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1. 发明专利

DE69709413T2 未知
公开(公告)号：DE69709413T2
公开(公告)日：2002-08-01
申请号：DE69709413
申请日：1997-07-23
申请人： MITSUBISHI ELECTRIC CORP
发明人： SAKUMA HIROKAZU , OKAMURO TAKASHI , SATO YOSHIMITSU , NAKASHIMA TOSHIRO , NAKAJIMA HAJIME
IPC分类号： G01B9/02 , G01B11/00
摘要： A length measuring device of this invention is provided with: a light emitting portion for emitting laser light having a frequency f; an interference system for receiving the laser light, for generating reference light having a frequency (f + f1), for outputting the reference light straight, for generating detection light having a frequency (f + f2), and for outputting the detection light at a predetermined tilt angle; a moving detection portion for reflecting the reference light and the detection light toward the interference system; a light receiving portion for converting a reference interference wave, which is generated by the interference system, into a first sinusoidal wave electrical signal according to the aforementioned laser light and for converting a detection interference wave, which is generated from an optical-path-length difference between the reflected reference light and the reflected detection light, into a second sinusoidal wave electrical signal; a signal processing portion for generating a first cosinusoidal wave signal from the aforementioned first sinusoidal wave signal, for generating a second cosinusoidal wave signal from the aforementioned second sinusoidal wave signal, and for A/D-converting the aforementioned first sinusoidal wave signal and the aforementioned first cosinusoidal wave signal, and the aforementioned second sinusoidal wave signal and the aforementioned second cosinusoidal wave signal; and an operation portion for obtaining an electrical angle of the reference interference wave according to a ratio between the aforementioned A/D-converted first sinusoidal wave data and the aforementioned A/D-converted first cosinusoidal wave data, for obtaining an electrical angle of the detection interference wave according to a ratio between the aforementioned A/D-converted second sinusoidal wave data and the aforementioned A/D-converted second cosinusoidal wave data, for obtaining a phase difference between the reference interference wave and the detection interference wave from the aforementioned two electrical angles, and for detecting a position of the moving detection portion according to this phase difference and a wavelength of the laser light. Thus, the length measuring device of this invention can achieve the high-resolution detection of position data.

2. 发明专利

DE10325082A1 未知
公开(公告)号：DE10325082A1
公开(公告)日：2004-01-15
申请号：DE10325082
申请日：2003-06-03
申请人： MITSUBISHI ELECTRIC CORP
发明人： OHMURA YOICHI , OKA TORU , NAKASHIMA TOSHIRO , NAKAJIMA HAJIME , SAKUMA HIROKAZU , OKAMURO TAKASHI , SAKAMOTO MASAHIKO , SUGIMOTO KOICHI
IPC分类号： G01D5/34 , G01B11/26 , G01B11/02 , G01D5/244
摘要： A photoelectric rotary encoder includes a light source that emits a light beam, a returning section that returns the emitted light beam to a direction opposite to an emitting direction of the beam, and a photodetector that is disposed on a substrate on which the light source is disposed and that detects the returned light beam via a disk having a detection pattern section. The photoelectric rotary encoder detects rotational displacement of the disk based on the detected returned light beam. In this photoelectric rotary encoder, an optical element that lets a stray beam component of the light beam from the light source escape via a side surface of the optical element, is disposed in front of the substrate on which the light source and the photodetector are disposed. The optical element covers the substrate and integrates the optical element and the substrate.

3. 发明专利

DE69709413D1 未知
公开(公告)号：DE69709413D1
公开(公告)日：2002-01-31
申请号：DE69709413
申请日：1997-07-23
申请人： MITSUBISHI ELECTRIC CORP
发明人： SAKUMA HIROKAZU , OKAMURO TAKASHI , SATO YOSHIMITSU , NAKASHIMA TOSHIRO , NAKAJIMA HAJIME
IPC分类号： G01B9/02 , G01B11/00
摘要： A length measuring device of this invention is provided with: a light emitting portion for emitting laser light having a frequency f; an interference system for receiving the laser light, for generating reference light having a frequency (f + f1), for outputting the reference light straight, for generating detection light having a frequency (f + f2), and for outputting the detection light at a predetermined tilt angle; a moving detection portion for reflecting the reference light and the detection light toward the interference system; a light receiving portion for converting a reference interference wave, which is generated by the interference system, into a first sinusoidal wave electrical signal according to the aforementioned laser light and for converting a detection interference wave, which is generated from an optical-path-length difference between the reflected reference light and the reflected detection light, into a second sinusoidal wave electrical signal; a signal processing portion for generating a first cosinusoidal wave signal from the aforementioned first sinusoidal wave signal, for generating a second cosinusoidal wave signal from the aforementioned second sinusoidal wave signal, and for A/D-converting the aforementioned first sinusoidal wave signal and the aforementioned first cosinusoidal wave signal, and the aforementioned second sinusoidal wave signal and the aforementioned second cosinusoidal wave signal; and an operation portion for obtaining an electrical angle of the reference interference wave according to a ratio between the aforementioned A/D-converted first sinusoidal wave data and the aforementioned A/D-converted first cosinusoidal wave data, for obtaining an electrical angle of the detection interference wave according to a ratio between the aforementioned A/D-converted second sinusoidal wave data and the aforementioned A/D-converted second cosinusoidal wave data, for obtaining a phase difference between the reference interference wave and the detection interference wave from the aforementioned two electrical angles, and for detecting a position of the moving detection portion according to this phase difference and a wavelength of the laser light. Thus, the length measuring device of this invention can achieve the high-resolution detection of position data.

4. 发明公开

EP2457865A4 SLIDE DOOR DEVICE AND ELEVATOR 有权
标题翻译：滑动装置和电梯
公开(公告)号：EP2457865A4
公开(公告)日：2015-03-04
申请号：EP09847562
申请日：2009-07-23
申请人： MITSUBISHI ELECTRIC CORP
发明人： SHIKAI MASAHIRO , NAKASHIMA TOSHIRO , NAKAJIMA HAJIME , OKA TORU , SHIRATSUKI AKIHIDE , KURATA EMIKO , MOCHIZUKI KEITA
IPC分类号： B66B13/26 , B66B13/06
CPC分类号： B66B13/26 , B66B13/06
摘要： In a sliding door apparatus, a first lower frame is disposed on a lower portion of a first doorway, and a second lower frame is disposed on a lower portion of a second doorway. A light emitter that illuminates an illuminated surface that is a surface of the second lower frame that faces the first lower frame is disposed on a first portion of either an upper portion or a lower portion of the first doorway. A light receiver that receives light that is emitted from the light emitter and reflected by the illuminated surface is disposed on a second portion of the upper portion or the lower portion of the first doorway. A determination controlling portion determines presence or absence of an obstruction by detecting whether or not the light that is emitted from the light emitter and reflected by the illuminated surface is received by the light receiver.

5. 发明专利

DE112009001319B4 Optischer Encoder 未知
公开(公告)号：DE112009001319B4
公开(公告)日：2013-06-06
申请号：DE112009001319
申请日：2009-06-03
申请人： MITSUBISHI ELECTRIC CORP
发明人： NAKAJIMA HAJIME , NOGUCHI TAKUYA , MUSHA TAKESHI , OMURA YOUICHI , NAKASHIMA TOSHIRO , NAGATANI TATSUYA , IWAMOTO TAKASHI
IPC分类号： G01D5/244 , G01D5/36
摘要： Die vorliegende Erfindung stellt einen optischen Encoder, welcher dazu in der Lage ist, die Genauigkeit von einem Interpolationswinkel in einer einzelnen Signalspur zu erhöhen, in einem Encoder vom Typ einer Sinuswellenwinkel-Interpolation bereit. Der optische Encoder enthält eine Wellenform, bei welcher eine phasenmodulierte Welle innerhalb einer vorbestimmten Periode über eine Sinuswelle von einer Grundperiode überlagert wird, als eine Signalspur (103), und einen optischen Erfasser (104) zum Extrahieren des Sinussignals und des Kosinussignals von der phasenmodulierten Welle. Eine Betriebseinheit (106) bearbeitet individuell elektrische Winkel von den Ausgangssignalen von einem ersten optischen Erfasser-Paar und einem zweiten optischen Erfasser-Paar, welche zu dem optischen Erfasser gehoren, und bestimmt die Summe und die Differenz von den elektrischen Winkeln, wodurch der elektrische Winkel und die phasenmodulierte Welle von der Grundperiode erlangt werden.

6. 发明专利

DE112009001319T5 Optischer Encoder 未知
公开(公告)号：DE112009001319T5
公开(公告)日：2011-05-12
申请号：DE112009001319
申请日：2009-06-03
申请人： MITSUBISHI ELECTRIC CORP
发明人： NAKAJIMA HAJIME , NOGUCHI TAKUYA , MUSHA TAKESHI , OMURA YOUICHI , NAKASHIMA TOSHIRO , NAGATANI TATSUYA , IWAMOTO TAKASHI
IPC分类号： G01D5/244 , G01D5/36

7. 发明专利

DE10325082B4 未知
公开(公告)号：DE10325082B4
公开(公告)日：2008-04-30
申请号：DE10325082
申请日：2003-06-03
申请人： MITSUBISHI ELECTRIC CORP
发明人： OHMURA YOICHI , OKA TORU , NAKASHIMA TOSHIRO , NAKAJIMA HAJIME , SAKUMA HIROKAZU , OKAMURO TAKASHI , SAKAMOTO MASAHIKO , SUGIMOTO KOICHI
IPC分类号： G01B11/26 , G01B11/02 , G01D5/244 , G01D5/34
摘要： A photoelectric rotary encoder includes a light source that emits a light beam, a returning section that returns the emitted light beam to a direction opposite to an emitting direction of the beam, and a photodetector that is disposed on a substrate on which the light source is disposed and that detects the returned light beam via a disk having a detection pattern section. The photoelectric rotary encoder detects rotational displacement of the disk based on the detected returned light beam. In this photoelectric rotary encoder, an optical element that lets a stray beam component of the light beam from the light source escape via a side surface of the optical element, is disposed in front of the substrate on which the light source and the photodetector are disposed. The optical element covers the substrate and integrates the optical element and the substrate.

8. 发明公开

EP1016849A4 LENGTH MEASURING INSTRUMENT 失效
标题翻译：长度测量仪
公开(公告)号：EP1016849A4
公开(公告)日：2000-10-04
申请号：EP97932993
申请日：1997-07-23
申请人： MITSUBISHI ELECTRIC CORP
发明人： SAKUMA HIROKAZU , OKAMURO TAKASHI , SATO YOSHIMITSU , NAKASHIMA TOSHIRO , NAKAJIMA HAJIME
IPC分类号： G01B9/02 , G01B11/00
CPC分类号： G01B9/0207 , G01B9/02002 , G01B2290/45
摘要： A length measuring instrument is provided with a light emitting section which emits a laser beam having a frequency f, an interference system which generates and emits a reference beam having a frequency f+f1 in a straight line and a detection beam having a frequency f+f2 at a prescribed inclination angle upon receiving the laser beam, a movement detecting section which reflects the reference and detection beams toward the interference system, a light receiving section which converts a reference interference wave generated by the interference system into a first sine-wave electric signal and a detection interference wave produced by the difference in optical path length between the reflected reference and detection beams into a second sine-wave electric signal, a signal processing section which respectively generates first and second cosine-wave signals from the first and second sine-wave signals and A/D-converts the four signals, and an arithmetic section which finds the electrical angle of the reference interference wave, the electrical angle of the detection interference wave and the phase difference between the reference and detection interference waves from the two electrical angles, and determines the position of the moving detecting section based on the phase difference and the wavelength of the laser beam.

9. 发明专利

DE60220205T3 Sicherheitssystem für Aufzugtüren 未知
公开(公告)号：DE60220205T3
公开(公告)日：2021-04-01
申请号：DE60220205
申请日：2002-03-05
申请人： MITSUBISHI ELECTRIC CORP
发明人： SHIKAI MASAHIRO , NAKAJIMA HAJIME , NAKASHIMA TOSHIRO , TAKASHIMA KAZUO , TAKAHASHI TATSUSHI , YAMAKAWA SHIGEKI , FUJIKI TAKESHI , KOURA KUNIKAZU , NANNO KOICHI , ABE SHIGERU
IPC分类号： B66B13/26 , B66B13/28

10. 发明专利

CH699826B1 Stromversorgungseinheit für die Drahterosionsbearbeitung und Drahterosionsbearbeitungsverfahren. 未知
公开(公告)号：CH699826B1
公开(公告)日：2010-05-14
申请号：CH312003
申请日：2001-01-23
申请人： MITSUBISHI ELECTRIC CORP
发明人： NAKASHIMA TOSHIRO , HATTORI KOUICHIROU , UKAI YOSHIKAZU , TANEDA ATSUSHI , GOTO AKIHIRO , HASHIMOTO TAKASHI
IPC分类号： B23H1/02 , B23H7/00 , B23H7/04 , C01F11/18 , C05D3/02 , C09C1/02
摘要： Eine Stromversorgungseinheit für die Drahterosionsbearbeitung, welche eine Hochfrequenz-Wechselstromversorgung zur Anlegung einer hochfrequenten Wechselspannung zwischen einer Drahtelektrode (1a) und einem Werkstück (2) verwendet, enthält einen Hochfrequenz-Schwingungs- und Verstärkungsschaltkreis (4) und eine Pulsenergieversorgung (5), welche ein Mittel für die Zuführung periodischer hochfrequenter Wechselspannung zum Ausführen der Anlegung der hochfrequenten Wechselspannung zwischen der Elektrode und dem Werkstück und zum Machen einer Pause ist. In der Drahterosionsbearbeitung, welche diese Stromversorgungseinheit für die Drahterosionsbearbeitung verwendet, ist es möglich, die Vibration der Drahtelektrode (1a) infolge der elektrostatischen Kraft, welche zwischen der Drahtelektrode (1a) und dem Werkstück (2) wirkt, zu unterdrücken, wodurch es möglich wird, die Genauigkeit der Geradheit einer bearbeiteten Oberfläche des Werkstücks (2) zu verbessern und die Oberflächenrauheit klein zu halten.

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