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    • 1. 发明授权
    • Enhanced signal processing random access memory device utilizing a DRAM
memory array integrated with an associated SRAM cache and internal
refresh control
    • 利用与相关联的SRAM缓存和内部刷新控制集成的DRAM存储器阵列的增强型信号处理随机存取存储器件
    • US5991851A
    • 1999-11-23
    • US850802
    • 1997-05-02
    • Michael AlwaisKenneth J. Mobley
    • Michael AlwaisKenneth J. Mobley
    • G11C11/41G11C11/401G11C11/406G06F12/00
    • G11C11/406
    • An enhanced digital signal processing random access memory device utilizing a highly density DRAM core memory array integrated with an SRAM cache and internal refresh control functionality which may be provided in an integrated circuit package which is pin-compatible with industry standard SRAM memory devices. The memory device provides a high speed memory access device of particular utility in conjunction with DSP processors with performance equivalent to that of SRAM memory devices but requiring a significantly small die size which allows for the provision of greater effective memory capacity per die area. The internal refresh functionality of the device provides for all refresh operations to the DRAM memory array to occur transparently to the device user and provides control signals alerting the associated controller when refresh operations are being performed.
    • 利用与SRAM缓存集成的高密度DRAM内存存储器阵列和内部刷新控制功能的增强型数字信号处理随机存取存储器件,其可以在与工业标准SRAM存储器器件引脚兼容的集成电路封装中提供。 存储器件提供了具有与SRAM存储器件相当性能的DSP处理器特别实用的高速存储器访问设备,但是需要显着小的管芯尺寸,这允许每个管芯区域提供更大的有效存储器容量。 该设备的内部刷新功能提供了DRAM存储器阵列的所有刷新操作,以便对设备用户透明地发生,并且提供在执行刷新操作时提示相关控制器的控制信号。
    • 3. 发明授权
    • Nonvolatile octal latch and D-type register
    • 非易失性八进制锁存器和D型寄存器
    • US06362675B1
    • 2002-03-26
    • US09614157
    • 2000-07-11
    • Michael Alwais
    • Michael Alwais
    • H03K312
    • G11C14/00
    • An octal transparent latch or D-type register (or flip-flop) integrated circuit device may be packaged in an industry standard logic pin-out and configuration but having nonvolatile properties such as automatically recording the output state in nonvolatile form and restoring it on power up. The nonvolatile memory elements are ideally ferroelectric capacitors, using well known ferroelectric materials such as PZT, SBT, or BST or other ferroelectric materials. EEPROM, Flash, SNOS, or other writeable nonvolatile technologies can also be used. In a particular embodiment disclosed herein, the nonvolatile elements of the integrated circuit device are written only when the latched state changes to reduce write endurance changes thereto and data changes on either the input or output data lines that are not latched have no effect.
    • 八进制透明锁存器或D型寄存器(或触发器)集成电路器件可以封装在工业标准逻辑引脚和配置中,但具有非易失性特性,例如以非易失性形式自动记录输出状态并将其恢复电力 向上。 非易失性存储元件理想地是使用公知的铁电材料如PZT,SBT或BST或其它铁电材料的铁电电容器。 还可以使用EEPROM,闪存,SNOS或其它可写入的非易失性技术。 在本文公开的特定实施例中,集成电路器件的非易失性元件仅在锁存状态改变时才被写入,以减少对其的写入耐久性改变,并且在未锁存的输入或输出数据线上的数据改变没有效果。