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    • 2. 发明申请
    • Variable optical attenuator and ranging apparatus using the same
    • 可变光衰减器及使用其的测距装置
    • US20080044152A1
    • 2008-02-21
    • US11890559
    • 2007-08-07
    • Makoto FujinoHiroyuki Kawashima
    • Makoto FujinoHiroyuki Kawashima
    • G02B6/26
    • G02B6/266G01S7/481G01S7/4868G01S17/08
    • A variable optical attenuator for adjusting a power of light which is output from an output end of a first optical fiber and is to be led to an input end of a second optical fiber, includes a reflection member which reflects the light output from the output end of the first optical fiber, a density filter which transmits the light reflected from the reflection member and controls the power of the light which is transmitted by the density filter depending on a light-transmitting position on the density filter, and an optical member which reflects the light transmitted by the density filter to lead the light to the reflection member. The reflection member is disposed tiltably, the power of the light transmitted by the density filter attenuates along a direction in which the light-transmitting position is changed, and the light-transmitting position of the light is changed by tilting the reflection member.
    • 一种用于调节从第一光纤的输出端输出并被引导到第二光纤的输入端的光功率的可变光衰减器包括:反射部件,其反射从输出端 第一光纤的密度滤波器,透射从反射构件反射的光并根据密度滤光器上的透光位置控制由密度滤光器透射的光的功率的浓度滤光器;以及反射 由密度滤光器透射的光将光引导到反射构件。 反射构件可倾斜地设置,由密度滤波器透射的光的功率沿着透光位置改变的方向衰减,并且通过使反射构件倾斜来改变光的透光位置。
    • 3. 发明授权
    • Variable optical attenuator and ranging apparatus using the same
    • 可变光衰减器及使用其的测距装置
    • US07546008B2
    • 2009-06-09
    • US11890559
    • 2007-08-07
    • Makoto FujinoHiroyuki Kawashima
    • Makoto FujinoHiroyuki Kawashima
    • G02B6/26G02B6/00G01C3/00C01C3/08
    • G02B6/266G01S7/481G01S7/4868G01S17/08
    • A variable optical attenuator for adjusting a power of light which is output from an output end of a first optical fiber and is to be led to an input end of a second optical fiber, includes a reflection member which reflects the light output from the output end of the first optical fiber, a density filter which transmits the light reflected from the reflection member and controls the power of the light which is transmitted by the density filter depending on a light-transmitting position on the density filter, and an optical member which reflects the light transmitted by the density filter to lead the light to the reflection member. The reflection member is disposed tiltably, the power of the light transmitted by the density filter attenuates along a direction in which the light-transmitting position is changed, and the light-transmitting position of the light is changed by tilting the reflection member.
    • 一种用于调节从第一光纤的输出端输出并被引导到第二光纤的输入端的光功率的可变光衰减器包括:反射部件,其反射从输出端 第一光纤的密度滤波器,透射从反射构件反射的光并根据密度滤光器上的透光位置控制由密度滤光器透射的光的功率的浓度滤光器;以及反射 由密度滤波器透射的光将光引导到反射构件。 反射构件可倾斜地设置,由密度滤波器透射的光的功率沿着透光位置改变的方向衰减,并且通过使反射构件倾斜来改变光的透光位置。
    • 6. 发明申请
    • PROBE, TESTING HEAD HAVING A PLURALITY OF PROBES, AND CIRCUIT BOARD TESTER HAVING THE TESTING HEAD
    • 探测器,具有多个探测器的测试头,以及具有测试头的电路板测试仪
    • US20070264878A1
    • 2007-11-15
    • US11746809
    • 2007-05-10
    • Kosuke HirobeMakoto FujinoMinoru Kato
    • Kosuke HirobeMakoto FujinoMinoru Kato
    • H01R13/24
    • G01R1/07328G01R1/06722G01R31/2886
    • A probe and a testing head including the probe is used for inspecting electric characteristics of a wiring pattern of circuit board. The testing head includes a guiding member having a first guiding base having a first through hole, and a second guiding base arranged to face the first guiding base with a gap defined therebetween and having a second through hole aligned with the first through hole. The probe includes a first pin body having a measuring end arranged to be in contact with the circuit board, a measuring-end side of the first pin body is slidably supported in the first through hole of the first guiding base and the other-end side is slidably supported in the second through hole of the second guiding base. The probe also includes a second pin body arranged coaxial with the first pin body and supported in the second through hole. The second pin has one end directed to the other end of the first pin body and an external connection end to be connected to an electrode. A coil spring supported in the second through hole in a compressible manner, one end of the coil spring is electrically connected to the other end of the first pin body, and the other end of the coil spring is electrically connected to the one end of the second pin body.
    • 包括探头的探头和测试头用于检查电路板布线图案的电气特性。 测试头包括具有第一引导底座和引导构件的引导构件,第一引导基座具有第一通孔,第二引导基座布置成与第一引导基座面对并且间隔开间隙,并具有与第一通孔对准的第二通孔。 探针包括:第一销体,其具有设置成与电路板接触的测量端,第一销体的测量端侧可滑动地支撑在第一导向底座的第一通孔中,另一端侧 可滑动地支撑在第二导向底座的第二通孔中。 探针还包括与第一销体同轴设置并被支撑在第二通孔中的第二销体。 第二销的一端指向第一销体的另一端,而外部连接端连接到电极。 螺旋弹簧以可压缩的方式支撑在第二通孔中,螺旋弹簧的一端电连接到第一销体的另一端,螺旋弹簧的另一端电连接到第一通孔的一端 第二针体。
    • 8. 发明授权
    • Interference measurement apparatus and probe used for interference measurement apparatus
    • 用于干涉测量装置的干涉测量装置和探头
    • US06233370B1
    • 2001-05-15
    • US09182504
    • 1998-10-30
    • Makoto FujinoNobuo HoriShigenori Nagano
    • Makoto FujinoNobuo HoriShigenori Nagano
    • G02B600
    • G01B9/0201G01B2290/70
    • An simlified optical configuration is acheved and, a direction discrimination function and a high resolving detection function are performed by one light receiving section. A TE mode emitted from an optical waveguide section 3 transmits through a beam splitter 5 and is guided to a measurement optical path. A TM mode emitted from the optical waveguide is reflected by the beam splitter 5 and is guided to a reference optical path. First and second ¼ wave plates 10 and 11 are inserted in the respective optical paths, and the TE and TM modes are acted by a ½ wave plate while travelling forward and backward on the reference and measurement optical paths. A reference light (TM mode) is reflected by a reference reflection section 8 and transmits through the beam splitter section 5. A measurement light (TE mode) is reflected by a measurement reflection section 9 and is reflected by the beam splitter section 5. By a polarization member 12, only direction components of the polarization member 12 are extracted from the TM and TE modes, and both waves interfere, whereby a displacement is measured by a displacement measurement section 7.
    • 通过一个光接收部分来实现一个简化的光学配置,方向鉴别功能和高分辨率检测功能。 从光波导部3发射的TE模式通过分束器5透射并被引导到测量光路。 从光波导发射的TM模式被分束器5反射并被引导到参考光路。 第一和第二¼波片10和11插入相应的光路中,并且在参考和测量光路上向前和向后行进时,TE和TM模式由1/2波片作用。 参考光(TM模式)被参考反射部分8反射并透射通过分束器部分5.测量光(TE模式)被测量反射部分9反射并被分束器部分5反射。通过 极化构件12仅从TM和TE模式中提取偏振构件12的方向分量,并且两个波都相互干涉,从而由位移测量部7测量位移。