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1. 发明专利

JPH01316683A X-RAY DETECTOR 失效
公开(公告)号：JPH01316683A
公开(公告)日：1989-12-21
申请号：JP14951688
申请日：1988-06-17
申请人： NAT INST RES INORGANIC MAT , HORIBA LTD
发明人： NAKAZAWA HIROMOTO , HOSOKAWA YOSHINORI , WAKIYAMA YOSHIHIRO , OKADA YOSHIAKI
IPC分类号： G01N23/223 , G01N23/20 , G01T1/24 , G01T1/28 , G01T1/36
摘要： PURPOSE:To execute the spectral measurement of a secondary X-ray with good accuracy by forming an X-ray detector to a hollow shaft structure, forming the X-ray incident window thereof to an annular shape and irradiating a sample with the X-ray via an X-ray guide body. CONSTITUTION:The semiconductor X-ray detector 3 is formed to the hollow shaft structure having a hollow part 4 at the center thereof. The X-ray window 5 which is provided on the front surface thereof and consists of, for example, beryllium, etc., is formed to the annular shape. The secondary X-ray (fluorescence, diffracted X-ray, Compton scattered X-ray) is generated from the surface of the sample S when the sample is irradiated with the X-ray 8 from the X-ray source via the X-ray guide body 7 inserted in the hollow body 4. This secondary X-ray enters the detector 3 via the incident window 5. The X-ray from the outside is made to arrive efficiently at the sample part in this way; in addition, the taking-out angle constant with respect to the primary X-ray is obtd. by maintaining the specified distance between the end of the guide body 7 and the sample S. The large effective detection stereoscopic angle is obtd. by extremely shortening said distance.

2. 发明专利

GB2185163A Analog/digital converter 未知
公开(公告)号：GB2185163A
公开(公告)日：1987-07-08
申请号：GB8630151
申请日：1986-12-17
申请人： HORIBA LTD
发明人： WAKIYAMA YOSHIHIRO , OHNISHI YOSHIRO
IPC分类号： G01R19/04 , H03M1/00 , H03M1/54 , H03M1/06

3. 发明专利

DE4202142A1 未知
公开(公告)号：DE4202142A1
公开(公告)日：1992-09-03
申请号：DE4202142
申请日：1992-01-27
申请人： HORIBA LTD
发明人： KOMATANI SHINTARO , NAGAO SHUNJI , WAKIYAMA YOSHIHIRO
IPC分类号： G01N23/207 , G01N23/223 , G01T1/36

4. 发明专利

GB2185163B METHOD OF ANALOG/DIGITAL CONVERSION 未知
公开(公告)号：GB2185163B
公开(公告)日：1989-10-18
申请号：GB8630151
申请日：1986-12-17
申请人： HORIBA LTD
发明人： WAKIYAMA YOSHIHIRO , OHNISHI YOSHIRO
IPC分类号： G01R19/04 , H03M1/00 , H03M1/54

5. 发明专利

DE4202142C2 未知
公开(公告)号：DE4202142C2
公开(公告)日：1996-04-04
申请号：DE4202142
申请日：1992-01-27
申请人： HORIBA LTD
发明人： KOMATANI SHINTARO , NAGAO SHUNJI , WAKIYAMA YOSHIHIRO
IPC分类号： G01N23/207 , G01N23/223 , G01T1/36 , G01N23/22 , G01T1/17

6. 发明专利

DE2552363A1 Test cell with a cover for the inner case - is formed by shaping a plastic film typically by bending 未知
公开(公告)号：DE2552363A1
公开(公告)日：1976-08-12
申请号：DE2552363
申请日：1975-11-21
申请人： HORIBA LTD
发明人： HOSOKAWA YOSHINORI , WAKIYAMA YOSHIHIRO , NOMURA YAZYURO
IPC分类号： B01L3/00 , G01N23/22 , G01N , G01N23/223
摘要： The test cell comprises a base a vertical part, a connecting part, a bent downward part (8) and flange. These components may be placed as a cover on the cylindrical inner case. A transparent foil or a thin plate can be placed on the components as a cover. A cylindrical outer case (15) can be put on subsequently to complete the assembly. The base is preferably stuck to the flange by an adhesive. The construction is particularly relevant to X-ray analyser by fluorescence techniques, and has a relatively low manufacturing and construction cost.

7. 发明专利

JPS62214385A METHOD FOR CORRECTING DEAD TIME 失效
公开(公告)号：JPS62214385A
公开(公告)日：1987-09-21
申请号：JP6043686
申请日：1986-03-17
申请人： HORIBA LTD
发明人： WAKIYAMA YOSHIHIRO , AOYAMA TAKESHI , ONISHI YOSHIRO
IPC分类号： G01T1/17
摘要： PURPOSE:To reduce an error in correction by obtaining a dead time by adding the time from the rise of the output signal of a slow amplifier to the attainment to a peak as an additional time to the processing time of the output signal of the slow amplifier which is generated after a pulse signal is inputted from a fast amplifier. CONSTITUTION:An A/D converter or linear amplifier processes the output signal B of the slow amplifier which is generated after the pulse signal A from the fast amplifier is inputted and the time corresponding to the time TC+TP obtained by adding the time TP from the rise of the output signal of the slow amplifier to the attainment to the peak as the additional time to the signal processing time TC up to the passing of the output signal is regarded as the dead time TD. Consequently, even if a leading pile phenomenon occurs, the dead time TD ends the additional time TP after the processing time of the signal after its leading piled-up state, so a proper dead time correction is made.

8. 发明专利

JPH0783695A MEASUREMENT DISPLAY METHOD IN RADIATION MEASURING EQUIPMENT 失效
公开(公告)号：JPH0783695A
公开(公告)日：1995-03-28
申请号：JP25470093
申请日：1993-09-18
申请人： HORIBA LTD
发明人： WAKIYAMA YOSHIHIRO , NAGAO TOSHIHARU
IPC分类号： G01D1/04 , G01T7/00
摘要： PURPOSE:To display measurement values accurately by adding uniform random numbers to the output counts from a radiation detector, multiplying the sum by a predetermined coefficient, and omitting the fractions of the product to arrange the digit thereby improving the nonlinearity in the differentiation of least significant digit being displayed. CONSTITUTION:Radiation H is detected by a detector 1 and a signal is delivered to a preamplifier 2. Output signal (a) from the preamplifier 2 is amplified and filtered through a linear amplifier 3 to produce a signal (b). The level of the signal (b) is decided by a signal channel analyzer 4 and a signal (c) having magnitude larger than a predetermined level is outputted. A counter 5 counts the signal (c) a predetermined time and outputs a count N every time when the counting is ended. Uniform random numbers (r) generated from a random number generator 6 is added 7 to the count N and the sum is fed to an operating unit 8 where the sum is multiplied by a coefficient for unit conversion and the digit is arranged by omitting the fractions of the product thus providing a digit to be displayed.

9. 发明专利

JPH05107206A METHOD FOR FLUORESCENT X-RAY ANALYSIS 失效
公开(公告)号：JPH05107206A
公开(公告)日：1993-04-27
申请号：JP29991191
申请日：1991-10-19
申请人： HORIBA LTD
发明人： WAKIYAMA YOSHIHIRO
IPC分类号： G01N23/223
摘要： PURPOSE:To eliminate an error in measurement due to nonuniformity of the thickness of a cell window and to improve precision by correcting the intensity of a detected fluorescent X ray by using the relationship between the thickness of a resin sheet and the fluorescent X ray which is determined beforehand. CONSTITUTION:In a state of a sample 7 being held in a sample cell 4, a primary X ray from an X-ray tube 9 is applied thereto through a cell window 6. Thereby a fluorescent X ray 10 is generated from the sample 7 and it is detected by an X-ray detecting part 11. By processing a detection output thereof in an arithmetic display part 12, the quantity of sulfur contained in the sample 7, for instance, is measured. A thickness measuring device 16 measures the thickness of a resin sheet used as the cell window 6. Generally, the dimensions and the shape of the cell window 6 are definite and the size of the resin sheet is also definite. A balance being used as the device 16, therefore, the thickness is determined from a measured weight and the data thereon are inputted to an arithmetic unit 14. By using the relation-ship between the thickness and the fluorescent X ray which is determined beforehand, the intensity of the detected X ray is corrected.

10. 发明专利

JPH01185478A MULTIPLE-DETECTING-PART TYPE DETECTING APPARATUS 失效
公开(公告)号：JPH01185478A
公开(公告)日：1989-07-25
申请号：JP1131188
申请日：1988-01-20
申请人： HORIBA LTD
发明人： WAKIYAMA YOSHIHIRO , ARAI SHIGETOSHI , KOMATANI SHINTARO
IPC分类号： G01T1/17
摘要： PURPOSE:To prevent the generation of noises due to mutual interference, by supplying INH to all signal-processing-part SS circuits when one of a plurality of feedback-control HB circuits in amplifier circuit parts transmits a reset signal RES and an inhibit signal INH. CONSTITUTION:An INH synthesizing means Z1 is provided between HB circuits F(F1-FM) in amplifier circuit parts X(X1-XM) and SS circuits Y(Y1-YM). When, e.g., a signal SIG 1 reaches the upper preset limit in one of preamplifiers A1-AM and the corresponding circuit F1 transmits RES 1 and INH 1, the INH 1 is supplied to all the circuits Y at the same time through the means Z1. Even if circuits R2-RM in other systems undergo interference due to the reset operation of a reset circuit R1 in the system of one detector D1 and pseudo signals are mixed in the SIG2-SIGM in the other system, the signal processing operation of the circuits Y are stopped by the INH, which is supplied from the means Z1. Therefore, no effects imparted to the output signal issued from the circuits Y.

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