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1. 发明申请

US20060121203A1 Thin film and method for manufacturing same 审中-公开
标题翻译：薄膜及其制造方法
公开(公告)号：US20060121203A1
公开(公告)日：2006-06-08
申请号：US10527712
申请日：2003-09-11
申请人： Kuniko Kimura , Kei Kobayashi , Hirofumi Yamada , Toshihisa Horiuchi , Kenji Ishida , Kazumi Matsushige
发明人： Kuniko Kimura , Kei Kobayashi , Hirofumi Yamada , Toshihisa Horiuchi , Kenji Ishida , Kazumi Matsushige
IPC分类号： B05D1/36
CPC分类号： B01J19/0013 , B01J19/1887 , B82B3/00 , G01Q80/00
摘要： A totally new method for manufacturing a thin film wherein only an arbitrary small region is structurally controlled. The structure of a film is controlled by applying a force to the entire film or an arbitrary region of the film using a part having a sharp tip during the film-forming process or after finishing the film formation. At this time, the temperature of the film is set at the glass transition point of the amorphous region or higher. An atomic force microscope can be used as an apparatus for realizing this manufacturing method.
摘要翻译：一种全新的制造薄膜的方法，其中只有结构上控制任意的小区域。通过在成膜过程中或在成膜完成之后，使用具有尖锐尖端的部分在膜的整个膜或任意区域上施加力来控制膜的结构。此时，将膜的温度设定在非晶区域的玻璃化转变点以上。原子力显微镜可以用作实现该制造方法的装置。

2. 发明申请

US20100219819A1 APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT 有权
标题翻译：设备和方法通过测量领域获得
公开(公告)号：US20100219819A1
公开(公告)日：2010-09-02
申请号：US12594050
申请日：2008-03-28
申请人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige , Takashi Horiuchi , Nobuo Satoh , Akifumi Nakai
发明人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige , Takashi Horiuchi , Nobuo Satoh , Akifumi Nakai
IPC分类号： G01R33/02 , G01Q60/08
CPC分类号： G01R33/10 , G01Q30/04 , G01Q60/50 , G01R33/0206 , G01R33/0385
摘要： Above the sample (9) having magnetic domains, a distribution of magnetic force in a measurement plane (91) is obtained as a magnetic force image with use of a MFM, an auxiliary magnetic force image is obtained by performing measurement in a measurement plane (92) away from the measurement plane (91) by a minute distance d, and a difference between them is divided by the minute distance d to obtain a magnetic force gradient image. The magnetic force image and the auxiliary magnetic force image are Fourier transformed and substituted into a three-dimensional field obtaining equation derived from a general solution of the Laplace equation, and the three-dimensional field indicating the magnetic force is obtained with high accuracy. A state of the magnetic domains at the surface (93) of the sample (9) can be obtained with high accuracy by obtaining the three-dimensional field. The three-dimensional field obtaining method using the three-dimensional field obtaining equation can be used for various fields of magnetic, electric, temperature and gravity potential and so on satisfying the Laplace equation. The obtaining of the three-dimensional field can be extended to obtaining of an n-dimensional field having high-dimension.
摘要翻译：在具有磁畴的样品（9）上方，通过使用MFM获得在测量平面（91）中的磁力分布作为磁力图像，通过在测量平面中进行测量获得辅助磁力图像（ 92）远离测量平面（91）微小的距离d，并且它们之间的差除以微小距离d以获得磁力梯度图像。将磁力图像和辅助磁力图像进行傅里叶变换并代入由拉普拉斯方程的一般解导出的三维场获得方程，并且以高精度获得表示磁力的三维场。通过获得三维场，可以高精度地获得样品（9）的表面（93）处的磁畴的状态。使用三维场获得方程的三维场获取方法可以用于满足拉普拉斯方程的磁，电，温度和重力等各种领域。可以将三维场的获得扩展到获得具有高维度的n维场。

3. 发明申请

US20110247107A1 METHOD FOR PROCESSING OUTPUT OF SCANNING TYPE PROBE MICROSCOPE, AND SCANNING TYPE PROBE MICROSCOPE 失效
标题翻译：扫描型探针显微镜输出方法及扫描型探针显微镜
公开(公告)号：US20110247107A1
公开(公告)日：2011-10-06
申请号：US13133595
申请日：2009-12-07
申请人： Eika Tsunemi , Nobuo Satoh , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Eika Tsunemi , Nobuo Satoh , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： G01Q20/02
CPC分类号： G01Q20/02
摘要： Incident light 19 emitted from a laser light source 18 is reflected on an upper surface of a cantilever 13, so that reflected light 19a enters light detection means 20. Since the incident light 19 and the reflected light 19a are in a plane not including a long axis of the cantilever 13, movements of the reflected light 19a due to change in a deflection amount θ of the cantilever 13 and due to change in a fine vertical movement amount z thereof are different in direction on the light detection means 20. This enables the change in the deflection amount θ of the cantilever 13 and the change in the fine vertical movement amount z thereof to be separated from output of the light detection means 20.
摘要翻译：从激光光源18发射的入射光19在悬臂13的上表面上被反射，使得反射光19a进入光检测装置20.由于入射光19和反射光19a处于不包括长的悬臂13的轴线，由于偏转量的变化引起的反射光19a的运动; 并且由于其微小的垂直移动量z的变化在光检测装置20上的方向不同。这使得偏转量的变化是可能的。并且其微细垂直移动量z的变化与光检测装置20的输出分离。

4. 发明授权

US07829863B2 Electron beam irradiation device 有权
标题翻译：电子束照射装置
公开(公告)号：US07829863B2
公开(公告)日：2010-11-09
申请号：US11920420
申请日：2005-11-18
申请人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： G21K1/08
CPC分类号： H01J37/3175 , B82Y10/00 , B82Y40/00 , H01J37/073 , H01J37/3174 , H01J2237/06333 , H01J2237/06358 , H01J2237/31779 , H01J2237/31794
摘要： An electron beam irradiation device of the present invention includes: a projector 8 for generating a two-dimensional light pattern 13; a microchannel plate 11 for (i) generating an electron beam array based on the light pattern 13 having entered, (ii) amplifying the electron beam array, and (iii) emitting the electron beam array as an amplified electron beam array 14; and an electron beam lens section 12 for converging the amplified electron beam array 14. This electron beam irradiation device is capable of manufacturing a semiconductor device whose performance is improved through a finer processing by means of irradiation using an electron beam. Further, the electron beam irradiation device allows cost reduction, because the device allows collective irradiation using a two dimensional pattern.
摘要翻译：本发明的电子束照射装置包括：用于产生二维光图案13的投影仪8; 微通道板11，用于（i）基于已经进入的光图案13产生电子束阵列，（ii）放大电子束阵列，和（iii）发射电子束阵列作为放大的电子束阵列14; 以及用于会聚放大的电子束阵列14的电子束透镜部分12.该电子束照射装置能够通过使用电子束的照射通过更精细的处理来制造其性能得到改善的半导体器件。此外，电子束照射装置允许成本降低，因为该装置允许使用二维图案的集体照射。

5. 发明授权

US08796654B2 Scan device for microscope measurement instrument 有权
标题翻译：扫描仪用于显微镜测量仪器
公开(公告)号：US08796654B2
公开(公告)日：2014-08-05
申请号：US13056293
申请日：2008-07-31
申请人： Masahiro Ohta , Noriaki Oyabu , Kenjiro Kimura , Shinichiro Ido , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Masahiro Ohta , Noriaki Oyabu , Kenjiro Kimura , Shinichiro Ido , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： G01N21/86 , G01V8/00 , G01N35/10 , G01Q10/06 , H01J37/20 , H01J37/26 , H01J37/28 , B82Y35/00
CPC分类号： G01N35/1011 , B82Y35/00 , G01Q10/065 , H01J37/20 , H01J37/265 , H01J37/28 , H01J2237/20228
摘要： A probe needle is successively moved to a plurality of measurement points set in a measurement region on a sample so as to measure a z-displacement amount. An excitation control unit feedback-controls a piezoelectric element so that a vibration amplitude of a cantilever is constant in accordance with the detection output by a displacement detection unit. Moreover, a vertical displacement control unit feedback-controls a vertical position scan unit so as to obtain a constant distance between the probe needle and the sample according to a frequency shift by a frequency detection unit. When changes of outputs of two feedback loops at a certain measurement point are both within a predetermined range, a main control unit issues an instruction to a horizontal position control unit to rapidly move to the next measurement point. As a result, it is possible to adaptively decide such a measurement time that both of the two feedback controls at respective measurement points are established. This eliminates an unnecessary measurement time, which in turn reduces the time required for creating one convex/concave image as compared to the conventional technique and improves the throughput.
摘要翻译：将探针连续地移动到设置在样本上的测量区域中的多个测量点，以测量z位移量。激励控制单元根据位移检测单元的检测输出反馈控制压电元件，使得悬臂的振动振幅恒定。此外，垂直位移控制单元反馈控制垂直位置扫描单元，以便通过频率检测单元根据频移获得探针和样本之间的恒定距离。当在某个测量点处的两个反馈回路的输出的变化都在预定范围内时，主控制单元向水平位置控制单元发出指令以快速移动到下一个测量点。结果，可以自适应地确定建立各测量点的两个反馈控制两者的测量时间。这消除了不必要的测量时间，这又减少了与传统技术相比创建一个凸/凹图像所需的时间并且提高了吞吐量。

6. 发明申请

US20110261352A1 Scan Device 有权
标题翻译：扫描设备
公开(公告)号：US20110261352A1
公开(公告)日：2011-10-27
申请号：US13056293
申请日：2008-07-31
申请人： Masahiro Ohta , Noriaki Oyabu , Kenjiro Kimura , Shinichiro Ido , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Masahiro Ohta , Noriaki Oyabu , Kenjiro Kimura , Shinichiro Ido , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： G01N21/01
CPC分类号： G01N35/1011 , B82Y35/00 , G01Q10/065 , H01J37/20 , H01J37/265 , H01J37/28 , H01J2237/20228
摘要： A probe needle is successively moved to a plurality of measurement points set in a measurement region on a sample so as to measure a z-displacement amount. An excitation control unit feedback-controls a piezoelectric element so that a vibration amplitude of a cantilever is constant in accordance with the detection output by a displacement detection unit. Moreover, a vertical displacement control unit feedback-controls a vertical position scan unit so as to obtain a constant distance between the probe needle and the sample according to a frequency shift by a frequency detection unit. When changes of outputs of two feedback loops at a certain measurement point are both within a predetermined range, a main control unit issues an instruction to a horizontal position control unit to rapidly move to the next measurement point. As a result, it is possible to adaptively decide such a measurement time that both of the two feedback controls at respective measurement points are established. This eliminates an unnecessary measurement time, which in turn reduces the time required for creating one convex/concave image as compared to the conventional technique and improves the throughput.
摘要翻译：将探针连续地移动到设置在样本上的测量区域中的多个测量点，以测量z位移量。激励控制单元根据位移检测单元的检测输出反馈控制压电元件，使得悬臂的振动振幅恒定。此外，垂直位移控制单元反馈控制垂直位置扫描单元，以便通过频率检测单元根据频移获得探针和样本之间的恒定距离。当在某个测量点处的两个反馈回路的输出的变化都在预定范围内时，主控制单元向水平位置控制单元发出指令以快速移动到下一个测量点。结果，可以自适应地确定建立各测量点的两个反馈控制两者的测量时间。这消除了不必要的测量时间，这又减少了与传统技术相比创建一个凸/凹图像所需的时间并且提高了吞吐量。

7. 发明申请

US20080119008A1 Molecular Device and Manufacturing Method for the Same 审中-公开
标题翻译：分子装置及其制造方法
公开(公告)号：US20080119008A1
公开(公告)日：2008-05-22
申请号：US11661316
申请日：2005-08-30
申请人： Yuji Miyato , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Yuji Miyato , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： H01L51/40
CPC分类号： H01L51/0049 , B81C1/00031 , B81C2201/0149 , B81C2201/0198 , B82Y10/00 , B82Y30/00 , H01L29/0665 , H01L29/0673 , H01L51/0048 , H01L51/0575
摘要： A molecular device of the present invention is arranged so that a self-organizing monomolecular layer is formed on an oxide layer made of an oxide of a substrate by being chemically bonded with the surface of the oxide layer, and nano structures are formed on the monomolecular film. With this arrangement, the present invention provides a molecular device which causes less interaction between the substrate and nanostructures arranged on the substrate, thereby realizing easier control of orientation of nano structures on the substrate. The present invention also provides a manufacturing method of the molecular device.
摘要翻译：本发明的分子装置被配置成通过与氧化物层的表面化学键合而在由氧化物的氧化物构成的氧化物层上形成自组织单分子层，并且在单分子层上形成纳米结构电影。通过这种布置，本发明提供了一种分子器件，其在衬底和布置在衬底上的纳米结构之间引起较少的相互作用，从而实现了更容易地控制衬底上的纳米结构的取向。本发明还提供了分子装置的制造方法。

8. 发明授权

US08225418B2 Method for processing output of scanning type probe microscope, and scanning type probe microscope 失效
标题翻译：扫描型探针显微镜输出处理方法及扫描型探针显微镜
公开(公告)号：US08225418B2
公开(公告)日：2012-07-17
申请号：US13133595
申请日：2009-12-07
申请人： Eika Tsunemi , Nobuo Satoh , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Eika Tsunemi , Nobuo Satoh , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： G01Q20/02 , G01B11/30 , G01B5/28
CPC分类号： G01Q20/02
摘要： Incident light 19 emitted from a laser light source 18 is reflected on an upper surface of a cantilever 13, so that reflected light 19a enters light detection means 20. Since the incident light 19 and the reflected light 19a are in a plane not including a long axis of the cantilever 13, movements of the reflected light 19a due to change in a deflection amount θ of the cantilever 13 and due to change in a fine vertical movement amount z thereof are different in direction on the light detection means 20. This enables the change in the deflection amount θ of the cantilever 13 and the change in the fine vertical movement amount z thereof to be separated from output of the light detection means 20.
摘要翻译：从激光光源18发射的入射光19在悬臂13的上表面上被反射，使得反射光19a进入光检测装置20.由于入射光19和反射光19a处于不包括长的悬臂13的轴线，由于偏转量的变化引起的反射光19a的运动; 并且由于其微小的垂直移动量z的变化在光检测装置20上的方向不同。这使得偏转量的变化是可能的。并且其微细垂直移动量z的变化与光检测装置20的输出分离。

9. 发明申请

US20090127473A1 Electron Beam Irradiation Device 有权
标题翻译：电子束照射装置
公开(公告)号：US20090127473A1
公开(公告)日：2009-05-21
申请号：US11920420
申请日：2005-11-18
申请人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
发明人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige
IPC分类号： H01J3/14 , A61N5/00
CPC分类号： H01J37/3175 , B82Y10/00 , B82Y40/00 , H01J37/073 , H01J37/3174 , H01J2237/06333 , H01J2237/06358 , H01J2237/31779 , H01J2237/31794
摘要： An electron beam irradiation device of the present invention includes: a projector 8 for generating a two-dimensional light pattern 13; a microchannel plate 11 for (i) generating an electron beam array based on the light pattern 13 having entered, (ii) amplifying the electron beam array, and (iii) emitting the electron beam array as an amplified electron beam array 14; and an electron beam lens section 12 for converging the amplified electron beam array 14. This electron beam irradiation device is capable of manufacturing a semiconductor device whose performance is improved through a finer processing by means of irradiation using an electron beam. Further, the electron beam irradiation device allows cost reduction, because the device allows collective irradiation using a two dimensional pattern.
摘要翻译：本发明的电子束照射装置包括：用于产生二维光图案13的投影仪8; 微通道板11，用于（i）基于已经进入的光图案13产生电子束阵列，（ii）放大电子束阵列，和（iii）发射电子束阵列作为放大的电子束阵列14; 以及用于会聚放大电子束阵列14的电子束透镜部分12.该电子束照射装置能够通过使用电子束的照射通过更精细的处理来制造其性能得到改善的半导体器件。此外，电子束照射装置允许成本降低，因为该装置允许使用二维图案的集体照射。

10. 发明授权

US08536862B2 Apparatus and method of obtaining field by measurement 有权
标题翻译：通过测量获得场的装置和方法
公开(公告)号：US08536862B2
公开(公告)日：2013-09-17
申请号：US12594050
申请日：2008-03-28
申请人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige , Takashi Horiuchi , Nobuo Satoh , Akifumi Nakai
发明人： Kenjiro Kimura , Kei Kobayashi , Hirofumi Yamada , Kazumi Matsushige , Takashi Horiuchi , Nobuo Satoh , Akifumi Nakai
IPC分类号： G01R33/02
CPC分类号： G01R33/10 , G01Q30/04 , G01Q60/50 , G01R33/0206 , G01R33/0385
摘要： Above a sample (9) having magnetic domains, a distribution of magnetic force in a measurement plane (91) is obtained as a magnetic force image using a MFM, an auxiliary magnetic force image is obtained by performing measurement in a measurement plane (92) away from the measurement plane (91) by a distance d, and a difference between them is divided by the distance d to obtain a magnetic force gradient image. The magnetic force image and the auxiliary magnetic force image are Fourier transformed and substituted into a three-dimensional field obtaining equation derived from a general solution of the Laplace equation, and the three-dimensional field indicating the magnetic force is obtained. A state of the magnetic domains at the surface (93) of the sample (9) can be obtained with high accuracy by obtaining the three-dimensional field.
摘要翻译：在具有磁畴的样品（9）之上，通过使用MFM获得测量平面（91）中的磁力分布作为磁力图像，通过在测量平面（92）中进行测量来获得辅助磁力图像，离开测量平面（91）距离d，并且将它们之间的差除以距离d以获得磁力梯度图像。将磁力图像和辅助磁力图像进行傅立叶变换并代入由拉普拉斯方程的一般解导出的三维场获得方程式，得到表示磁力的三维场。通过获得三维场，可以高精度地获得样品（9）的表面（93）处的磁畴的状态。

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