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    • 2. 发明申请
    • X-RAY EXAMINATION APPARATUS INCLUDING A CONTROL LOOP FOR ADJUSTING THE X-RAY FLUX
    • X射线检查装置,包括用于调整X射线通量的控制环
    • WO0036884A3
    • 2001-01-04
    • PCT/EP9909355
    • 1999-12-01
    • KONINKL PHILIPS ELECTRONICS NV
    • SNOEREN RUDOLPH MLINDERS PETRUS W JNEDERPELT CHRISTIANUS G L
    • G21K5/00A61B6/00G21K5/02H05G1/36H05G1/44H05G1/64H04N5/235
    • H05G1/36
    • An X-ray examination apparatus comprises an X-ray source (1) for emitting an X-ray beam, an X-ray detector (6) for detecting an X-ray image and converting it into an optical image and a video extractor (8) which is coupled to the X-ray detector (6) via an optical coupling means (9). The optical coupling means (9) is provided with an optical pick up (11) for feeding a fraction of the lightflux to a photosensor (12) which produces a control signal for adjusting the X-ray flux from the X-ray source (1). The photosensor (6) is provided with an array of pixels, with weighting means for the signals detected in or by each of said pixels, and with means to determine a mean value of the detected and weighted signals, yielding a control signal which is fed back in order to adjust the X-ray flux from the X-ray source (1).
    • X射线检查装置包括用于发射X射线束的X射线源(1),用于检测X射线图像并将其转换为光学图像的X射线检测器(6)和视频提取器( 8),其经由光耦合装置(9)耦合到X射线检测器(6)。 光耦合装置(9)设置有光拾取器(11),用于将光流的一部分馈送到光电传感器(12),其产生用于调整来自X射线源(1)的X射线通量的控制信号 )。 光传感器(6)设置有像素阵列,具有用于在每个所述像素中检测的信号的加权装置,以及用于确定检测和加权信号的平均值的装置,产生被馈送的控制信号 以从X射线源(1)调整X射线通量。
    • 3. 发明申请
    • REDUCING TRAP EFFECTS IN A SCINTILLATOR BY APPLICATION OF SECONDARY RADIATION
    • 通过应用二次辐射降低扫描仪中的陷阱效应
    • WO2008126009A3
    • 2009-05-22
    • PCT/IB2008051329
    • 2008-04-08
    • PHILIPS INTELLECTUAL PROPERTYKONINKL PHILIPS ELECTRONICS NVSNOEREN RUDOLPH MSTEINHAUSER HEIDRUNNOORDHOEK NICOLAAS JSIMON MATTHIAS
    • SNOEREN RUDOLPH MSTEINHAUSER HEIDRUNNOORDHOEK NICOLAAS JSIMON MATTHIAS
    • G01T1/20
    • G01T1/2018G01T1/20
    • According to an embodiment of the invention, a radiation detector device (10) for detecting a primary radiation (6) comprises a scintillator (12) which generates a converted primary radiation in response to incoming primary radiation (6) and a photo detector (14) for detecting the converted primary radiation. The radiation detector device (10) further comprises a secondary radiation source (20) for irradiating the scintillator (12) with a secondary radiation (22) which has a wavelength different from a wavelength of the first radiation (6) and which is capable of producing a spatially more uniform response of the scintillator (12) to primary radiation. In an embodiment of the invention, the radiation detector device (10) is an X-ray detector of an X-ray imaging apparatus where the primary radiation is X-ray radiation and the secondary radiation has a wavelength between 350 nm and 450 nm. According to an embodiment, the irradiation with the secondary radiation, e.g. UV radiation, produces a uniform gain distribution of the X-ray detector (10).
    • 根据本发明的实施例,用于检测初级辐射(6)的辐射检测器装置(10)包括闪烁体(12),其响应于入射的主辐射(6)和光检测器(14)产生转换的一次辐射 )用于检测转换的一次辐射。 辐射检测器装置(10)还包括用于用闪光体(12)照射具有与第一辐射(6)的波长不同的波长的次辐射(22)的次辐射源(20) 产生闪烁体(12)对初级辐射的空间上更均匀的响应。 在本发明的一个实施例中,辐射检测器装置(10)是X射线成像装置的X射线检测器,其中初级辐射是X射线辐射,二次辐射具有在350nm和450nm之间的波长。 根据一个实施例,用二次辐射的照射,例如, UV辐射,产生X射线检测器(10)的均匀增益分布。