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    • 1. 发明授权
    • Scanning atomic force microscope
    • 扫描原子力显微镜
    • US5567872A
    • 1996-10-22
    • US399521
    • 1995-03-07
    • Masafumi KyogakuKiyoshi Takimoto
    • Masafumi KyogakuKiyoshi Takimoto
    • G01B11/30B82B1/00G01B5/28G01B11/00G01B21/30G01Q20/02G01Q60/24
    • G01Q20/02B82Y35/00G01Q60/38Y10S977/87
    • A scanning atomic force microscope includes a probe arranged near a sample surface to oppose the sample surface, a support device for supporting the prove, a moving mechanism for moving the probe relative to the sample, and a signal detector for detecting a signal corresponding to a structure of the sample surface obtained by the probe. The signal detector includes a laser beam oscillator for oscillating a laser beam, and a laser beam receiving device for receiving the laser beam which is emitted from the laser beam oscillator and is reflected by the support device. The scanning atomic force microscope is further provided with a laser beam output device which has a function of controlling the laser beam oscillator to discontinuously emit the laser beam.
    • 扫描原子力显微镜包括布置在样品表面附近以与样品表面相对的探针,用于支撑证明的支撑装置,用于相对于样品移动探针的移动机构,以及用于检测对应于 通过探针获得的样品表面的结构。 信号检测器包括用于振荡激光束的激光束振荡器和用于接收从激光束振荡器发射并被支撑装置反射的激光束的激光束接收装置。 扫描原子力显微镜还设置有具有控制激光束振荡器以不连续地发射激光束的功能的激光束输出装置。
    • 7. 发明授权
    • Information processing apparatus, and electrode substrate and
information recording medium used in the apparatus
    • 信息处理装置,以及在该装置中使用的电极基板和信息记录介质
    • US5329514A
    • 1994-07-12
    • US919273
    • 1992-07-27
    • Ken EguchiHaruki KawadaKiyoshi TakimotoToshihiko Takeda
    • Ken EguchiHaruki KawadaKiyoshi TakimotoToshihiko Takeda
    • C30B7/00G01Q70/00G11B9/00G11B9/14G11C13/02H01J37/30H04N1/21
    • G11C13/0014B82Y10/00C30B29/02C30B7/00C30B7/005G11B9/1463G11B9/1472
    • An electrode substrate includes a substrate and an electrode layer of a noble metal crystal formed on the substrate, the noble metal crystal exhibiting a substantially linear domain boundary and a plane orientation dispersion angle in X-ray analysis of 1.degree. or less. An information recording medium includes an electrode substrate as described above and a recording layer provided on the electrode layer. An information processing apparatus includes: an information recording medium as described above; a probe electrode arranged in close proximity to this medium; and a voltage applying circuit for applying a pulse/bias voltage between the medium and the probe electrode, information being written/read onto/from the medium by the application of the pulse/bias voltage. An information processing method includes the steps of: preparing an information recording medium as described above; arranging a probe electrode in close proximity to the medium; and applying a pulse/bias voltage between the medium and the probe electrode so as to write/read information onto/from the medium.
    • 电极基板包括基板和形成在基板上的贵金属晶体的电极层,在X射线分析中呈现基本上线性的畴边界和平面取向色散角的贵金属晶体为1°以下。 信息记录介质包括如上所述的电极基板和设置在电极层上的记录层。 信息处理设备包括:如上所述的信息记录介质; 布置在该介质附近的探针电极; 以及用于在介质和探针电极之间施加脉冲/偏置电压的电压施加电路,通过施加脉冲/偏置电压将信息写入/读取到介质上。 信息处理方法包括以下步骤:准备如上所述的信息记录介质; 将探针电极布置在介质附​​近; 以及在介质和探针电极之间施加脉冲/偏压,以便在介质上/从介质读/写信息。