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    • 1. 发明授权
    • Sub-resolution alignment of images
    • 图像的分辨率对齐
    • US07409653B2
    • 2008-08-05
    • US10946667
    • 2004-09-21
    • Madhumita SenguptaMamta SlnhaTheodore R. LundquistWilliam Thompson
    • Madhumita SenguptaMamta SlnhaTheodore R. LundquistWilliam Thompson
    • G06F17/50G06K9/34
    • G06K9/32G06T7/001G06T7/32G06T2207/30148
    • A plurality of images, including a first image and a second image having a higher resolution than the first image, are aligned by generating an oversampled cross correlation image that corresponds to relative displacements of the first and second images, and, based on the oversampled cross correlation image, determining an offset value that corresponds to a misalignment of the first and second images. The first and second images are aligned to a precision greater than the resolution of the first image, based on the determined offset value. Enhanced results are achieved by performing another iteration of generating an oversampled cross correlation image and determining an offset value for the first and second images. Generating the oversampled cross correlation image may involve generating a cross correlation image that corresponds to relative displacements of the first and second images, and oversampling the cross correlation image to generate the oversampled cross correlation image.
    • 通过产生对应于第一和第二图像的相对位移的过采样互相关图像,并且基于过采样交叉,对准包括具有比第一图像更高分辨率的第一图像和第二图像的多个图像 相关图像,确定对应于第一和第二图像的未对准的偏移值。 基于所确定的偏移值,将第一和第二图像对准到大于第一图像的分辨率的精度。 通过执行产生过采样互相关图像的另一次迭代并确定第一和第二图像的偏移值来实现增强的结果。 产生过采样互相关图像可以涉及产生对应于第一和第二图像的相对位移的互相关图像,并且对互相关图像进行过采样以生成过采样互相关图像。
    • 3. 发明授权
    • Sub-resolution alignment of images
    • 图像的分辨率对齐
    • US06848087B2
    • 2005-01-25
    • US10159527
    • 2002-05-30
    • Madhumita SenguptaMamta SinhaTheodore R. LundquistWilliam Thompson
    • Madhumita SenguptaMamta SinhaTheodore R. LundquistWilliam Thompson
    • G06F9/455G06F17/50G06T7/00
    • G06K9/32G06T7/001G06T7/32G06T2207/30148
    • A plurality of images, including a first image and a second image having a higher resolution than the first image, are aligned by generating an oversampled cross correlation image that corresponds to relative displacements of the first and second images, and, based on the oversampled cross correlation image, determining an offset value that corresponds to a misalignment of the first and second images. The first and second images are aligned to a precision greater than the resolution of the first image, based on the determined offset value. Enhanced results are achieved by performing another iteration of generating an oversampled cross correlation image and determining an offset value for the first and second images. Generating the oversampled cross correlation image may involve generating a cross correlation image that corresponds to relative displacements of the first and second images, and oversampling the cross correlation image to generate the oversampled cross correlation image.
    • 通过产生对应于第一和第二图像的相对位移的过采样互相关图像,并且基于过采样交叉,对准包括具有比第一图像更高分辨率的第一图像和第二图像的多个图像 相关图像,确定对应于第一和第二图像的未对准的偏移值。 基于所确定的偏移值,将第一和第二图像对准到大于第一图像的分辨率的精度。 通过执行产生过采样互相关图像的另一次迭代并确定第一和第二图像的偏移值来实现增强的结果。 产生过采样互相关图像可以涉及产生对应于第一和第二图像的相对位移的互相关图像,并且对互相关图像进行过采样以生成过采样互相关图像。
    • 4. 发明申请
    • SUB-RESOLUTION ALIGNMENT OF IMAGES
    • 图像分解对齐
    • US20080298719A1
    • 2008-12-04
    • US12144495
    • 2008-06-23
    • Madhumita SenguptaMamta SinhaTheodore R. LundquistWilliam Thompson
    • Madhumita SenguptaMamta SinhaTheodore R. LundquistWilliam Thompson
    • G06K9/54
    • G06K9/32G06T7/001G06T7/32G06T2207/30148
    • A plurality of images, including a first image and a second image having a higher resolution than the first image, are aligned by generating an oversampled cross correlation image that corresponds to relative displacements of the first and second images, and, based on the oversampled cross correlation image, determining an offset value that corresponds to a misalignment of the first and second images. The first and second images are aligned to a precision greater than the resolution of the first image, based on the determined offset value. Enhanced results are achieved by performing another iteration of generating an oversampled cross correlation image and determining an offset value for the first and second images. Generating the oversampled cross correlation image may involve generating a cross correlation image that corresponds to relative displacements of the first and second images, and oversampling the cross correlation image to generate the oversampled cross correlation image.
    • 通过产生对应于第一和第二图像的相对位移的过采样互相关图像,并且基于过采样交叉,对准包括具有比第一图像更高分辨率的第一图像和第二图像的多个图像 相关图像,确定对应于第一和第二图像的未对准的偏移值。 基于所确定的偏移值,将第一和第二图像对准到大于第一图像的分辨率的精度。 通过执行产生过采样互相关图像的另一次迭代并确定第一和第二图像的偏移值来实现增强的结果。 产生过采样互相关图像可以涉及产生对应于第一和第二图像的相对位移的互相关图像,并且对互相关图像进行过采样以生成过采样互相关图像。
    • 5. 发明授权
    • Estimation of stress and elastic parameters
    • 应力和弹性参数的估计
    • US08098543B2
    • 2012-01-17
    • US11969162
    • 2008-01-03
    • Ran BachrachMadhumita Sengupta
    • Ran BachrachMadhumita Sengupta
    • G01V1/00
    • G01V1/30
    • Various implementations described herein are directed to estimating stresses and elastic parameters in a formation based on seismic data. In one implementation, wide azimuth seismic data may be used to derive anisotropic elastic parameters. Furthermore, stresses may be calculated using a geomechanical earth model, followed by deriving anisotropic elastic parameters based on the calculated stresses. The anisotropic elastic parameters derived from the wide azimuth seismic data may then be used to modify the geomechanical earth model to improve the prediction of drilling parameters.
    • 本文描述的各种实施方式涉及基于地震数据估计地层中的应力和弹性参数。 在一个实现中,可以使用宽的方位角地震数据来导出各向异性弹性参数。 此外,可以使用地质力学地球模型计算应力,随后基于计算的应力导出各向异性弹性参数。 从广义方位角地震资料得到的各向异性弹性参数可用于修改地质力学地球模型,以改善钻井参数的预测。
    • 6. 发明授权
    • Enhanced scanning control of charged particle beam systems
    • 增强扫描控制带电粒子束系统
    • US07230240B2
    • 2007-06-12
    • US10931321
    • 2004-08-31
    • James SiebertLokesh JohriDennis McCartySimon VoongMadhumita SenguptaHui Wang
    • James SiebertLokesh JohriDennis McCartySimon VoongMadhumita SenguptaHui Wang
    • H01J37/147H01J37/256
    • H01J37/3023H01J2237/30483H01J2237/31737H01J2237/31749
    • A charged particle beam system and scanning control method capable of imaging, and possibly editing, a device under test (DUT). The charged particle beam system contains a charged particle beam generation unit, such as a focused ion beam (FIB) column, which emits a charged particle beam onto the DUT. Also included is a scan controller arrangement implementing a finite state machine to control the application of the charged particle beam onto the DUT according to a plurality of scanning control parameters. The scanning control parameters may describe one or more scan regions that are rectangular in shape. Further, the parameters may describe one or more scan regions describing other shapes by way of a bit-map. Similarly, a method for controlling the scanning of a charged particle beam that involves obtaining a set of scanning control parameters, and then directing the charged particle beam as specified by the scanning control parameters by way of a finite state machine, is disclosed.
    • 一种能够成像并可能编辑被测器件(DUT)的带电粒子束系统和扫描控制方法。 带电粒子束系统包含带电粒子束产生单元,例如聚焦离子束(FIB)柱,其将带电粒子束发射到DUT上。 还包括扫描控制器装置,其实现有限状态机以根据多个扫描控制参数来控制将带电粒子束应用到DUT上。 扫描控制参数可以描述形状为矩形的一个或多个扫描区域。 此外,参数可以描述通过位图描述其它形状的一个或多个扫描区域。 类似地,公开了一种用于控制带电粒子束的扫描的方法,该方法包括获得一组扫描控制参数,然后通过有限状态机指定由扫描控制参数指定的带电粒子束。
    • 7. 发明授权
    • Constructing velocity models near salt bodies
    • 在盐体附近构造速度模型
    • US08885440B2
    • 2014-11-11
    • US12419567
    • 2009-04-07
    • Madhumita SenguptaRan Bachrach
    • Madhumita SenguptaRan Bachrach
    • G01V1/00G01V1/30G01V1/28
    • G01V1/303G01V1/282G01V1/306
    • A method and apparatus for constructing a velocity model of a subsurface of the earth, is disclosed herein. Seismic data may be received. A first velocity model of the subsurface may be constructed using the seismic data. The subsurface may have one or more salt bodies. A second velocity model of the subsurface without the salt bodies may be constructed using the seismic data. A set of attributes induced by the salt bodies may be determined based on the first velocity model and the second velocity model. A stiffness tensor change between the first velocity model and the second velocity model may be calculated based on the set of attributes induced by the salt bodies. The first velocity model may be updated based on the stiffness tensor change.
    • 本文公开了一种构造地球表面速度模型的方法和装置。 可以接收地震数据。 可以使用地震数据构建地下第一速度模型。 地下可能有一个或多个盐体。 可以使用地震数据构建没有盐体的地下二次速度模型。 可以基于第一速度模型和第二速度模型来确定由盐体诱导的一组属性。 第一速度模型和第二速度模型之间的刚度张量变化可以基于由盐体引起的属性集合来计算。 可以基于刚度张量变化来更新第一速度模型。
    • 10. 发明申请
    • Enhanced scanning control of charged particle beam systems
    • 增强扫描控制带电粒子束系统
    • US20060043312A1
    • 2006-03-02
    • US10931321
    • 2004-08-31
    • James SiebertLokesh JohriDennis McCartySimon VoongMadhumita SenguptaHui Wang
    • James SiebertLokesh JohriDennis McCartySimon VoongMadhumita SenguptaHui Wang
    • H01J37/147
    • H01J37/3023H01J2237/30483H01J2237/31737H01J2237/31749
    • A charged particle beam system and scanning control method capable of imaging, and possibly editing, a device under test (DUT). The charged particle beam system contains a charged particle beam generation unit, such as a focused ion beam (FIB) column, which emits a charged particle beam onto the DUT. Also included is a scan controller arrangement implementing a finite state machine to control the application of the charged particle beam onto the DUT according to a plurality of scanning control parameters. The scanning control parameters may describe one or more scan regions that are rectangular in shape. Further, the parameters may describe one or more scan regions describing other shapes by way of a bit-map. Similarly, a method for controlling the scanning of a charged particle beam that involves obtaining a set of scanning control parameters, and then directing the charged particle beam as specified by the scanning control parameters by way of a finite state machine, is disclosed.
    • 一种能够成像并可能编辑被测器件(DUT)的带电粒子束系统和扫描控制方法。 带电粒子束系统包含带电粒子束产生单元,例如聚焦离子束(FIB)柱,其将带电粒子束发射到DUT上。 还包括扫描控制器装置,其实现有限状态机以根据多个扫描控制参数来控制将带电粒子束应用到DUT上。 扫描控制参数可以描述形状为矩形的一个或多个扫描区域。 此外,参数可以描述通过位图描述其它形状的一个或多个扫描区域。 类似地,公开了一种用于控制带电粒子束的扫描的方法,该方法包括获得一组扫描控制参数,然后通过有限状态机指定由扫描控制参数指定的带电粒子束。