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    • 6. 发明授权
    • X-ray compton scatter imaging on volumetric CT systems
    • 体积CT系统的X射线压缩分散成像
    • US08995609B2
    • 2015-03-31
    • US13565337
    • 2012-08-02
    • Lei ZhuTianye Niu
    • Lei ZhuTianye Niu
    • A61B6/00G01N23/04G21K1/02A61B6/03
    • G01N23/046A61B6/032A61B6/4078A61B6/4233A61B6/483A61B6/508G01N2223/419G01N2223/612G21K1/02G21K2207/005
    • Briefly described, in an exemplary form, the present invention discloses a system, method and apparatus for X-ray Compton scatter imaging. In one exemplary embodiment, the present invention uses two detectors in a volumetric CT system. A first detector is positioned generally in-line with the angle of attack of the incoming energy, or, generally in-line of path x, where x is the path of the incoming energy. The first, or primary, detector detects various forms of radiation emanating from an object undergoing testing. In some embodiments, the present invention further comprises a Compton scattering system positioned generally normal to path x. In some embodiments, the Compton scattering subsystem comprises a second detector and a pin-hole collimator. The second detector detects Compton scattering energy from the object being tested.
    • 简要描述,在示例性形式中,本发明公开了一种用于X射线康普顿散射成像的系统,方法和装置。 在一个示例性实施例中,本发明在体积CT系统中使用两个检测器。 第一检测器通常与入射能量的迎角定位,或者通常沿着路径x排列,其中x是入射能量的路径。 第一或第一检测器检测从经历测试的对象发出的各种形式的辐射。 在一些实施例中,本发明还包括通常垂直于路径x定位的康普顿散射系统。 在一些实施例中,康普顿散射子系统包括第二检测器和针孔准直器。 第二个检测器检测来自被测物体的康普顿散射能量。
    • 8. 发明授权
    • Semiconductor optical device
    • 半导体光学器件
    • US08809906B2
    • 2014-08-19
    • US13613177
    • 2012-09-13
    • Lei ZhuShigeaki SekiguchiShinsuke TanakaKenichi Kawaguchi
    • Lei ZhuShigeaki SekiguchiShinsuke TanakaKenichi Kawaguchi
    • H01L31/102
    • G02B6/122G02B6/29352G02B2006/121G02F1/025H01L31/105
    • A semiconductor optical device includes a first clad layer, a second clad layer and an optical waveguide layer sandwiched between the first clad layer and the second clad layer, wherein the optical waveguide layer includes a first semiconductor layer, a second semiconductor layer disposed on the first semiconductor layer and extending in one direction, and a third semiconductor layer covering a top surface of the second semiconductor layer, and wherein the first semiconductor layer includes an n-type region disposed on one side of the second semiconductor layer, a p-type region disposed on the other side of the second semiconductor layer, and an i-type region disposed between the n-type region and the p-type region, and wherein the second semiconductor layer has a band gap narrower than band gaps of the first semiconductor layer and the third semiconductor layer.
    • 半导体光学器件包括第一覆盖层,第二覆盖层和夹在第一覆盖层和第二覆盖层之间的光波导层,其中,光波导层包括第一半导体层,第二半导体层,设置在第一覆盖层 半导体层并且沿一个方向延伸,以及覆盖第二半导体层的顶表面的第三半导体层,并且其中第一半导体层包括设置在第二半导体层一侧的n型区域,p型区域 设置在第二半导体层的另一侧,以及设置在n型区域和p型区域之间的i型区域,并且其中第二半导体层具有比第一半导体层的带隙窄的带隙 和第三半导体层。
    • 9. 发明授权
    • Scatter correction methods
    • 分散校正方法
    • US08705827B2
    • 2014-04-22
    • US13088134
    • 2011-04-15
    • Lei ZhuTianye Niu
    • Lei ZhuTianye Niu
    • G06K9/00
    • G06T5/002G06T5/50G06T11/005G06T2207/10081G06T2207/20224
    • Described herein are improved methods for correcting cone beam computed tomography signals to reduce scatter contamination contained therein. Generally, the improved methods involve generating a plurality of two-dimensional projection images of a subject from a three-dimensional multi-detector computed tomography image of the subject. This is followed by subtracting the plurality of two-dimensional projection images from a plurality of two-dimensional cone beam projection images of the subject to produce a plurality of two-dimensional estimated error projections that comprise an estimated error in the plurality of two-dimensional cone beam projection images. The plurality of two-dimensional estimated error projection images are subtracted from the plurality of two-dimensional cone beam projection images to generate a plurality of two-dimensional corrected cone beam projection images. A three-dimensional corrected cone beam computed tomography image of the subject is then constructed from the plurality of two-dimensional corrected cone beam projection images.
    • 这里描述了用于校正锥形束计算机断层摄影信号以减少其中包含的散射污染的改进方法。 通常,改进的方法包括从受试者的三维多检测器计算机断层摄影图像生成受试者的多个二维投影图像。 随后从对象的多个二维锥形束投影图像中减去多个二维投影图像,以产生多个二维估计误差投影,其包括多个二维投影图像中的估计误差 锥形投影图像。 从多个二维锥形束投影图像中减去多个二维估计误差投影图像,以产生多个二维校正锥束投影图像。 然后从多个二维校正的锥形束投影图像中构建被摄体的三维校正锥束计算机断层摄影图像。
    • 10. 发明申请
    • X-RAY COMPTON SCATTER IMAGING ON VOLUMETRIC CT SYSTEMS
    • 体积CT系统的X射线压缩扫描成像
    • US20130032715A1
    • 2013-02-07
    • US13565337
    • 2012-08-02
    • Lei ZhuTianye Niu
    • Lei ZhuTianye Niu
    • G01N23/02G21K1/02A61B6/03
    • G01N23/046A61B6/032A61B6/4078A61B6/4233A61B6/483A61B6/508G01N2223/419G01N2223/612G21K1/02G21K2207/005
    • Briefly described, in an exemplary form, the present invention discloses a system, method and apparatus for X-ray Compton scatter imaging. In one exemplary embodiment, the present invention uses two detectors in a volumetric CT system. A first detector is positioned generally in-line with the angle of attack of the incoming energy, or, generally in-line of path x, where x is the path of the incoming energy. The first, or primary, detector detects various forms of radiation emanating from an object undergoing testing. In some embodiments, the present invention further comprises a Compton scattering system positioned generally normal to path x. In some embodiments, the Compton scattering subsystem comprises a second detector and a pin-hole collimator. The second detector detects Compton scattering energy from the object being tested.
    • 简要描述,在示例性形式中,本发明公开了一种用于X射线康普顿散射成像的系统,方法和装置。 在一个示例性实施例中,本发明在体积CT系统中使用两个检测器。 第一检测器通常与入射能量的迎角定位,或者通常沿着路径x排列,其中x是入射能量的路径。 第一或第一检测器检测从经历测试的对象发出的各种形式的辐射。 在一些实施例中,本发明还包括通常垂直于路径x定位的康普顿散射系统。 在一些实施例中,康普顿散射子系统包括第二检测器和针孔准直器。 第二个检测器检测来自被测物体的康普顿散射能量。