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1. 发明申请

US20050093565A1 Fabrication method of semiconductor integrated circuit device 审中-公开
标题翻译：半导体集成电路器件的制造方法
公开(公告)号：US20050093565A1
公开(公告)日：2005-05-05
申请号：US10968215
申请日：2004-10-20
申请人： Masayoshi Okamoto , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
发明人： Masayoshi Okamoto , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
IPC分类号： G01R1/06 , G01R1/067 , G01R1/073 , G01R3/00 , G01R31/28 , H01L21/66 , H01L21/822 , H01L27/04 , G01R31/26
CPC分类号： H01L22/14 , G01R1/06711 , G01R1/06744 , G01R1/07307 , G01R3/00 , H01L2224/05553 , H01L2224/05554 , H01L2224/0603 , H01L2224/45144 , H01L2224/48453 , H01L2224/48463 , H01L2224/49171 , H01L2924/014 , H01L2924/3011 , H01L2924/00
摘要： To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.
摘要翻译：为了允许具有金字塔或梯形金字塔形式的窄间距探针设置的测试焊盘的半导体集成电路器件进行电气测试，是由依次层叠铑膜和镍膜而形成的金属膜形成的。在互连和金属膜之间的聚酰亚胺膜中形成通孔，并且互连电连接到金属膜。通过将配备有另一个探针和通孔的另一金属膜的平面图案转过预定角度，获得装配有一个探针和通孔的金属膜之一的平面图案。

2. 发明申请

US20110175634A1 FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE 审中-公开
公开(公告)号：US20110175634A1
公开(公告)日：2011-07-21
申请号：US13075666
申请日：2011-03-30
申请人： Masayoshi Okamoto , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
发明人： Masayoshi Okamoto , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
IPC分类号： G01R31/3187 , G01R31/20
CPC分类号： H01L22/14 , G01R1/06711 , G01R1/06744 , G01R1/07307 , G01R3/00 , H01L2224/05553 , H01L2224/05554 , H01L2224/0603 , H01L2224/45144 , H01L2224/48453 , H01L2224/48463 , H01L2224/49171 , H01L2924/014 , H01L2924/3011 , H01L2924/00
摘要： To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.

3. 发明申请

US20100304510A1 FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE 有权
标题翻译：半导体集成电路器件的制造方法
公开(公告)号：US20100304510A1
公开(公告)日：2010-12-02
申请号：US12853360
申请日：2010-08-10
申请人： Masayoshi OKAMOTO , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
发明人： Masayoshi OKAMOTO , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
IPC分类号： H01L21/66
CPC分类号： H01L22/14 , G01R1/06711 , G01R1/06744 , G01R1/07307 , G01R3/00 , H01L2224/05553 , H01L2224/05554 , H01L2224/0603 , H01L2224/45144 , H01L2224/48453 , H01L2224/48463 , H01L2224/49171 , H01L2924/014 , H01L2924/3011 , H01L2924/00
摘要： To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.
摘要翻译：为了允许具有金字塔或梯形金字塔形式的窄间距探针设置的测试焊盘的半导体集成电路器件进行电气测试，是由依次层叠铑膜和镍膜而形成的金属膜形成的。在互连和金属膜之间的聚酰亚胺膜中形成通孔，并且互连电连接到金属膜。通过将配备有另一个探针和通孔的另一金属膜的平面图案转过预定角度，获得装配有一个探针和通孔的金属膜之一的平面图案。

4. 发明授权

US07901958B2 Fabrication method of semiconductor integrated circuit device 有权
标题翻译：半导体集成电路器件的制造方法
公开(公告)号：US07901958B2
公开(公告)日：2011-03-08
申请号：US12853360
申请日：2010-08-10
申请人： Masayoshi Okamoto , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
发明人： Masayoshi Okamoto , Yoshiaki Hasegawa , Yasuhiro Motoyama , Hideyuki Matsumoto , Shingo Yorisaki , Akio Hasebe , Ryuji Shibata , Yasunori Narizuka , Akira Yabushita , Toshiyuki Majima
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： H01L22/14 , G01R1/06711 , G01R1/06744 , G01R1/07307 , G01R3/00 , H01L2224/05553 , H01L2224/05554 , H01L2224/0603 , H01L2224/45144 , H01L2224/48453 , H01L2224/48463 , H01L2224/49171 , H01L2924/014 , H01L2924/3011 , H01L2924/00
摘要： To permit electrical testing of a semiconductor integrated circuit device having test pads disposed at narrow pitches probes in a pyramid or trapezoidal pyramid form are formed from metal films formed by stacking a rhodium film and a nickel film successively. Via through-holes are formed in a polyimide film between interconnects and the metal films, and the interconnects are electrically connected to the metal films. A plane pattern of one of the metal films equipped with one probe and through-hole is obtained by turning a plane pattern of the other metal film equipped with the other probe and through-hole through a predetermined angle.
摘要翻译：为了允许具有金字塔或梯形金字塔形式的窄间距探针设置的测试焊盘的半导体集成电路器件进行电气测试，是由依次层叠铑膜和镍膜而形成的金属膜形成的。在互连和金属膜之间的聚酰亚胺膜中形成通孔，并且互连电连接到金属膜。通过将配备有另一个探针和通孔的另一金属膜的平面图案转过预定角度，获得装配有一个探针和通孔的金属膜之一的平面图案。

5. 发明授权

US07541647B2 Method of designing semiconductor integrated circuit device and semiconductor integrated circuit device 失效
公开(公告)号：US07541647B2
公开(公告)日：2009-06-02
申请号：US11167648
申请日：2005-06-28
申请人： Ryuji Shibata , Shigeru Shimada
发明人： Ryuji Shibata , Shigeru Shimada
IPC分类号： H01L23/62
CPC分类号： H01L27/11807 , H01L27/0207 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor integrated circuit device and a method of designing the same, design information about circuit cells each having a desired function are described as objects according to selected purposes. The pieces of design information are registered in a cell library as cell information capable of forming any of substrate potential fixed cells and substrate potential variable cells. Further, a data sheet common to the substrate potential fixed cell and the substrate potential variable cell is offered to a user, so that the user is able to make a selection according to the user's purposes. The substrate potential fixed cells and the substrate potential variable cells are mixed together on a semiconductor chip so as to be properly used according to the functions or the like of circuit portions in which the cells are used.

6. 发明申请

US20080013851A1 IMAGE PICKUP APPARATUS, CONTROL METHOD THEREFOR, AND COMPUTER PROGRAM 有权
标题翻译：图像拾取装置，其控制方法和计算机程序
公开(公告)号：US20080013851A1
公开(公告)日：2008-01-17
申请号：US11773247
申请日：2007-07-03
申请人： Hisashi ISHIWATA , Yoshito Terashima , Tetsuo Mise , Ryuji Shibata , Masakazu Koyanagi
发明人： Hisashi ISHIWATA , Yoshito Terashima , Tetsuo Mise , Ryuji Shibata , Masakazu Koyanagi
IPC分类号： G06K9/40
CPC分类号： G06K9/00228 , H04N5/23212 , H04N5/23219 , H04N5/23248
摘要： An image pickup apparatus includes: a face detection section configured to detect a face area from an image obtained by the image pickup apparatus; and a control section configured to detect at least any one of the amount of change in size of the face area detected by the face detection section and a movement speed of the face area, determine whether there is a possibility of occurrence of subject shake blur, which is blur occurring in a captured image due to the movement of a subject, on the basis of information on the detected amount of change in size of the face area or the detected movement speed of the face area, and output a warning when it is determined that there is a possibility of occurrence of subject shake blur.
摘要翻译：一种图像拾取装置，包括：面部检测部，被配置为从由所述图像拾取装置获得的图像检测面部区域; 以及控制部，被配置为检测由所述面部检测部检测到的面部区域的尺寸变化量和面部区域的移动速度中的至少任一个，确定是否存在发生被摄体抖动模糊的可能性，根据检测到的脸部区域的尺寸变化量或检测到的面部区域的移动速度的信息，由于被检体的移动而在拍摄图像中发生的模糊，并且当其被检测到面部区域的移动速度时，输出警告确定存在拍摄对象抖动模糊的可能性。

7. 发明申请

US20090278976A1 Drive control unit, drive control method and program thereof 失效
标题翻译：驱动控制单元，驱动控制方法及程序
公开(公告)号：US20090278976A1
公开(公告)日：2009-11-12
申请号：US12386737
申请日：2009-04-22
申请人： Ryuji Shibata
发明人： Ryuji Shibata
IPC分类号： H04N5/225
CPC分类号： G02B7/102
摘要： A drive control unit of the present invention includes: a first external force detecting section for detecting that an external force is applied to a first moving object body movable back and forth in a single direction; and a second initialization processing section which when it is detected that the external force is applied to the first moving object body by the first external force detecting section, moves at least one of second moving object bodies movable back and forth in the single direction to a predetermined second initial position and when it is not detected that the external force is applied to the first moving object body, does not move the second moving object body.
摘要翻译：本发明的驱动控制单元包括：第一外力检测部分，用于检测向沿单个方向来回移动的第一移动物体施加外力; 以及第二初始化处理部，当通过第一外力检测部检测到外力施加到第一移动体上时，将沿单向前后移动的第二移动体的至少一个移动到预定的第二初始位置，并且当没有检测到外力施加到第一移动物体时，不移动第二移动物体。

8. 发明授权

US06462978B2 Method of designing semiconductor integrated circuit device and semiconductor integrated circuit device 失效
标题翻译：半导体集成电路器件和半导体集成电路器件的设计方法
公开(公告)号：US06462978B2
公开(公告)日：2002-10-08
申请号：US09947507
申请日：2001-09-07
申请人： Ryuji Shibata , Shigeru Shimada
发明人： Ryuji Shibata , Shigeru Shimada
IPC分类号： G11C506
CPC分类号： H01L27/11807 , H01L27/0207 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor integrated circuit device and a method of designing the same, design information about circuit cells each having a desired function are described as objects according to selected purposes. The pieces of design information are registered in a cell library as cell information capable of forming any of substrate potential fixed cells and substrate potential variable cells. Further, a data sheet common to the substrate potential fixed cell and the substrate potential variable cell is offered to a user, so that the user is able to make a selection according to the user's purposes. The substrate potential fixed cells and the substrate potential variable cells are mixed together on a semiconductor chip so as to be properly used according to the functions or the like of circuit portions in which the cells are used.
摘要翻译：在半导体集成电路器件及其设计方法中，根据所选择的目的将关于具有期望功能的电路单元的设计信息描述为对象。将设计信息作为能够形成任何一种底物电位固定细胞和底物潜在可变细胞的细胞信息登记在细胞库中。此外，向用户提供与基板电位固定单元和基板电位变量单元共同的数据表，使得用户能够根据用户的目的进行选择。基板电位固定电池和衬底电位可变电池在半导体芯片上混合在一起，以便根据其中使用电池的电路部分的功能等来适当地使用。

9. 发明授权

US06340825B1 Method of designing semiconductor integrated circuit device and semiconductor integrated circuit device 有权
公开(公告)号：US06340825B1
公开(公告)日：2002-01-22
申请号：US09131393
申请日：1998-08-07
申请人： Ryuji Shibata , Shigeru Shimada
发明人： Ryuji Shibata , Shigeru Shimada
IPC分类号： H01L27092
CPC分类号： H01L27/11807 , H01L27/0207 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor integrated circuit device and a method of designing the same, design information about circuit cells each having a desired function are described as objects according to selected purposes. The pieces of design information are registered in a cell library as cell information capable of forming any of substrate potential fixed cells and substrate potential variable cells. Further, a data sheet common to the substrate potential fixed cell and the substrate potential variable cell is offered to a user, so that the user is able to make a selection according to the user's purposes. The substrate potential fixed cells and the substrate potential variable cells are mixed together on a semiconductor chip so as to be properly used according to the functions or the like of circuit portions in which the cells are used.

10. 发明授权

US08068639B2 Image pickup apparatus, control method therefor, and computer program for detecting image blur according to movement speed and change in size of face area 有权
标题翻译：摄像装置及其控制方法以及根据移动速度和脸部面积变化来检测图像模糊的计算机程序
公开(公告)号：US08068639B2
公开(公告)日：2011-11-29
申请号：US11773247
申请日：2007-07-03
申请人： Hisashi Ishiwata , Yoshito Terashima , Tetsuo Mise , Ryuji Shibata , Masakazu Koyanagi
发明人： Hisashi Ishiwata , Yoshito Terashima , Tetsuo Mise , Ryuji Shibata , Masakazu Koyanagi
IPC分类号： G06K9/40 , G06K9/00 , G03B17/00
CPC分类号： G06K9/00228 , H04N5/23212 , H04N5/23219 , H04N5/23248
摘要： An image pickup apparatus includes: a face detection section configured to detect a face area from an image obtained by the image pickup apparatus; and a control section configured to detect at least any one of the amount of change in size of the face area detected by the face detection section and a movement speed of the face area, determine whether there is a possibility of occurrence of subject shake blur, which is blur occurring in a captured image due to the movement of a subject, on the basis of information on the detected amount of change in size of the face area or the detected movement speed of the face area, and output a warning when it is determined that there is a possibility of occurrence of subject shake blur.
摘要翻译：一种图像拾取装置，包括：面部检测部，被配置为从由所述图像拾取装置获得的图像检测面部区域; 以及控制部，被配置为检测由所述面部检测部检测到的面部区域的尺寸变化量和面部区域的移动速度中的至少任一个，确定是否存在发生被摄体抖动模糊的可能性，根据检测到的脸部区域的尺寸变化量或检测到的面部区域的移动速度的信息，由于被检体的移动而在拍摄图像中发生的模糊，并且当其被检测到面部区域的移动速度时，输出警告确定存在拍摄对象抖动模糊的可能性。

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