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    • 4. 发明申请
    • SYSTEM AND METHOD FOR OVERLAY CONTROL
    • 用于覆盖控制的系统和方法
    • WO2013085389A2
    • 2013-06-13
    • PCT/NL2012/050868
    • 2012-12-10
    • NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
    • LEXMOND, Axel SebastiaanVAN ZWET, Erwin JohnMAAS, Diederik Jan
    • G03F9/00
    • G03F9/7076G03F9/7065G03F9/7088
    • There is disclosed a chip die manufacturing system and method providing real- time overlay measurement and/or control. In use, an alignment mark (23) on a wafer comprises a patterned material (123) having a fluorescent frequency- shifted response to exposure radiation (15) of the radiation source (5) and the mask pattern (32) comprises a corresponding marker scan pattern (24) forming a matched pair with the alignment mark (23), such that during the projecting of the chip die pattern (22) a fluorescent signal (14) emanating from parts of the alignment mark (23) irradiated by exposure radiation (15) of the radiation source (5) by the marker scan pattern (24) is directed towards a position sensor (8). The position sensor (8) is arranged for detecting the fluorescent signal (14) and providing real-time input Ss to a feedback circuit (9) providing feedback to a position controller (7). The position controller (7) is arranged for adjusting a position of a wafer stage (2) and/or reticle stage (3) during or directly after the projecting of the chip die pattern (25) as a function of said real-time feedback.
    • 公开了提供实时覆盖测量和/或控制的芯片制造系统和方法。 在使用中,晶片上的对准标记(23)包括具有对辐射源(5)的曝光辐射(15)的荧光频移响应的图案化材料(123),并且掩模图案(32)包括相应的标记 扫描图案(24),其与对准标记(23)形成匹配对,使得在芯片裸片图案(22)的突出期间,从通过曝光辐射照射的对准标记(23)的部分发出的荧光信号(14) 通过标记扫描图案(24)将辐射源(5)的(15)指向位置传感器(8)。 位置传感器(8)布置成用于检测荧光信号(14),并向反馈电路(9)提供实时输入Ss,以向位置控制器(7)提供反馈。 位置控制器(7)被布置成根据所述实时反馈函数来调整晶片载台(2)和/或标线片载物台(3)在芯片模片(25)的投影期间或之后的位置, 。