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    • 2. 发明授权
    • Non-volatile semiconductor memory device
    • 非易失性半导体存储器件
    • US07965552B2
    • 2011-06-21
    • US12343990
    • 2008-12-24
    • Masanobu ShirakawaNaoya Tokiwa
    • Masanobu ShirakawaNaoya Tokiwa
    • G11C16/04G11C8/10G11C5/02G11C29/00
    • G11C16/20G11C16/0483G11C29/82
    • A non-volatile semiconductor memory device includes: a memory cell array; a bad block position data register area defined in the memory cell array to store bad block position data; an address decoder circuit configured to select a block in the cell array; and bad block flag latches disposed in the address decoder circuit, bad block flags being set in the bad block flag latches in accordance with the bad block position data read out the bad block position data register area, wherein the bad block position data in the bad block position data register area are defined by such a bit position assignment scheme that one bit is assigned to one block under the condition that block positions in the cell array and column positions in one page are set in one-to-one correspondence.
    • 非易失性半导体存储器件包括:存储单元阵列; 在存储单元阵列中定义的坏块位置数据寄存器区域,用于存储坏块位置数据; 配置为选择所述单元阵列中的块的地址解码器电路; 以及设置在地址解码器电路中的坏块标志锁存器,根据读出坏块位置数据寄存器区域的坏块位置数据,在坏块标志中设置坏块标志锁存,其中坏块位置数据在坏 通过这样的位位置分配方案来定义块位置数据寄存器区域,即在一页对应的单元阵列中的块位置和列位置被设置为一一对应的条件下,一位被分配给一个块。
    • 3. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE
    • 半导体存储器件
    • US20080123410A1
    • 2008-05-29
    • US11773280
    • 2007-07-03
    • Masanobu ShirakawaNaoya Tokiwa
    • Masanobu ShirakawaNaoya Tokiwa
    • G11C11/34
    • G11C8/08G11C11/5628G11C11/5642G11C16/0483G11C16/26G11C29/835
    • A semiconductor memory device includes: a memory cell array with electrically rewritable and non-volatile memory cells arranged therein; a row decoder configured to select a memory cell in the memory cell array, the row decoder including a flag latch, in which a bad block flag is set for a bad block in the memory cell array; a sense amplifier configured to sense data of a selected memory cell in the memory cell array; and an output circuit configured to output read data in the sense amplifier, the output circuit including an output data fixing circuit configured to fix an output data at a logic level in accordance with the bad block flag.
    • 半导体存储器件包括:具有布置在其中的电可重写和非易失性存储单元的存储单元阵列; 行解码器,其被配置为选择存储单元阵列中的存储单元,所述行解码器包括标志锁存器,其中对所述存储单元阵列中的坏块设置坏块标志; 感测放大器,被配置为感测所述存储器单元阵列中的选定存储单元的数据; 以及输出电路,被配置为在所述读出放大器中输出读取数据,所述输出电路包括输出数据固定电路,其被配置为根据所述坏块标志将输出数据固定在逻辑电平。
    • 5. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07463515B2
    • 2008-12-09
    • US11773280
    • 2007-07-03
    • Masanobu ShirakawaNaoya Tokiwa
    • Masanobu ShirakawaNaoya Tokiwa
    • G11C16/26
    • G11C8/08G11C11/5628G11C11/5642G11C16/0483G11C16/26G11C29/835
    • A semiconductor memory device includes: a memory cell array with electrically rewritable and non-volatile memory cells arranged therein; a row decoder configured to select a memory cell in the memory cell array, the row decoder including a flag latch, in which a bad block flag is set for a bad block in the memory cell array; a sense amplifier configured to sense data of a selected memory cell in the memory cell array; and an output circuit configured to output read data in the sense amplifier, the output circuit including an output data fixing circuit configured to fix an output data at a logic level in accordance with the bad block flag.
    • 半导体存储器件包括:具有布置在其中的电可重写和非易失性存储单元的存储单元阵列; 行解码器,其被配置为选择存储单元阵列中的存储单元,所述行解码器包括标志锁存器,其中对所述存储单元阵列中的坏块设置坏块标志; 感测放大器,被配置为感测所述存储器单元阵列中的选定存储单元的数据; 以及输出电路,被配置为在所述读出放大器中输出读取数据,所述输出电路包括输出数据固定电路,其被配置为根据所述坏块标志将输出数据固定在逻辑电平。
    • 7. 发明授权
    • Three-dimensionally stacked nonvolatile semiconductor memory
    • 三维堆叠的非易失性半导体存储器
    • US08228733B2
    • 2012-07-24
    • US13164938
    • 2011-06-21
    • Naoya TokiwaHideo Mukai
    • Naoya TokiwaHideo Mukai
    • G11C11/34
    • G11C16/0483G11C8/08G11C16/08G11C16/30G11C29/028G11C2029/1202H01L27/11578H01L27/11582
    • A three-dimensionally stacked nonvolatile semiconductor memory of an aspect of the present invention including conductive layers stacked on a semiconductor substrate in such a manner as to be insulated from one another, a bit line which is disposed on the stacked conductive layers, a semiconductor column which extends through the stacked conductive layers, word lines for which the stacked conductive layers except for the uppermost and lowermost conductive layers are used and which have a plate-like planar shape, memory cells provided at intersections of the word lines and the semiconductor column, a register circuit which has information to supply a potential suitable for each of the word lines, and a potential control circuit which reads the information retained in the register circuit in accordance with an input address signal of a word line and which supplies a potential suitable for the word line corresponding to the address signal.
    • 本发明的一个方面的三维叠层的非易失性半导体存储器包括以彼此绝缘的方式堆叠在半导体衬底上的导电层,布置在层叠的导电层上的位线,半导体柱 其延伸穿过堆叠的导电层,使用除了最上面和最下面的导电层之外的层叠的导电层并且具有板状平面形状的字线,设置在字线和半导体柱的交叉处的存储单元, 具有提供适于每个字线的电位的信息的寄存器电路以及根据字线的输入地址信号读取保存在寄存器电路中的信息的电位控制电路,并提供适于 对应于地址信号的字线。
    • 9. 发明授权
    • Nonvolatile semiconductor memory device and nonvolatile semiconductor memory system
    • 非易失性半导体存储器件和非易失性半导体存储器系统
    • US07986557B2
    • 2011-07-26
    • US12533529
    • 2009-07-31
    • Naoya TokiwaShigeo Ohshima
    • Naoya TokiwaShigeo Ohshima
    • G11C16/04G11C5/14
    • G11C16/30G11C5/143G11C5/145G11C8/06G11C8/10G11C16/0483
    • A memory may include word lines; bit lines; cells provided corresponding to intersections between the word lines and the bit lines; sense amplifiers detecting data; a column decoder selecting a certain bit line for the sense amplifiers to output read data or receive write data; a row decoder configured to select a certain word line; a charge pump supplying power to the sense amplifiers, the column decoder, and the row decoder; a logic circuit controlling the sense amplifiers, the column decoder, and the row decoder based on an address selecting the memory cells; a first power source input applying a voltage to the logic circuit; and a second power source input applying a voltage higher than a voltage of the first power source input to the charge pump, and to supply power to the charge pump at least at a data reading time and a data writing time.
    • 存储器可以包括字线; 位线 对应于字线和位线之间的交点提供的单元; 感测放大器检测数据; 选择用于读出放大器的特定位线以输出读取数据或接收写入数据的列解码器; 行解码器,被配置为选择某个字线; 电荷泵向读出放大器,列解码器和行解码器供电; 基于选择存储器单元的地址来控制读出放大器,列解码器和行解码器的逻辑电路; 向逻辑电路施加电压的第一电源输入; 以及施加比所述第一电源输入的电压高于所述电荷泵的电压的第二电源输入,以及至少在数据读取时和数据写入时间向所述电荷泵供电。