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    • 2. 发明授权
    • Evacuation use sample chamber and circuit pattern forming apparatus using the same
    • 疏散使用样品室和使用其的电路图案形成装置
    • US06744054B2
    • 2004-06-01
    • US10002144
    • 2001-12-05
    • Masaki MizuochiYoshimasa FukushimaMitsuru Inoue
    • Masaki MizuochiYoshimasa FukushimaMitsuru Inoue
    • G21K508
    • H01J37/18H01J37/20
    • An evacuation use sample chamber is constituted by a top table 21 which is provided with a recessed portion disposed in a sample chamber main body 10 and for mounting a sample 8 and a groove portion surrounding the recessed portion; a stage 20 which holds the top table 21 and is displaceable in front and back, right and left and up and down directions together with the top table 21; a sample chamber cover 11 which covers above the sample chamber main body 10 including the top table 21; and an evacuation use pipe 21C which communicates with the groove portion and evacuates gas between the bottom face of the sample chamber cover 11 and the top face of the top table 21 including the sample 8. Thereby, an evacuation use sample chamber which performs a stable evacuation and keeps around a sample at a predetermined high vacuum and a circuit pattern forming apparatus which permits a highly accurate pattern drawing over the entire region of the sample are provided.
    • 排气用样品室由顶台21构成,顶台21设置有设置在样品室主体10中的凹部,并且用于安装样品8和围绕凹部的槽部; 保持顶台21并与顶台21一起在前后左右上下方向上移动的台架20; 样品室盖11,其覆盖包括顶台21的样品室主体10的上方; 以及与槽部连通并在样品室盖11的底面与包含样品8的顶台21的顶面之间排出气体的排气用管21C。由此,进行稳定的排气用样品室 抽出并保持预定的高真空下的样品,并且提供允许在样品的整个区域上进行高精度图案绘制的电路图案形成装置。
    • 5. 发明授权
    • Charged particle beam device
    • 带电粒子束装置
    • US08880374B2
    • 2014-11-04
    • US13001532
    • 2009-06-18
    • Masaki Mizuochi
    • Masaki Mizuochi
    • G06F19/00H01J37/28H01J37/26
    • H01J37/28H01J37/265H01J2237/2817H01J2237/2826
    • Provided is a charged particle beam device wherein a secondary signal generated from an alignment pattern having known coordinate values in a sample coordinate system is detected, and a positional deviation quantity between the coordinate system of a sample (10) and the coordinate system of a stage (21) is calculated so as to generate coordinate correction data. At the time of observing a sample image, the secondary signal generated from the alignment pattern is detected at least once so as to perform realignment, and the coordinate correction data is updated. Thus, the charged particle beam device performs long-time inspection at a high observation magnification by accurately correcting the sample coordinate information obtained by temperature change, while suppressing device cost increase and throughput deterioration.
    • 提供了一种带电粒子束装置,其中检测从具有样本坐标系中已知坐标值的对准图案产生的二次信号,以及样本(10)的坐标系与阶段的坐标系之间的位置偏差量 (21),以产生坐标校正数据。 在观察样本图像时,从对准图案生成的次要信号被检测至少一次,以便执行重新对准,并且更新坐标校正数据。 因此,带电粒子束装置通过精确地校正由温度变化获得的样本坐标信息,同时抑制器件成本增加和吞吐量恶化,从而在高观察倍率下进行长时间检查。
    • 6. 发明申请
    • CHARGED PARTICLE BEAM DEVICE
    • 充电颗粒光束装置
    • US20110098960A1
    • 2011-04-28
    • US13001532
    • 2009-06-18
    • Masaki Mizuochi
    • Masaki Mizuochi
    • G06F19/00
    • H01J37/28H01J37/265H01J2237/2817H01J2237/2826
    • Provided is a charged particle beam device wherein a secondary signal generated from an alignment pattern having known coordinate values in a sample coordinate system is detected, and a positional deviation quantity between the coordinate system of a sample (10) and the coordinate system of a stage (21) is calculated so as to generate coordinate correction data. At the time of observing a sample image, the secondary signal generated from the alignment pattern is detected at least once so as to perform realignment, and the coordinate correction data is updated. Thus, the charged particle beam device performs long-time inspection at a high observation magnification by accurately correcting the sample coordinate information obtained by temperature change, while suppressing device cost increase and throughput deterioration.
    • 提供了一种带电粒子束装置,其中检测从具有样本坐标系中已知坐标值的对准图案产生的二次信号,以及样本(10)的坐标系与阶段的坐标系之间的位置偏差量 (21),以产生坐标校正数据。 在观察样本图像时,从对准图案生成的次要信号被检测至少一次,以便执行重新对准,并且更新坐标校正数据。 因此,带电粒子束装置通过精确地校正由温度变化获得的样本坐标信息,同时抑制器件成本增加和吞吐量恶化,从而在高观察倍率下进行长时间检查。