会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Embedded DRAM system having wide data bandwidth and data transfer data protocol
    • 具有宽数据带宽和数据传输数据协议的嵌入式DRAM系统
    • US06775736B2
    • 2004-08-10
    • US10062812
    • 2002-01-31
    • Louis L. HsuRajiv J. JoshiJeremy K. StephensDaniel W. Storaska
    • Louis L. HsuRajiv J. JoshiJeremy K. StephensDaniel W. Storaska
    • G06F1200
    • G11C7/1048G06F13/4243G11C5/063G11C11/4096G11C29/846G11C2207/104
    • A self-timed data communication system for a wide data width semiconductor memory system having a plurality of data paths. The data communication system includes a plurality of data banks configured for storing data, wherein a corresponding data bank of the plurality of data banks is connected to a respective one data path of the plurality of data paths. The data communication system further includes circuitry for controlling the respective one data path in accordance with receipt of a monitor signal indicating that a data transfer operation has been initiated for transfer of data to or from the respective one data path. The circuitry for controlling includes circuitry for generating a control signal for controlling resetting of the respective one data path after data is transferred for preparation of a subsequent data transfer operation.
    • 一种具有多个数据路径的宽数据宽度半导体存储器系统的自定时数据通信系统。 数据通信系统包括被配置为存储数据的多个数据库,其中多个数据库中的相应数据库连接到多个数据路径中相应的一个数据路径。 数据通信系统还包括用于根据接收到指示数据传送操作已被启动以用于将数据传送到相应的一个数据路径或从相应的一个数据路径传送数据的监视信号来控制相应的一个数据路径的电路。 用于控制的电路包括用于产生控制信号的电路,该控制信号用于在传送数据以准备随后的数据传送操作之后控制相应的一个数据路径的复位。
    • 2. 发明授权
    • Semiconductor memory system having a data clock system for reliable high-speed data transfers
    • 具有用于可靠的高速数据传输的数据时钟系统的半导体存储器系统
    • US06614714B2
    • 2003-09-02
    • US10055149
    • 2002-01-22
    • Louis L. HsuJeremy K. StephensDaniel W. StoraskaLi-Kong Wang
    • Louis L. HsuJeremy K. StephensDaniel W. StoraskaLi-Kong Wang
    • G11C818
    • G11C7/222G11C7/1006G11C7/1072G11C2207/104
    • A data clock system for a semiconductor memory system is provided for performing reliable high-speed data transfers. The semiconductor memory system includes a plurality of data banks configured for storing data, the plurality of data banks in operative communication with a plurality of first data paths, each first data path in operative communication with a second data path. The data clock system includes a first clock path receiving a clock signal during a data transfer operation for transferring data between one data bank of the plurality of data banks and the second data path via one of the plurality of first data paths; and a second clock path receiving the clock signal from the first clock path and propagating the clock signal along therethrough, the second clock path including at least one clock driver. The transfer of data between the one of the plurality of first data paths and the second data path occurs upon receipt of the clock signal by the at least one clock driver. A method for propagating a clock signal in a semiconductor memory system is also provided for performing reliable high-speed data transfers. In the inventive system and method the clock signal is delayed during propagation along the first clock path and the second clock path by approximately the same amount of time regardless if the at least one clock driver is positioned proximate a far end of the second clock path or the at least one clock driver is positioned proximate a near end of the second clock path.
    • 提供了一种用于半导体存储器系统的数据时钟系统,用于执行可靠的高速数据传输。 半导体存储器系统包括被配置为存储数据的多个数据库,所述多个数据库与多个第一数据路径可操作地通信,每个第一数据路径与第二数据路径可操作地通信。 数据时钟系统包括在数据传输操作期间接收时钟信号的第一时钟路径,用于经由多个第一数据路径中的一个数据路径在多个数据库的一个数据组和第二数据路径之间传送数据; 以及第二时钟路径,从第一时钟路径接收时钟信号并且沿着其传播时钟信号,第二时钟路径包括至少一个时钟驱动器。 在所述至少一个时钟驱动器接收到所述时钟信号之后,发生所述多个第一数据路径中的一个数据路径和所述第二数据路径之间的数据传送。 还提供了用于在半导体存储器系统中传播时钟信号的方法,用于执行可靠的高速数据传输。 在本发明的系统和方法中,时钟信号在沿着第一时钟路径和第二时钟路径传播期间被延迟大约相同的时间量,而不管至少一个时钟驱动器位于第二时钟路径的远端附近, 至少一个时钟驱动器位于第二时钟路径的近端附近。
    • 3. 发明授权
    • DRAM direct sensing scheme
    • DRAM直接感测方案
    • US06449202B1
    • 2002-09-10
    • US09929593
    • 2001-08-14
    • Hiroyuki AkatsuLouis L. HsuJeremy K. StephensDaniel W. Storaska
    • Hiroyuki AkatsuLouis L. HsuJeremy K. StephensDaniel W. Storaska
    • G11C700
    • G11C7/062G11C11/4091
    • A direct sensing circuit and method for reading data from a memory cell connected to a bitline, with open bitline sensing without using a reference bitline signal, onto a data line in a data read operation. Prior to the data read operation, both the bitline and the data line are precharged to precharge voltages and a sense node is precharged to ground. A pFET device has its gate coupled to a signal developed on the bitline from the memory cell to detect and amplify the signal level thereof, and has its source coupled to a voltage source and its drain coupled to a sense node, such that the signal developed on the bitline determines the degree of turn-on of the pFET device. An nFET device has its gate coupled to the sense node to detect and amplify the signal level thereof, and has its drain coupled to the data line. When sensing a low data signal, the signal developed on the bitline causes subthreshold voltage leakage current through the pFET device to charge the gate of the nFET device which is floating to amplify the signal developed on the bitline to pull down the precharged data line. When sensing a high data signal, the pFET device and the nFET device remain inactivated, and the data line remains at its precharge high voltage. An nFET writeback device is coupled between the data line and the bitline which is switched on to begin a data writeback into the memory cell when the signal develops on the data line.
    • 一种直接感测电路和方法,用于在数据读取操作中在数据线上从连接到位线的存储器单元读取数据,并且将数据线开放位线检测而不使用参考位线信号。 在数据读取操作之前,位线和数据线都被预充电到预充电电压,并且感测节点被预充电到地。 pFET器件的栅极耦合到从存储器单元在位线上产生的信号,以检测和放大其信号电平,并且其源极耦合到耦合到感测节点的电压源及其漏极,使得信号发展 位线决定了pFET器件导通的程度。 nFET器件的栅极耦合到感测节点以检测和放大其信号电平,并且其漏极耦合到数据线。 当感测到低数据信号时,在位线上产生的信号导致通过pFET器件的阈值电压漏电流,以对nFET器件的栅极进行充电,该nFET器件的栅极被浮置以放大在位线上产生的信号,以将预充电的数据线拉下来。 当感测高数据信号时,pFET器件和nFET器件保持不激活,并且数据线保持在其预充电高电压。 当在数据线上产生信号时,nFET写回装置耦合在数据线和打开的位线之间,以开始对存储器单元的数据写回。
    • 4. 发明授权
    • Single bitline direct sensing architecture for high speed memory device
    • 用于高速存储器件的单位线直接感测架构
    • US06552944B2
    • 2003-04-22
    • US09870755
    • 2001-05-31
    • John A. FifieldToshiaki KirihataWing K. LukJeremy K. StephensDaniel W. Storaska
    • John A. FifieldToshiaki KirihataWing K. LukJeremy K. StephensDaniel W. Storaska
    • G11C702
    • G11C7/067G11C7/062G11C11/4091
    • A single bitline direct sensing architecture employs a 4 transistor sense amplifier circuit located in each memory array, wherein the transistors function to selectively transfer data bits from either a true bitline or a complement bitline of the bitline pair to a data line. The data line is preferably arranged over a plurality of memory arrays. The data line may or may not be shared for the read and write operations. One current source is additionally used to precharge the datalines in a read mode, performing the function of a digital sensing scheme by detecting a resistance ratio between the current source and the transistor driven by the bitline for the corresponding array. A simple inverter may be used for detecting a level of the data line determined by the resistance ratio. The bitline pair is sensed in a single ended fashion, eliminating the need for a cross-coupled pair of CMOS devices, and thus reducing the required layout area. By accessing the bitline pair individually, two sets of control signals for the pre-charge, EQ0, EQ1, are developed to allow for bitline shielding in the array.
    • 单个位线直接感测架构采用位于每个存储器阵列中的4晶体管读出放大器电路,其中晶体管用于选择性地将数据位从位线对的真位置或补码位线传送到数据线。 数据线优选地布置在多个存储器阵列上。 读取和写入操作可能共享或不共享数据行。 一个电流源另外用于在读取模式下对数据进行预充电,通过检测电流源和由相应阵列的位线驱动的晶体管之间的电阻比来执行数字感测方案的功能。 可以使用简单的逆变器来检测由电阻比确定的数据线的电平。 以单端方式检测位线对,消除了对交叉耦合的CMOS器件的需要,从而减少了所需的布局面积。 通过单独访问位线对,开发了用于预充电EQ0,EQ1的两组控制信号,以允许阵列中的位线屏蔽。
    • 7. 发明授权
    • Programmable impedance matching circuit and method
    • 可编程阻抗匹配电路及方法
    • US07145413B2
    • 2006-12-05
    • US10250177
    • 2003-06-10
    • Louis L. HsuJoseph NatonioDaniel W. StoraskaWilliam F. Washburn
    • Louis L. HsuJoseph NatonioDaniel W. StoraskaWilliam F. Washburn
    • H03H7/38
    • H03H7/38
    • As disclosed herein, a microelectronic circuit and method are provided for improving signal integrity at a transmission line. The circuit includes a programmably adjustable impedance matching circuit which is coupled to a transmission line which includes a programmably adjustable inductive element. The programmably adjustable impedance matching circuit is desirably provided on the same chip as a receiver or transmitter to which the transmission line is coupled, or alternatively, on an element packaged together with the chip that includes the receiver or transmitter. The impedance of the programmably adjustable impedance matching circuit is adjustable in response to control input to improve signal integrity at the transmission line.
    • 如本文所公开的,提供微电子电路和方法来改善传输线处的信号完整性。 该电路包括可编程调节的阻抗匹配电路,其耦合到包括可编程调节的电感元件的传输线。 可编程可调节阻抗匹配电路理想地设置在与传输线耦合的接收器或发射器相同的芯片上,或者替代地在与包括接收器或发射器的芯片一起封装的元件上。 可编程可调阻抗匹配电路的阻抗可以响应于控制输入而调节,以改善传输线处的信号完整性。
    • 8. 发明授权
    • Method and configuration to allow a lower wordline boosted voltage operation while increasing a sensing signal with access transistor threshold voltage
    • 方法和配置允许在增加具有存取晶体管阈值电压的感测信号的同时降低字线升压电压操作
    • US06751152B2
    • 2004-06-15
    • US09999379
    • 2001-10-31
    • Louis L. HsuToshiaki K. KirihataDaniel W. Storaska
    • Louis L. HsuToshiaki K. KirihataDaniel W. Storaska
    • G11C800
    • G11C11/4085G11C7/065G11C11/4091
    • A memory array architecture employs a full Vdd bitline precharged voltage and a low wordline boost voltage, which is less than Vdd plus the threshold voltage of the access transistor. In a write mode, a first low level of a data bit is almost fully written to a storage element, however a second high level of the data bit is not fully written to the storage element. In a read mode, the first low level of the data bit is fully read out from the storage element, however the second high level of the data bit is not read out by utilizing the access transistor threshold voltage. This allows a sensing signal only with the first voltage level transfer to the Vdd precharged BL. A reference WL is preferably used for generating a reference bitline voltage for a differential Vdd sensing scheme. Alternatively, a single BL digital sensing scheme may be used. Lowering the wordline voltage results in a reduction in power consumption by saving power on Vpp generator and support circuits, and a reduction in the size of the Vpp generator and support circuits, and also eliminates high Vpp voltage related problems such as dielectric breakdown and other reliability concerns while avoiding a complex decoding scheme and saving cost.
    • 存储器阵列架构采用全Vdd位线预充电电压和低字线升压电压,其小于Vdd加上存取晶体管的阈值电压。 在写入模式中,数据位的第一低电平几乎完全写入存储元件,然而数据位的第二高电平未完全写入存储元件。 在读取模式下,数据位的第一低电平从存储元件完全读出,然而数据位的第二高电平不通过利用存取晶体管阈值电压被读出。 这允许感测信号仅在第一电压电平传输到Vdd预充电BL。 参考WL优选地用于产生用于差分Vdd感测方案的参考位线电压。 或者,可以使用单个BL数字感测方案。 降低字线电压通过节省Vpp发生器和支持电路上的功率以及减小Vpp发生器和支持电路的尺寸而降低功耗,并且消除了与Vpp电压相关的高电压问题,例如介质击穿和其他可靠性 同时避免复杂的解码方案并节省成本。