他平面机构的动力卡
    • WO2008143327A1
    • 2008-11-27
    • PCT/JP2008059483
    • 2008-05-15
    • NIPPON KOGAKU KKCOAKLEY SCOTTNOVAK THOMAS WWATSON DOUGLAS CPHILLIPS ALTON H
    • COAKLEY SCOTTNOVAK THOMAS WWATSON DOUGLAS CPHILLIPS ALTON H
    • G03F7/20
    • G03F7/70783G03F7/707
    • Devices are disclosed for holding and moving a planar body such as a reticle (25) as used, for example, in microlithography. An exemplary device includes a stage (12) and a body chuck (10). The stage has a movable support surface (17a, 17b). A proximal region (18a, 18b) of a first membrane (16a, 16b) is mounted to the support surface. A distal region (20a, 20b) of the first membrane extends from the support surface and is coupled to the chuck such that the first membrane at least partially supports the chuck. The chuck includes a surface (28) from wh'ich multiple pins (38,40,44) extend. The surface is situated at the distal region. The pins are arrayed to contact and support a respective region of the body. The pin arrangement is configured such that, during- movements of the chuck imparted by the support surface, body slippage relative to the pins due to forces caused by the movement is substantially uniform at each pin.
    • 公开了用于保持和移动诸如例如在微光刻中使用的掩模版(25)的平面体的装置。 示例性装置包括台(12)和主体卡盘(10)。 舞台具有可移动的支撑表面(17a,17b)。 第一膜(16a,16b)的近端区域(18a,18b)安装到支撑表面。 第一膜的远端区域(20a,20b)从支撑表面延伸并且联接到卡盘,使得第一膜片至少部分地支撑卡盘。 卡盘包括从多个销(38,40,44)延伸的表面(28)。 表面位于远端区域。 引脚被排列成接触和支撑身体的相应区域。 销配置被构造成使得在由支撑表面赋予的卡盘的运动期间,由于由运动引起的力的相对于销的主体滑动在每个销处基本均匀。
    • 6. 发明申请
    • VACUUM CHAMBER ASSEMBLY FOR SUPPORTING A WORKPIECE
    • 用于支持工件的真空室组件
    • WO2012027406A2
    • 2012-03-01
    • PCT/US2011048862
    • 2011-08-23
    • NIPPON KOGAKU KKHASHEMI FARDAD AWATSON DOUGLAS C
    • HASHEMI FARDAD AWATSON DOUGLAS C
    • B05C15/00
    • G03F1/64G03B27/64G03F1/66G03F7/70841G03F7/70908H01L21/6719
    • A chamber assembly (26) for providing a sealed chamber (40) adjacent to a workpiece (28) to counteract the influence of gravity on the workpiece (28) includes a chamber housing (244), and a seal assembly (33) that expands and/or contracts to better seal against the workpiece (28). Further, the chamber assembly (26) can include one or more transducer assemblies (34) that expand or contract to quickly respond to leaks or injections of fluid in chamber assembly (26) to maintain a constant and stable chamber pressure in the chamber assembly (26). Moreover, the chamber assembly (26) can utilize a pressure source (35) that directs a lager amount of fluid (374) through a fluid passageway (368) to accurately maintain the pressure within the chamber assembly (26).
    • 用于提供邻近工件(28)的密封腔室(40)以抵消重力对工件(28)的影响的腔室组件(26)包括腔室壳体(244)和密封组件(33),所述密封组件 和/或收缩以更好地密封工件(28)。 此外,腔室组件(26)可包括一个或多个换能器组件(34),所述换能器组件(34)膨胀或收缩以快速响应腔室组件(26)中的流体的泄漏或注射,以维持腔室组件中恒定且稳定的腔室压力 26)。 此外,室组件(26)可以利用压力源(35),该压力源引导大量流体(374)通过流体通道(368)以精确地维持室组件(26)内的压力。
    • 10. 发明公开
    • CLEANUP METHOD FOR OPTICS IN IMMERSION LITHOGRAPHY
    • REINIGUNGSVERFAHRENFÜROPTIK IN ER IMMERSIONSLITHOGRAPHIE
    • EP1614001A4
    • 2007-05-16
    • EP04759103
    • 2004-04-02
    • NIPPON KOGAKU KK
    • HAZELTON ANDREW JKAWAI HIDEMIWATSON DOUGLAS CNOVAK W THOMAS
    • G03B27/42B08B3/04B08B3/12G03F7/20
    • G03F7/70341B08B3/04B08B3/12G03F7/70891G03F7/70916G03F7/70925
    • An immersion lithography apparatus (100) has a reticle stage (RST) arranged to retain a reticle (R), a working stage (9-11) arranged to retain a workpiece (W), and an optical system including an illumination source and an optical element (4) opposite the workpiece (W) for having an image pattern of the reticle (R) projected by radiation from the illumination source. A gap is defined between the optical element (4) and the workpiece (W), and a fluid-supplying device (5) serves to supply an immersion liquid (7) into this gap such that the supplied immersion liquid (7) contacts both the optical element (4) and the workpiece (W) during an immersion lithography process. A cleaning device (30) is incorporated for removing absorbed liquid from the optical element (4) during a cleanup process. The cleaning device (30) may make use of a cleaning liquid having affinity to the absorbed liquid, heat, a vacuum condition, ultrasonic vibrations or cavitating bubbles for the removal of the absorbed liquid. The cleaning liquid may be supplied through the same fluid-applying device provided with a switching device such as a valve.
    • 浸没式光刻设备(100)具有布置成保持掩模版(R),布置成保持工件(W)的工作台(9-11)的掩模版台(RST)和包括照明源和 光学元件(4),其与工件(W)相对,用于具有通过来自照明源的辐射而突出的标线(R)的图像图案。 在光学元件(4)和工件(W)之间限定间隙,并且流体供应装置(5)用于将浸没液体(7)供应到该间隙中,使得所提供的浸液(7)接触两者 光学元件(4)和工件(W)。 一种清洁装置(30),用于在净化过程中从光学元件(4)中去除吸收的液体。 清洁装置(30)可以利用对被吸收的液体,热,真空条件,超声波振动或气蚀气泡具有亲和性的清洁液体,以除去吸收的液体。 可以通过设置有诸如阀门的开关装置的相同的流体施加装置来供应清洁液体。