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    • 2. 发明申请
    • PROTOCOL FOR CONFLICTING MEMORY TRANSACTIONS
    • 冲突内存交易协议
    • US20140359230A1
    • 2014-12-04
    • US13997900
    • 2011-12-20
    • Manoj K. AroraRobert G. BlankenshipRahul PalDheemanth Nagaraj
    • Manoj K. AroraRobert G. BlankenshipRahul PalDheemanth Nagaraj
    • G06F12/08
    • G06F12/0815G06F12/0824G06F12/0828G06F12/0831G06F13/14G06F13/38
    • Embodiments of the invention describe a cache coherency protocol that eliminates the need for ordering between message classes and also eliminates home tracker preallocation. Embodiments of the invention describe a less complex conflict detection and resolution mechanism (at the home agent) without any performance degradation in form of bandwidth or latency compared to prior art solutions.Embodiments of the invention describe a home agent that may receive request messages, e.g., data ownership request messages and data request messages, which include issuance data indicating an order of the respective message issued. Said home agent may determine whether an early or late conflict exists based, at least in part, on a received conflict response message and the issuance data of a most recent completed transaction.
    • 本发明的实施例描述了高速缓存一致性协议,其消除了在消息类之间排序的需要,并且还消除了家庭跟踪器预分配。 与现有技术的解决方案相比,本发明的实施例描述了一种不太复杂的冲突检测和解决机制(在归属代理),与带宽或延迟形式没有任何性能下降。 本发明的实施例描述了可以接收诸如数据所有权请求消息和数据请求消息的请求消息的归属代理,其包括指示所发出的各个消息的顺序的发布数据。 所述归属代理可以至少部分地基于接收到的冲突响应消息和最近完成的交易的发行数据来确定是否存在早期或晚期冲突。
    • 10. 发明申请
    • DEFECT MANAGEMENT FOR A SEMICONDUCTOR MEMORY SYSTEM
    • 半导体存储系统的缺陷管理
    • US20080270675A1
    • 2008-10-30
    • US11740052
    • 2007-04-25
    • Dheemanth NagarajLarry J. Thayer
    • Dheemanth NagarajLarry J. Thayer
    • G06F12/00
    • G06F12/0246
    • A method is provided for managing defects in a semiconductor memory system having a plurality of addressable locations. In the method, a first plurality of the addressable locations is allocated as in-use locations, and a second plurality of the addressable locations is allocated as spare locations. A plurality of sets of the in-use locations, wherein each of the sets is associated with a memory defect, is determined. At least one of the sets includes a different number of in-use locations than another of the sets. Each of the sets of the in-use locations is associated with at least one corresponding set of the spare locations. Each of a plurality of data requests that is associated with one of the sets of the in-use locations is directed to the at least one corresponding set of the spare locations.
    • 提供一种用于管理具有多个可寻址位置的半导体存储器系统中的缺陷的方法。 在该方法中,第一多个可寻址位置被分配为使用中的位置,并且第二多个可寻址位置被分配为备用位置。 确定其中每个组与存储器缺陷相关联的多组使用中的位置。 这些组中的至​​少一个包括不同数量的使用位置,而不是另外一组。 每个使用中的位置集合与至少一个对应的备用位置组相关联。 与正在使用的位置中的一组相关联的多个数据请求中的每一个被引导到至少一个对应的备用位置集合。